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SPIE Europe Optical Metrology to advance modelling, measurement solutions

SPIE Optical Metrology

CARDIFF, WALES, UK - 9 December 2008 - Abstract submissions for conferences on optical technologies for industrial inspection, modelling, and applications in arts, architecture and archaeology are being accepted through 26 January on the SPIE Europe Optical Metrology website.

SPIE Europe Optical Metrology will be held 15-18 June in Munich, Germany. The European Optical Society (EOS), German Scientific Laser Society (WLT), and SPIE are participating as Cooperating Organisations. The conference will be held in conjunction with Laser Munich at the Munich Fairgrounds. SPIE Europe is one of eight partners providing technical conferences as part of the biennial World of Photonics Congress. The event also includes the Laser World of Photonics exhibition.

Prof. Christopher Dainty head of the Applied Optics Group of the National University of Ireland, Galway, will present a plenary talk on Adaptive Optics at the Optical Metrology symposium.

Approximately 350 papers will be presented in conferences on:

  • Optical Measurement Systems for Industrial Inspection, including a session on Metrology of Advanced Optics to be held jointly with the EOS Conference on Manufacturing of Optical Components
  • Modelling Aspects in Optical Metrology
  • O3A: Optics for Arts, Architecture, and Archaeology.

Symposium chairs are Wolfgang Osten Universität Stuttgart, Germany; Malgorzata Kujawinska, Politechnika Warszawska, Poland; and Pietro Ferraro, Istituto Nazionale di Ottica Applicata, Italy.

About SPIE Europe

SPIE Europe, headquartered in Cardiff, UK, is a European-based extension of SPIE, the international educational not-for-profit professional society founded in 1955 to advance light-based technologies. SPIE Europe annually presents several symposia comprising conferences, exhibitions, courses and workshops as well as other membership, educational and industry forums throughout Europe. These activities serve to catalyze collaboration among technical disciplines and promote the advancement of science, information exchange, continuing education, publishing opportunities, patent precedent and career and professional growth. In addition to organising and sponsoring technical conferences around the world, SPIE publishes journals, books and proceedings, with technical papers available for download via the SPIE Digital Library. SPIE contributes more than $1.6 million annually in scholarships, grants, and other programmes supporting research and education around the world. For more information about SPIE Europe and SPIE, visit SPIE.org