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Proceedings of SPIE Volume 8169

Optical Fabrication, Testing, and Metrology IV
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Volume Details

Volume Number: 8169
Date Published: 21 September 2011
Softcover: 30 papers (258) pages
ISBN: 9780819487957

Table of Contents
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Front Matter: Volume 8169
Author(s): Proceedings of SPIE
MRF with adjustable pH
Author(s): Stephen D. Jacobs
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Stress polishing of E-ELT segment at LAM: full-scale demonstrator status
Author(s): Marie Laslandes; Nicolas Rousselet; Marc Ferrari; Emmanuel Hugot; Johan Floriot; Sébastien Vivès; Gérard Lemaitre; Jean François Carré; Marc Cayrel
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Manufacturing and testing of the large lenses for Dark Energy Survey (DES) at SESO
Author(s): Denis Fappani; Julien Fourez; Peter Doel; David Brooks; Brenna Flaugher
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TMA optics for HISUI HSS and MSS imagers
Author(s): R. Geyl; H. Leplan; J. Rodolfo
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Fused silica long-term stability: case studies
Author(s): Maurizio Vannoni; Andrea Sordini; Giuseppe Molesini
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Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)
Author(s): C. Ruiz de Galarreta Fanjul; A. Philippon; J.-C. Vial; J.-P. Maillard; T. Appourchaux
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Experimental determination of aberration in lithographic lens by aerial image
Author(s): Lifeng Duan; Xiangzhao Wang; Guanyong Yan; Anatoly Bourov
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Wavefront reconstruction and piston measurement using Ronchi test
Author(s): Dayana H. Penalver; Fermin Granados-Agustin; David L. Romero-Antequera
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Wafer-level micro-optics: trends in manufacturing, testing, and packaging
Author(s): Reinhard Voelkel; Kenneth J. Weible; Martin Eisner
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Fabrication and testing of highly efficient resonance domain diffractive optical elements
Author(s): Omri Barlev; Michael A. Golub; Asher A. Friesem; Diana Mahalu; Menachem Nathan
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Method for the characterization of Fresnel lens flux transfer performance
Author(s): Juan Carlos Martinez Antón; Daniel Vázquez Moliní; Javier Muñoz de Luna; José Antonio Gómez Pedrero; Antonio Álvarez Fernández-Balbuena
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Manufacturing, testing, and metrology of axi-symmetric circular phase masks for stellar coronagraphy
Author(s): Mamadou N'Diaye; Kjetil Dohlen; Stéphane Tisserand; Sophie Gautier; Kacem El Hadi; Gabriel Moreaux; Rémi Soummer; Salvador Cuevas; Celia Sánchez-Pérez
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Fabrication of bilayer wire grid polarizer using replicated polymer nano grating
Author(s): Yunah Han; Jwasun Kim; Euihyeon Byeon; Seok-Min Kim; Yong-ho Lee; Chang Kwon Hwangbo
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Multimodal scattering facilities and modelization tools for a comprehensive investigation of optical coatings
Author(s): Myriam Zerrad; Michel Lequime; Claude Amra
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Spectrophotometric bench dedicated to the characterization of micro-patterned optical coatings
Author(s): Stéphane Sorce; Laetitia Abel-Tiberini; Michel Lequime
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SCPEM-based polarization modulation ellipsometry in the NIR
Author(s): F. Bammer; R. Petkovsek
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Roughness characterization of large EUV mirror optics by laser light scattering
Author(s): Marcus Trost; Sven Schröder; Torsten Feigl; Angela Duparré; Andreas Tünnermann
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3D features measurement using YieldStar: an angle resolved polarized scatterometer
Author(s): Anne-Laure Charley; Philippe Leray; Koen D'havé; Shaunee Cheng; Paul Hinnen; Fahong Li; Peter Vanoppen; Mircea Dusa
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Impact of surface roughness on the scatter losses and the scattering distribution of surfaces and thin film coatings
Author(s): Sven Schröder; Tobias Herffurth; Angela Duparré; James E. Harvey
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Isara 400 ultra-precision CMM
Author(s): H. A. M. Spaan; I. Widdershoven
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Non-contact measurement of aspherical and freeform optics with a new confocal tracking profiler
Author(s): Agustí Pintó; Ferran Laguarta; Roger Artigas; Cristina Cadevall
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Phase-shifting fringe projection system using freeform optics
Author(s): Susanne Zwick; Peter Kühmstedt; Gunther Notni
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Data handling and representation of freeform surfaces
Author(s): Ralf Steinkopf; Lars Dick; Tino Kopf; Andreas Gebhardt; Stefan Risse; Ramona Eberhardt
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Adaptive two-beam interferometer for testing optical surfaces
Author(s): Antonin Miks; Jiri Novak; Pavel Novak
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Adaptive null test system using a ferrofluid deformable mirror
Author(s): Daniel B. Landry; Denis Brousseau; Simon Thibault; Ermanno F. Borra
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Optical method for the surface topographic characterization of Fresnel lenses
Author(s): Juan Carlos Martínez Antón; José Antonio Gómez Pedrero; José Alonso Fernández; Juan Antonio Quiroga
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Extremely aspheric surfaces: toward a manufacturing process based on active optics
Author(s): Zalpha Challita; Emmanuel Hugot; Marc Ferrari; David Le Mignant; Sébastien Vivès; Jean-Gabriel Cuby
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Two-dimensional thickness measurement of a dielectric thin layer on a metal by use of surface-plasmon-resonance-based ellipsometry
Author(s): Tetsuo Iwata; Yusuke Wada; Kentaro Nishigaki; Yasuhiro Mizutani
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Wavefront instabilities in thin glass mirrors
Author(s): Stéphane Bouillet; Thomas Lanternier; Eric Lavastre; Christian Chappuis; François Macias
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Absolute calibration of three reference flats based on an iterative algorithm: study and implementation
Author(s): Chloé Morin; Stéphane Bouillet
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