Share Email Print
cover

Proceedings of SPIE Volume 9173

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Editor(s): Michael T. Postek
Format Member Price Non-Member Price
Softcover $45.00 $60.00

Volume Details

Volume Number: 9173
Date Published: 10 September 2014
Softcover: 12 papers (98) pages
ISBN: 9781628412000

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 9173
Author(s): Proceedings of SPIE
Nanomanufacturing metrology for cellulosic nanomaterials: an update
Author(s): Michael T. Postek
Show Abstract
Recent advances of the metrological AFM at INRIM
Author(s): R. Bellotti; G. B. Picotto
Show Abstract
Technique for AFM tip characterization
Author(s): Ndubuisi G. Orji; Hiroshi Itoh; Chunmei Wang; Ronald G. Dixson
Show Abstract
Nanomanufacturing concerns about measurements made in the SEM Part III: vibration and drift
Author(s): Michael T. Postek; András E. Vladár; Petr Cizmar
Show Abstract
Developing detection efficiency standards for atom probe tomography
Author(s): Ty J. Prosa; Brian P. Geiser; Dan Lawrence; David Olson; David J. Larson
Show Abstract
Standardization of methods for extracting statistics from surface profile measurements
Author(s): Peter Z. Takacs
Show Abstract
Improved quality control of silicon wafers using novel off-line air pocket image analysis
Author(s): John F. Valley; M. Cristina Sanna
Show Abstract
Interferometric measurement of dimensional and thermal stability of joints
Author(s): Hagen Lorenz; René Schödel
Show Abstract
The refractive index of non-absorbing nanofluids and applications
Author(s): Augusto García-Valenzuela; Humberto Contreras-Tello; C. Sánchez-Pérez; R. Márquez-Islas; R. G. Barrera
Show Abstract
Mass sensing AlN sensors for waste water monitoring
Author(s): R. Porrazzo; G. Potter; L. Lydecker; Z. Foraida; S. Gattu; N. Tokranova; J. Castracane
Show Abstract
Scatterometric characterization of diffractive optical elements
Author(s): Toni Saastamoinen; Hannu Husu; Janne Laukkanen; Samuli Siitonen; Jari Turunen; Antti Lassila
Show Abstract

© SPIE. Terms of Use
Back to Top