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Proceedings of SPIE Volume 9960 • new

Interferometry XVIII
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Volume Details

Volume Number: 9960
Estimated Publication Date: 29 September 2016
Softcover: 43 papers (388) pages
ISBN: 9781510603110

Table of Contents
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Front Matter: Volume 9960
Author(s): Proceedings of SPIE
Real time parallel phase shift orthogonal polarization interference microscopy
Author(s): I. Abdulhalim; A. Safrani
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Non-contact investigation of the corneal biomechanics with air-puff swept source optical coherence tomography
Author(s): Ewa Maczynska; Karol Karnowski; Bartlomiej Kaluzny; Ireneusz Grulkowski; Maciej Wojtkowski
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Optimizing multiplexing scheme in interferometric microscopy
Author(s): Behnam Tayebi; Keyvan Jaferzadeh; Farnaz Sharif; Jae-Ho Han
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Are those bugs reflective? non-destructive biofilm imaging with white light interferometry
Author(s): Curtis Larimer; Michelle Brann; Jonathan D. Suter; George Bonheyo; R. Shane Addleman
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
Author(s): Martin F. Fay; Thomas Dresel
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Reduction of batwing effect in white light interferometry for measurement of patterned sapphire substrates (PSS) wafer
Author(s): Abraham Mario Tapilouw; Yi-Wei Chang; Long-Yo Yu; Hau-Wei Wang
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An overview of interferometric metrology and NDT techniques and applications for the aerospace industry
Author(s): Marc P. Georges; Cédric Thizy; Fabian Languy; Jean-François Vandenrijt
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Is holography ready for yet another life? or make holography great again
Author(s): James D. Trolinger
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Recent advances in phase shifted time averaging and stroboscopic interferometry
Author(s): Adam Styk; Michał Józwik
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Improved adjoin-list for quality-guided phase unwrapping based on red-black trees
Author(s): William Cruz-Santos; Lourdes López-García; Juvenal Rueda-Paz; Arturo Redondo-Galvan
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Dual-phase-shift schemes for internal-reflection noise reduction in a Fizeau interferometer
Author(s): Toshiki Kumagai; Kenichi Hibino; Yasunari Nagaike
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Single and two-shot quantitative phase imaging using Hilbert-Huang Transform based fringe pattern analysis
Author(s): Maciej Trusiak; Vicente Micó; Krzysztof Patorski; Javier García-Monreal; Lukasz Sluzewski; Carlos Ferreira
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Nano particle and defect detection: physical limit of state-of-the-art systems and novel measurement technique to improve upon this detection limit
Author(s): Wouter D. Koek; Erwin J. van Zwet; Hamed Sadeghian
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Subwavelength metrology of Al wire grating employing finite difference time domain method and Mueller matrix polarimeter
Author(s): Achyut Adhikari; Kapil Dev; Anand Asundi
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A network of heterodyne laser interferometers for monitoring and control of large ring-lasers
Author(s): Alberto Donazzan; Giampiero Naletto; Maria G. Pelizzo; Davide Cuccato; Alessandro Beghi; Antonello Ortolan; Jacopo Belfi; Filippo Bosi; Andreino Simonelli; Nicolò Beverini; Giorgio Carelli; Enrico Maccioni; Rosa Santagata; Alberto Porzio; Angelo Tartaglia; Angela Di Virgilio
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Effect of beam quality on tilt measurement using cyclic interferometer
Author(s): V. C. Pretheesh Kumar; A. R. Ganesan; C. Joenathan; U. Somasundaram
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The concept and implementation of smooth generic camera calibration
Author(s): Alexey Pak
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Moire interferometry patterns for rotational alignment of structures
Author(s): Esmaeil Heidari; Kevin Harding
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Motion artifact reduction using hybrid Fourier transform with phase-shifting methods
Author(s): Beiwen Li; Ziping Liu; Song Zhang
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A non-linear piezoelectric actuator calibration using N-dimensional Lissajous figure
Author(s): A. Albertazzi; M. R. Viotti; C. L. N. Veiga; A. V. Fantin
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Testing the performance of freeform LED optics by gradient based measurement
Author(s): David Hilbig; Friedrich Fleischmann; Thomas Henning
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Determination of the paraxial focal length of strong focusing lenses using Zernike polynomials in simulation and measurement
Author(s): Tobias Binkele; David Hilbig; Friedrich Fleischmann; Thomas Henning
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Angular line scanning deflectometry using a laser pico projector
Author(s): Hao-Xun Zhan; Chao-Wen Liang; Shih-Che Chien
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Optical metrology in the conflict between desire and reality
Author(s): W. Osten
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Digital holographic interferometry for characterizing deformable mirrors in aero-optics
Author(s): James D. Trolinger; Cecil F. Hess; Payam Razavi; Cosme Furlong
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Digital holographic interferometry based on hexa-lateral derivative and reflection holography
Author(s): Pascal Picart; Jean Michel Desse; François Olchewski
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Two dimensional deformation vector analysis using speckle interferometry with same sensitivity in three directions
Author(s): Y. Arai
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Single beam off-axis digital holography of laser driven jet using ring cavity
Author(s): Guanghua Chen; Mu Li; Zhenxiong Luo; Jun Liu; Jun Li; Shouxian Liu
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Dynamic high pressure measurements using a Fiber Bragg Grating probe and an arrayed waveguide grating spectrometer
Author(s): Y. Barbarin; A. Lefrançois; S. Magne; K. Woirin; F. Sinatti; A. Osmont; J. Luc
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Adaptive grating interferometric sensor for NDE metrology in high energy electromagnetic environment
Author(s): George Dovgalenko; Kadir Altintepe; Michael Bodnar; Joseph Prokop
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Mechanical design optimization of a single-axis MOEMS accelerometer based on a grating interferometry cavity for ultrahigh sensitivity
Author(s): Qianbo Lu; Jian Bai; Kaiwei Wang; Shuqi Lou; Xufen Jiao; Dandan Han; Guoguang Yang
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The analysis of temperature effect and temperature compensation of MOEMS accelerometer based on a grating interferometric cavity
Author(s): Dandan Han; Jian Bai; Qianbo Lu; Shuqi Lou; Xufen Jiao; Guoguang Yang
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Improvement of spectrally resolved interferometry without direction ambiguity and dead zone
Author(s): Young Ho Yun; Ki-Nam Joo
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Two-step phase shifting interferometry technique for evaluation of fatigue process zone parameters in notched specimens
Author(s): Leonid I. Muravsky; Pascal Picart; Arkady B. Kmet'; Taras I. Voronyak; Orest P. Ostash; Ihor V. Stasyshyn
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Spectral resolution measurement technique for Czerny-Turner spectrometers based on spectral interferometry
Author(s): Ramiro Contreras Martínez; Jesús Garduño Mejía; Martha Rosete Aguilar; Carlos J. Román Moreno
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A method for the analysis and data reduction from Hartmann and Shack-Hartmann tests
Author(s): Fco. Javier Gantes Nuñez; Zacarías Malacara Hernández; Daniel Malacara Hernández
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Polarization characterization of liquid-crystal variable retarders
Author(s): Iván Montes; Neil C. Bruce; Juan M. López-Téllez
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Analysis of a shearography device using a Wollaston prism and polarization phase shifting
Author(s): E. Sanchez; M. E. Benedet; D. P. Willemann; A. V. Fantin; A. G. Albertazzi
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Optical frequency comb profilometry based on a single-pixel phase imaging
Author(s): Nabila Makhtar; Quang Duc Pham; Yasuhiro Mizutani; Yoshio Hayasaki
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Testing optical surfaces using two-frame phase-shifting interferometry
Author(s): Chao Tian; Shengchun Liu
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Orthogonal polynomials and global optimization based demodulation of two-shot fringe patterns
Author(s): Chao Tian; Shengchun Liu
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Self-mixing grating interferometer: theoretical analysis and experimental observations
Author(s): Dongmei Guo; Ming Wang; Hui Hao
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The advanced LIGO detectors in the era of first discoveries
Author(s): Daniel Sigg
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