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Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Editor(s): Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel
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Volume Details

Volume Number: 8729
Date Published: 6 June 2013

Table of Contents
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Front Matter: Volume 8729
Author(s): Proceedings of SPIE
Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature
Author(s): Dale E. Newbury; Nicholas W. M. Ritchie
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Does your SEM really tell the truth? Part 2
Author(s): Michael T. Postek; András E. Vladár; Kavuri P. Purushotham
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Electron microscopy and forensic practice
Author(s): Marek Kotrlý; Ivana Turková
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A large range metrological atomic force microscope and its uncertainty analysis
Author(s): S. Gao; Q. Li; W. Li; M. Lu; Y. Shi
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Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation method
Author(s): Qi Li; Sitian Gao; Wei Li; Mingzhen Lu; Yushu Shi
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HTA educational outreach program and change the equation participation
Author(s): Robert Gordon
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Bringing students to the mountain: developing partnerships to introduce students to cutting-edge research
Author(s): Anne Lynn Gillian-Daniel; Robert J. Gordon; Benjamin L. Taylor; Jon J. McCarthy
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Using the Hitachi TM 3000 in a middle school classroom
Author(s): Mary Ellen Wolfinger
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Implementing STEM technology in a Title One middle school classroom
Author(s): Carolyn Holcomb; Mary Satterfield
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Integrating independent research into science curricula to foster STEM leadership
Author(s): Craig Queenan; Alyssa Calabro; David Becker
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Advances in photo-thermal infrared imaging microspectroscopy
Author(s): Robert Furstenberg; Chris Kendziora; Michael Papantonakis; Viet Nguyen; Andrew McGill
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Surface optical properties for copper based on surface Kramers-Kroning analysis
Author(s): T. Tang; Z. M. Zhang; K. Tőkési; K. Goto; Z. J. Ding
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Monte Carlo simulation of realistic beam-sample interaction in SEM: application to evaluation of sharpness measurement methods
Author(s): Z. Ruan; S. F. Mao; P. Zhang; H. M. Li; Z. J. Ding
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Monte Carlo study of the influence of electron beam focusing to SEM linewidth measurement
Author(s): P. Zhang; S. F. Mao; Z. M. Zhang; Z. J. Ding
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Monte Carlo simulation of x-ray photoemission electron microscopic image
Author(s): Z. M. Zhang; T. Tang; S. F. Mao; Z. J. Ding
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