Share Email Print
cover

Proceedings of SPIE Volume 9196

Systems Contamination: Prediction, Measurement, and Control 2014
Format Member Price Non-Member Price
Softcover $52.50 $70.00

Volume Details

Volume Number: 9196
Date Published: 30 September 2014
Softcover: 16 papers (208) pages
ISBN: 9781628412239

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 9196
Author(s): Proceedings of SPIE
Standards activity for contamination control at ASTM and IEST
Author(s): Jack T. Sanders
Show Abstract
Surfaces that shed dust: unraveling the mechanisms
Author(s): Genevieve Devaud; Christina Haley; Christina Rockwell; Alex Fischer
Show Abstract
Analysis of particulates on tape lift samples
Author(s): Robert M. Moision; John A. Chaney; Chris J. Panetta; De-Ling Liu
Show Abstract
Experimental measurement of the reflection behavior of contaminant molecules
Author(s): Susumu Baba; Eiji Miyazaki; Yuka Miura; Riyo Yamanaka; Osamu Numata; Junichiro Ishizawa; Yugo Kimoto; Takashi Tamura
Show Abstract
Diffusion of water into purged volumes
Author(s): Lubos Brieda; John Newcome; Therese Errigo
Show Abstract
Identification of collected volatile condensable material (CVCM) from ASTM E595 of silicone damper fluid
Author(s): Myriam P. Easton; Aura C. Labatete-Goeppinger; Jesse D. Fowler; De-Ling Liu
Show Abstract
Molecular transport modeling for spaceborne instrument contamination prediction
Author(s): Chung M. Wong; Robert M. Moision; Jesse D. Fowler; De-Ling Liu
Show Abstract
Evaluating the bakeout effectiveness of RTV-S691 silicone adhesive by measuring outgassing rate
Author(s): Eiji Miyazaki; Yuka Miura; Osamu Numata; Riyo Yamanaka; Susumu Baba; Junichiro Ishizawa; Yugo Kimoto; Takashi Tamura
Show Abstract
Quantitative model of the effects of contamination and space environment on in-flight aging of thermal coatings
Author(s): Emilie Vanhove; Jean-François Roussel; Stéphanie Remaury; Delphine Faye; Pascale Guigue
Show Abstract
Ozone Mapping and Profiler Suite: using mission performance data to refine predictive contamination modeling
Author(s): Genevieve Devaud; Glen Jaross
Show Abstract
Spacecraft materials HCl susceptibility assessments
Author(s): C.-T. Chu; De-Ling Liu; Hyun Kim; Diana R. Alaan
Show Abstract
Black molecular adsorber coatings for spaceflight applications
Author(s): Nithin S. Abraham; Mark M. Hasegawa; Sharon A. Straka
Show Abstract
Optical characterization of photofixed RTV effluent in an atomic oxygen atmosphere
Author(s): J. Pu; N. J. Ianno
Show Abstract
Optical and re-emission behavior of silicone contaminants affected by UV irradiation with different wavelength ranges
Author(s): Yuka Miura; Susumu Baba; Riyo Yamanaka; Osamu Numata; Eiji Miyazaki; Junichiro Ishizawa; Yugo Kimoto; Takashi Tamura
Show Abstract
Contamination control requirements implementation for the James Webb Space Telescope (JWST), part 1: optics, instruments and thermal vacuum testing
Author(s): Eve M. Wooldridge; Kelly Henderson-Nelson; Michael Woronowicz; Kevin Novo-Gradac; Radford L. Perry; Matthew Macias; Jon Arenberg; Joanne Egges
Show Abstract
Contamination control requirements implementation for the James Webb Space Telescope (JWST), part 2: spacecraft, sunshield, observatory, and launch
Author(s): Eve M. Wooldridge; Andrea Schweiss; Kelly Henderson-Nelson; Michael Woronowicz; Jignasha Patel; Matthew Macias; R. Daniel McGregor; Greg Farmer; Olivier Schmeitzky; Peter Jensen; Peter Rumler; Beatriz Romero; Jacques Breton
Show Abstract

© SPIE. Terms of Use
Back to Top