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Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
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Volume Details

Volume Number: 8378
Date Published: 5 June 2012
Softcover: 17 papers (178) pages
ISBN: 9780819490568

Table of Contents
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Front Matter: Volume 8378
Author(s): Proceedings of SPIE
Past, present, and future of backscatter electron (BSE) imaging
Author(s): Oliver C. Wells; Michael S. Gordon; Lynne M. Gignac
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Faults and foibles of quantitative scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS)
Author(s): Dale E. Newbury; Nicholas W. M. Ritchie
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Does your SEM really tell the truth?
Author(s): Michael T. Postek; András E. Vladár
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Progress on CD-AFM tip width calibration standards
Author(s): Ronald Dixson; Boon Ping Ng; Craig D. McGray; Ndubuisi G. Orji; Jon Geist
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Atomic force microscope cantilevers as encoder for real-time displacement measurements
Author(s): Xiaomei Chen; Helmut Wolff; Ludger Koenders
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Hybrid metrology for critical dimension based on scanning methods for IC manufacturing
Author(s): J. Foucher; N. Griesbach Schuch Figueiro; J. Rouxel; R. Thérèse
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Deformation of polystyrene nanoparticles under different AFM tapping loads
Author(s): Bo-Ching He; Wei-En Fu; Huay-Chung Liou; Yong-Qing E. Chang; Shan-Peng Pan; Hung Min Lin; Yen-Fu Chen
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Extension of gravity center method for diameter calibration of polystyrene standard particles with a metrological AFM
Author(s): Ichiko Misumi; Keiji Takahata; Kentaro Sugawara; Satoshi Gonda; Kensei Ehara
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Image processing with Maple for simplified analysis in scanning microscopy
Author(s): Alejandro Mesa
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Nanomanipulation system for scanning electron microscope
Author(s): P. Woo; I. Mekuz; B. Chen
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Multi-signal FIB/SEM tomography
Author(s): Lucille A. Giannuzzi
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Advances in high-speed low-latency communications for nanopositioning in advanced microscopy
Author(s): Scott C. Jordan
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Improving the performance of the critical dimension-scanning electron microscope with the contrast transfer function
Author(s): Aron J. Cepler; Bradley L Thiel
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Forensic practice in the field of protection of cultural heritage
Author(s): Marek Kotrlý; Ivana Turková
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Integrating research and advanced microscopy into the high school curriculum
Author(s): Craig Queenan; Alyssa Calabro; David Becker
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Robust probes for high resolution chemical detection and imaging
Author(s): Rebecca L. Agapov; Alexei P. Sokolov; Mark D. Foster
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Response of electrospun CNT composites to irradiation
Author(s): S. M. Rosa; J. P. Crespo; J. J. Santiago-Avilés; I. Ramos; E. M. Campo
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Introduction to special session on microscopy for Science, Technology, Engineering and Math (STEM) educators
Author(s): Michael T. Postek; Mary Satterfield; Bradley Damazo; Robert Gordon
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