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Proceedings of SPIE Volume 9489

Dimensional Optical Metrology and Inspection for Practical Applications IV
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Volume Details

Volume Number: 9489
Date Published: 5 June 2015
Softcover: 19 papers (178) pages
ISBN: 9781628416053

Table of Contents
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Front Matter: Volume 9489
Author(s): Proceedings of SPIE
3D range data compression with a virtual fringe projection system
Author(s): Song Zhang
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Phase unwrapping of fringe images for dynamic 3D measurements without additional pattern projection
Author(s): Andreas Breitbarth; Eric Müller; Peter Kühmstedt; Gunther Notni; Joachim Denzler
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Experimental verification of reconstruction of two interfering wavefronts using the transport of intensity equation
Author(s): Ahmad Darudi; Javad Amiri; Peyman Soltani; Georges Nehmetallah
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Geometric and topological feature extraction of linear segments from 2D cross-section data of 3D point clouds
Author(s): Rajesh Ramamurthy; Kevin Harding; Xiaoming Du; Vincent Lucas; Yi Liao; Ratnadeep Paul; Tao Jia
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Development of feature extraction analysis for a multi-functional optical profiling device applied to field engineering applications
Author(s): Xu Han; Guangping Xie; Brandon Laflen; Ming Jia; Guiju Song; Kevin G. Harding
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Composite layup monitoring using structured light
Author(s): Robert Tait; Kevin Harding; Chris Nafis
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Characterization of 3D printing output using an optical sensing system
Author(s): Jeremy Straub
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A brief survey of sensing for metal-based powder bed fusion additive manufacturing
Author(s): Bryant K. Foster; Edward W. Reutzel; Abdalla R. Nassar; Corey J. Dickman; Benjamin T. Hall
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Thickness and air gap measurement of assembled IR objectives
Author(s): B. Lueerss; P. Langehanenberg
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Method for controlling a laser additive process using intrinsic illumination
Author(s): Robert Tait; Guoshuang Cai; Magdi Azer; Xiaobin Chen; Yong Liu; Kevin Harding
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The impact of oceanic gravity waves on laser propagation
Author(s): Serdar Kizilkaya; Gage Walters; Timothy Kane
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Measuring accuracy of in-plane and out-of-plane deformation simultaneous measurement of speckle interferometry using multi-recording method
Author(s): Y. Arai
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Long wave infrared 3D scanner
Author(s): Ernst Wiedenmann; Mohsen Afrough; Sven Albert; Robert Schott; Jan Tusch; Andreas Wolf
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Terahertz reflection interferometry for automobile paint layer thickness measurement
Author(s): Aunik Rahman; Kenneth Tator; Anis Rahman
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Application of holographic interferometry to in-plane and out-of-plane misalignment and deformation measurements in packaging applications
Author(s): Vladimir V. Nikulin; Rahul Khandekar; Vijit Bedi
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3D tracking for borescope inspections
Author(s): Yong Yang; Guiju Song; Kevin Harding
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Small hole inner profile measurement methods
Author(s): Yi Liao; Kevin G. Harding; Rajesh Ramamurthy
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High contrast imaging in the presence of a bright background
Author(s): Harbans S. Dhadwal; Jahangir Rastegar; Dake Feng
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The omni-directional image assisted optical surveillance system
Author(s): Yung-Hsiang Chen; Chi-Hung Hwang; Wei-Chung Wang; Chun-Fu Lin
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