Share Email Print

Proceedings of SPIE Volume 9179

Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Editor(s): Neelkanth G. Dhere
Format Member Price Non-Member Price
Softcover $60.00 $80.00

Volume Details

Volume Number: 9179
Date Published: 4 November 2014
Softcover: 23 papers (218) pages
ISBN: 9781628412062

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 9179
Author(s): Proceedings of SPIE
Japanese Task Group 8 activities in international PV module quality assurance
Author(s): Keiichiro Sakurai; Akihiro Takano; Hironori Yanase; Toshiaki Sakai; Hironori Nishihara; Tetsuro Nakamura; Shinji Fujikake; Masayoshi Takani
Show Abstract
Statistical analysis of degradation modes and mechanisms in various thin-film photovoltaic module technologies
Author(s): Eric Schneller; Narendra S. Shiradkar; Camila L. Pereira; Leandro C. Fonseca; Neelkanth G. Dhere
Show Abstract
Analysis of the degradation and aging of a commercial photovoltaic installation
Author(s): Alexander Bradley; Babak Hamzavy; William Gambogi
Show Abstract
Comparison of environmental degradation in Hanwha 295 W and SunPower 320 W photovoltaic modules via accelerated lifecycle testing
Author(s): R. Biggie; T. Lai; W.-J. Huang; B. G. Potter; K. Simmons-Potter
Show Abstract
Outdoor performance of CIGS modules in different climates
Author(s): Kristopher Toivola; Paul F. Robusto; Ajay Saproo; Bill Kessler
Show Abstract
Effect of shading on the switching of bypass diodes in PV modules
Author(s): Narendra Shiradkar; Eric Schneller; Neelkanth Dhere; Vivek Gade
Show Abstract
Angle of incidence effects on soiled PV modules
Author(s): J. John; V. Rajasekar; S. Boppana; S. Tatapudi; G. Tamizhmani
Show Abstract
Research, test, and development activities performed by junction box bypass diode task force # 4
Author(s): Vivek Gade; Narendra Shiradkar; Paul Robusto; Kent Whitfield; John Wohlgemuth; Yasunori Uchida; Neelkanth G. Dhere
Show Abstract
Accelerated performance degradation of CIGS solar cell determined by in-situ monitoring
Author(s): Mirjam Theelen; Nicolas Barreau; Felix Daume; Henk Steijvers; Vincent Hans; Aikaterini Liakopoulou; Zeger Vroon; Miro Zeman
Show Abstract
Thermal performance of microinverters on dual-axis trackers
Author(s): Mohammad A. Hossain; Timothy J. Peshek; Yifan Xu; Liang Ji; Jiayang Sun; Alexis Abramson; Roger H. French
Show Abstract
The influence of atmospheric species on the degradation of aluminum doped zinc oxide and Cu(In,Ga)Se2 solar cells
Author(s): Mirjam Theelen; Christopher Foster; Supratik Dasgupta; Zeger Vroon; Nicolas Barreau; Miro Zeman
Show Abstract
Quantifying PV module microclimates and translation into accelerated weathering protocols
Author(s): Nancy H. Phillips; Kurt P. Scott
Show Abstract
Predicting edge seal performance from accelerated testing
Author(s): Kedar Hardikar; Dan Vitkavage; Ajay Saproo; Todd Krajewski
Show Abstract
Effect of UV aging on degradation of Ethylene-vinyl Acetate (EVA) as encapsulant in photovoltaic (PV) modules
Author(s): Amir Badiee; Ricky Wildman; Ian Ashcroft
Show Abstract
Optical properties of PV backsheets: key indicators of module performance and durability
Author(s): Thomas C. Felder; William J. Gambogi; James G. Kopchick; R. Scott Peacock; Katherine M. Stika; T. John Trout; Alexander Z. Bradley; Babak Hamzavytehrany; Abdulkerim Gok; Roger H. French; Oakland Fu; Hongjie Hu
Show Abstract
Device to analyze leakage current pathways in photovoltaic modules in real-time
Author(s): Neelkanth Dhere; Narendra Shiradkar; Eric Schneller
Show Abstract
Chemical depth profiling of photovoltaic backsheets after accelerated laboratory weathering
Author(s): Chiao-Chi Lin; Peter J. Krommenhoek; Stephanie S. Watson; Xiaohong Gu
Show Abstract
Junction box wiring and connector durability issues in photovoltaic modules
Author(s): Juris Kalejs
Show Abstract
Combined-environment influence on microcrack evolution in mono-crystalline silicon
Author(s): W.-J. Huang; Z. D. Fortuno; M. Li; J. Liu; H. Liao; K. Simmons-Potter; B. G. Potter
Show Abstract
The vital role of manufacturing quality in the reliability of PV modules
Author(s): Peter Rusch
Show Abstract
A review of manufacturing metrology for improved reliability of silicon photovoltaic modules
Author(s): Kristopher O. Davis; Joseph Walters; Eric Schneller; Hubert Seigneur; R. Paul Brooker; Giuseppe Scardera; Marianne P. Rodgers; Nahid Mohajeri; Narendra Shiradkar; Neelkanth G. Dhere; John Wohlgemuth; Andrew C. Rudack; Winston V. Schoenfeld
Show Abstract
Reliability of hybrid photovoltaic DC micro-grid systems for emergency shelters and other applications
Author(s): Neelkanth G. Dhere; Susan Schleith
Show Abstract
International PV QA Task Force's proposed comparative rating system for PV modules
Author(s): John Wohlgemuth; Sarah Kurtz
Show Abstract

© SPIE. Terms of Use
Back to Top