Share Email Print


Short-Wavelength Imaging and Spectroscopy Sources
Editor(s): Davide Bleiner
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a black-and-white photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 8678
Date Published: 4 January 2013
Softcover: 14 papers (150) pages
ISBN: 9780819494566

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 8678
Author(s): Proceedings of SPIE
Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser
Author(s): B. D. Patterson; R. Abela; H.-H. Braun; R. Ganter; B. Pedrini; M. Pedrozzi; S. Reiche; M. van Daalen
Show Abstract
Plasma-based XUV lasers
Author(s): A. Klisnick
Show Abstract
Vacuum-ultraviolet lasers and spectroscopy
Author(s): U. Hollenstein
Show Abstract
Modelization of seeded soft x-ray lasers using plasma amplifiers from solid
Author(s): Eduardo Oliva; Philippe Zeitoun
Show Abstract
Comparison of laboratory-scale XUV laser with xFELs
Author(s): Davide Bleiner
Show Abstract
Lab-scale EUV nano-imaging employing a gas-puff-target source: image quality versus plasma radiation characteristics
Author(s): Przemyslaw Wachulak; Andrzej Bartnik; Henryk Fiedorowicz
Show Abstract
Laboratory full-field transmission x-ray microscopy
Author(s): Christian Seim; Jonas Baumann; Herbert Legall; Christoph Redlich; Ioanna Mantouvalou; G. Blobel; Holger Stiel; Birgit Kanngießer
Show Abstract
Ptychography: early history and 3D scattering effects
Author(s): J. M. Rodenburg
Show Abstract
Schwarzschild objective and similar two-mirror systems
Author(s): Igor A. Artyukov
Show Abstract
Using submicron-resolution LiF crystal and film x-ray detectors for the near and far fields in-situ characterization of soft x-ray laser beams
Author(s): Tatiana A. Pikuz; Anatoly Ya. Faenov; Yuji Fukuda; Yoshiaki Kato; Tetsuya Kawachi; Masaki Kando
Show Abstract
Investigating the effects of laser intensity and pulse duration on 6.7-nm BEUV emission from Gadolinium plasma
Author(s): Thomas Cummins; Takamitsu Otsuka; Noboru Yugami; Weihua Jiang; Akira Endo; Bowen Li; Colm O'Gorman; Padraig Dunne; Emma Sokell; Gerry O'Sullivan; Takeshi Higashiguchi
Show Abstract
Elemental analysis with x-ray fluorescence spectrometry
Author(s): Peter Lienemann; Davide Bleiner
Show Abstract
X-ray spectromicroscopy
Author(s): Alan Michette
Show Abstract
Imaging with plasma based extreme ultraviolet sources
Author(s): Larissa Juschkin
Show Abstract

© SPIE. Terms of Use
Back to Top