CARDIFF, Wales, UK -- More than 200 technical papers on optics and laser applications in metrology and conservation of art and archaeology will be presented at the SPIE Europe Optical Metrology congress in Munich, Germany, 14-18 June.
The event will be co-located with Laser World of Photonics 2009 at the New Munich Trade Fair Centre. SPIE Europe is one of eight partners providing technical conferences as part of the biennial event which also includes the Laser World of Photonics exhibition. The European Optical Society (EOS) and German Scientific Laser Society (WLT) are participating as Cooperating Organisations of SPIE Europe Optical Metrology.
Prof. Dr. h. c. Lothar Späth will be honoured during the event with the presentation of an SPIE Visionary Award in recognition of his crucial support for photonics in the historic optical centre of Jena. Späth was chairman of Jenoptik AG when it was established in 1991, and is credited with turning the East German optical-engineering company into a renowned success. Previously he had served as Minister-President of Baden-Württemberg.
Prof. Christopher Dainty, head of the Applied Optics Group of the National University of Ireland, Galway, will give a plenary talk on Adaptive Optics at the Optical Metrology congress.
Technical sessions will cover the latest solutions to practical problems in industrial design and production engineering, including recent advances in using optical technologies to preserve cultural heritage in art and architecture. Researchers will describe application of optical principles of measurement and testing in the micro- and nanoscales to the forefront of optical metrology.
Papers are organized into conferences on:
- Optical Measurement Systems for Industrial Inspection, including a session on Metrology of Advanced Optics to be held jointly with the EOS Conference on Manufacturing of Optical Components
- Modelling Aspects in Optical Metrology
- O3A: Optics for Arts, Architecture, and Archaeology.
Symposium chairs are Wolfgang Osten, Universität Stuttgart, Germany; Malgorzata Kujawinska, Politechnika Warszawska, Poland; and Pietro Ferraro, Istituto Nazionale di Ottica Applicata, Italy.
Conference proceedings manuscripts will be published online in the SPIE Digital Library (SPIEDigitalLibrary.org) as soon as approved following the conference. The SPIE Digital Library contains more than 270,000 articles on optics and photonics research, with approximately 20,000 new journal and proceedings articles added each year. Read more about the SPIE Digital Library online at spie.org/x2836.xml or access papers via subscription or pay-per-view via the SPIE Digital Library website.
See the event website for registration and other information: spie.org/optical-metrology.xml.
SPIE Europe, headquartered in Cardiff, UK, is a European-based extension of SPIE, the international optics and photonics society, founded in 1955 as an educational not-for-profit professional society advancing light-based technologies. SPIE Europe annually presents several events with conferences, exhibitions, courses and workshops as well as other membership, educational and industry forums. These activities catalyze collaboration among technical disciplines and promote the advancement of science, information exchange, continuing education, publishing opportunities, patent precedent and career and professional growth. In 2008, SPIE provided $1.9 million for scholarships, grants, and other activities supporting research and education around the world. For more information, visit SPIE.org.
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