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Proceedings of SPIE Volume 9563

Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII
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Volume Details

Volume Number: 9563
Date Published: 14 October 2015
Softcover: 21 papers (212) pages
ISBN: 9781628417296

Table of Contents
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Front Matter: Volume 9563
Author(s): Proceedings of SPIE
Development of a resistivity standard for polymeric materials used in photovoltaic modules
Author(s): Michael D. Kempe; David C. Miller; Dylan L. Nobles; Keiichiro Sakurai; John Tucker; Jayesh G. Bokria; Tsuyoshi Shioda; Kumar Nanjundiah; Toshio Yoshihara; Jeff Birchmier; Oihana Zubillaga; John H. Wohlgemuth
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Development of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules
Author(s): Thomas C. Felder; William J. Gambogi; James G. Kopchick; Lucas Amspacher; R. Scott Peacock; Benjamin Foltz; Katherine M. Stika; Alexander Z. Bradley; Babak Hamzavy; Bao-Ling Yu; Lucie Garreau-iles; Oakland Fu; Hongjie Hu; T. John Trout
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Cracking and delamination behaviors of photovoltaic backsheet after accelerated laboratory weathering
Author(s): Chiao-Chi Lin; Yadong Lyu; Donald L. Hunston; Jae Hyun Kim; Kai-Tak Wan; Deborah L. Stanley; Xiaohong Gu
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Depth profiling of mechanical degradation of PV backsheets after UV exposure
Author(s): Xiaohong Gu; Peter J. Krommenhoek; Chiao-Chi Lin; Li-Chieh Yu; Tinh Nguyen; Stephanie S. Watson
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Effects of light illumination during damp/dry heat tests on a flexible thin film photovoltaic module
Author(s): Keiichiro Sakurai; Akihiro Takano; Masayoshi Takani; Atsushi Masuda
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Experimental and computational investigation of microcrack behavior under combined environments in monocrystalline Si
Author(s): W.-J. Huang; S. Bringuier; J. Paul; K. Simmons-Potter; K. Muralidharan; B. G. Potter
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Environmental aging in polycrystalline-Si photovoltaic modules: comparison of chamber-based accelerated degradation studies with field-test data
Author(s): T. Lai; R. Biggie; A. Brooks; B. G. Potter; K. Simmons-Potter
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PID: from material properties to outdoor performance and quality control counter measures
Author(s): J. Berghold; S. Koch; S. Pingel; S. Janke; A. Ukar; P. Grunow; T. Shioda
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Survey of potential-induced degradation in thin-film modules
Author(s): Peter Hacke; Kent Terwilliger; Stephen H. Glick; Greg Perrin; Sarah R. Kurtz
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A modeling framework for potential induced degradation in PV modules
Author(s): Peter Bermel; Reza Asadpour; Chao Zhou; Muhammad Ashraful Alam
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Investigation of power values of PV rooftop systems based on heat gain reduction
Author(s): Tanokkorn Chenvidhya; Manit Seapan; Panom Parinya; Buntoon Wiengmoon; Dhirayut Chenvidhya; Roongrojana Songprakorp; Chamnan Limsakul; Yaowanee Sangpongsanont; Nittaya Tannil
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Partial shade stress test for thin-film photovoltaic modules
Author(s): Timothy J. Silverman; Michael G. Deceglie; Chris Deline; Sarah Kurtz
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PV industry growth and module reliability in Thailand
Author(s): Dhirayut Chenvidhya; Manit Seapan; Yaowanee Sangpongsanont; Tanokkorn Chenvidhya; Chamnan Limsakul; Roongrojana Songprakorp
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The impact of atmospheric species on the degradation of CIGS solar cells and molybdenum films
Author(s): Mirjam Theelen; Christopher Foster; Henk Steijvers; Nicolas Barreau; Corné Frijters; Zeger Vroon; Miro Zeman
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Thin film PV standing tall side-by-side with multi-crystalline silicon: also in terms of reliability
Author(s): Neelkanth G. Dhere; Allan Ward; Robert Wieting; Subhendu Guha; Ramesh G. Dhere
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Analysis of PV modules based on thin film solar cells by dark measurements technique
Author(s): Kamel Agroui; Michelle Pellegrino; Flaminio Giovanni
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PV system reliability program at Sandia National Labs: From material-level to system-level analysis (Presentation Recording)
Author(s): Olga Lavrova
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When PV modules are becoming real building elements: White solar module, a revolution for BIPV (Presentation Recording)
Author(s): Laure-Emmanuelle Perret-Aebi; Jordi Escarré; Heng-Yu Li; Laurent Sansonnens; Federico Galliano; Gianluca Cattaneo; Patrick Heinstein; Sylvain Nicolay; Julien Bailat; Sébastien Eberhard; Christophe Ballif
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Photovoltaic Reliability Group activities in USA and Brazil (Presentation Recording)
Author(s): Neelkanth G. Dhere; Leila R. O. Cruz
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Analysis of aluminum nano-gratings assisted light reflection reduction in GaAs metal-semiconductor-metal photodetectors
Author(s): Zhenzhu Fan; Yahui Su; Huayong Zhang; Xiaohu Han; Feifei Ren
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FTIR spectroscopy of silicon carbide thin films prepared by PECVD technology for solar cell application
Author(s): Angela Kleinová; Jozef Huran; Vlasta Sasinková; Milan Perný; Vladimír Šály; Juraj Packa
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Raman spectroscopy study of SiC thin films prepared by PECVD for solar cell working in hard environment
Author(s): Vlasta Sasinková; Jozef Huran; Angela Kleinová; Pavol Boháček; Juraj Arbet; Mária Sekáčova
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Critical analysis on degradation mechanism of dye-sensitized solar cells
Author(s): Mukhzeer Mohamad Shahimin; Suriati Suhaimi; Mohd Halim Abd Wahid; Vithyacharan Retnasamy; Nor Azura Malini Ahmad Hambali; Ali Hussain Reshak
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Characterizing different defects in multicrystalline silicon solar cells via modern imaging methods
Author(s): Shishu Lou; Huishi Zhu; Peide Han
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A data science approach to understanding photovoltaic module degradation
Author(s): Nicholas R. Wheeler; Abdulkerim Gok; Timothy J. Peshek; Laura S. Bruckman; Nikhil Goel; Davis Zabiyaka; Cara L. Fagerholm; Thomas Dang; Christopher Alcantara; Mason L. Terry; Roger H. French
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The importance of reliability to the SunShot Initiative (Presentation Recording)
Author(s): Rebecca Jones-Albertus
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