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Proceedings of SPIE Volume 8082

Optical Measurement Systems for Industrial Inspection VII
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Volume Details

Volume Number: 8082
Date Published: 26 May 2011
Softcover: 142 papers (1276) pages
ISBN: 9780819486783

Table of Contents
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Front Matter: Volume 8082
Author(s): Proceedings of SPIE
Assistant systems for efficient multiscale measurement and inspection
Author(s): Avinash Burla; Tobias Haist; Wolfram Lyda; Mohamed Hassanine Aissa; Wolfgang Osten
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Multisensor technology based on a laser focus probe for nanomeasuring applications over large areas
Author(s): Eberhard Manske; Gerd Jäger; Tino Hausotte; Torsten Machleidt
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Conceptual consideration for the process integration of optical sensors
Author(s): David Fleischle; Wolfram Lyda; Florian Mauch; Wolfgang Osten
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Some figures of merit so as to compare digital Fresnel holography and speckle interferometry
Author(s): Pierre Slangen; Mayssa Karray; Pascal Picart
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Reference wave adaptation in digital lensless Fourier holography by means of a spatial light modulator
Author(s): Thomas Meeser; Claas Falldorf; Christoph von Kopylow; Ralf B. Bergmann
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Self interference digital holographic microscopy approach for inspection of technical and biological phase specimens
Author(s): Björn Kemper; Frank Schlichthaber; Angelika Vollmer; Steffi Ketelhut; Sabine Przibilla; Gert von Bally
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Stokes holography for recording and reconstructing objects using polarization fringes
Author(s): Rakesh Kumar Singh; Dinesh N. Naik; Hitoshi Itou; Yoko Miyamoto; Mitsuo Takeda
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An algorithm for the estimation of the in-focus distance for speckle holograms
Author(s): P. Memmolo; C. Distante; M. Paturzo; A. Finizio; P. Ferraro; B. Javidi
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Synthetic aperture engineering for super-resolved microscopy in digital lensless Fourier holography
Author(s): Vicente Micó; Luis Granero; Zeev Zalevsky; Javier García
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Dual-wavelength holographic shape measurement with iterative phase unwrapping
Author(s): Sara Rosendahl; Per Bergström; Per Gren; Mikael Sjödahl
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Infrared digital holography for large objects investigation
Author(s): A. Geltrude; M. Locatelli; P. Poggi; A. Pelagotti; M. Paturzo; P. Ferraro; R. Meucci
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Remote laboratory for digital holographic metrology
Author(s): Marc Wilke; Igor Alekseenko; Guohai Situ; Konica Sarker; Margarita Riedel; Giancarlo Pedrini; Wolfgang Osten
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Simultaneous out-of-plane and in-plane displacements measurement by using digital holography around a hole or indentation
Author(s): Matias R. Viotti; Christian Kohler; Armando Albertazzi
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Recent advances in the field of super resolved imaging and sensing
Author(s): Zeev Zalevsky; Amikam Borkowski; Emanuel Marom; Bahram Javidi; Yevgeny Beiderman; Vicente Micó; Javier García
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Advanced 2D die placement inspection system for reliable flip chip interconnections based on 3D information of die and substrate by a phase measuring profilometry
Author(s): Hyun-Kee Lee; Min Young Kim
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3D interconnect metrology in CMS/ITRI
Author(s): Y. S. Ku; D. M. Shyu; W. T. Hsu; P. Y. Chang; Y. C. Chen; H. L. Pang
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Pattern placement metrology using PROVE high precision optics combined with advanced correction algorithms
Author(s): Mario Längle; Norbert Rosenkranz; Dirk Seidel; Dirk Beyer
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Detection of micro-probe displacement using a Shack-Hartmann wavefront sensor
Author(s): H. Dierke; C. Schrader; R. Tutsch
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Optimal phase retrieval from multiple observations with Gaussian noise: augmented Lagrangian algorithm for phase objects
Author(s): Artem Migukin; Vladimir Katkovnik; Jaakko Astola
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The effect of misalignment in phase retrieval based on a spatial light modulator
Author(s): Mostafa Agour; Claas Falldorf; Christoph von Kopylow; Ralf B. Bergmann
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Quantitative determination of the optical properties of phase objects by using a real-time phase retrieval technique
Author(s): Johannes Frank; Guenther Wernicke; Jan Matrisch; Sebastian Wette; Jan Beneke; Stefan Altmeyer
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Phase extraction in microscopy using tunable defocusing by means of a SLM
Author(s): Luis Camacho; Vicente Micó; Zeev Zalevsky; Javier García
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Three-dimensional refractive index and thickness distribution of thin film measurements through dynamic multiwavelength interferometry
Author(s): Kai Wu; Cheng-Chung Lee
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Comparison of fast Fourier transform and convolution in wavelength scanning interferometry
Author(s): H. Muhamedsalih; X. Jiang; F. Gao
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Absolute surface profilometry of an object with large gaps by means of monochromatic laser interferometry
Author(s): Zhiqiang Liu; Kiyoshi Uchikawa; Mitsuo Takeda
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Structured-illumination microscopy on technical surfaces: 3D metrology with nanometer sensitivity
Author(s): Markus Vogel; Zheng Yang; Alexander Kessel; Christoph Kranitzky; Christian Faber; Gerd Häusler
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Broad spectral range measurement of chromatic dispersion of polarization modes in holey fibers using spectral interferometry
Author(s): P. Hlubina; D. Ciprian; T. Martynkien; P. Mergo; W. Urbańczyk
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Inspection of processes during silicon wafer sawing using low coherence interferometry in the near infrared wavelength region
Author(s): Kay Gastinger; Lars Johnsen; Ove Simonsen; Astrid Aksnes
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Uncertainty of height information in coherence scanning interferometry
Author(s): J. Seewig; T. Böttner; D. Broschart
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Improvement of lateral resolution and reduction of batwings in vertical scanning white-light interferometry
Author(s): Jan Niehues; Peter Lehmann
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Parallel optical coherence tomography (pOCT) for industrial 3D inspection
Author(s): Patrick Lambelet
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High speed fringe projection for fast 3D inspection
Author(s): Sandra Caspar; Marc Honegger; Stefan Rinner; Patrick Lambelet; Carlo Bach; Andreas Ettemeyer
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Radial expansion measurements of a high-speed rotor using an interferometric array sensor
Author(s): J. Czarske; P. Günther; F. Dreier; T. Pfister; T. Haupt; W. Hufenbach
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High-speed, on-line 4D microscopy using continuously scanning white light interferometry with a high-speed camera and real-time FPGA image processing
Author(s): P. Montgomery; F. Anstotz; J. Montagna
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3D high-speed profilometer for inspection of micro-manufactured transparent parts
Author(s): Dean M. Ljubicic; Brian W. Anthony
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Fringe projection based high-speed 3D sensor for real-time measurements
Author(s): Christian Bräuer-Burchardt; Andreas Breitbarth; Peter Kühmstedt; Ingo Schmidt; Matthias Heinze; Gunther Notni
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Alignment methods for ultraprecise deflectometric flatness metrology
Author(s): Gerd Ehret; Michael Schulz; Arne Fitzenreiter; Maik Baier; Wolfgang Jöckel; Manuel Stavridis; Clemens Elster
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Measurement and characterization of cylindrical surfaces by deflectometry applied to ballistic identification
Author(s): A. V. Fantin; C. Veiga; A. Albertazzi
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Endoscopic geometry inspection by modular fiber optic sensors with increased depth of focus
Author(s): Christoph Ohrt; Markus Kästner; Eduard Reithmeier
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3D measuring in the field of endoscopy
Author(s): Anton Schick; Frank Forster; Michael Stockmann
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3D shape measurement based on color-encoded sinusoidal fringe projection
Author(s): Qican Zhang; Ke Ma
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New structured light measurement and calibration method for 3D documenting of engineering structures
Author(s): Robert Sitnik; Małgorzata Kujawińska; Paweł M. Błaszczyk
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Fast 3D shape measurements using laser speckle projection
Author(s): Martin Schaffer; Marcus Grosse; Bastian Harendt; Richard Kowarschik
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Optical measurement and comparison of large free form surfaces through a regular mesh
Author(s): Tiago L. Pinto; Christian Kohler; Armando Albertazzi
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Accurate calibration of a fringe projection system by considering telecentricity
Author(s): Klaus Haskamp; Markus Kästner; Eduard Reithmeier
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Some aspects of error influences in interferometric measurements of optical surface forms
Author(s): M. Schulz; A. Wiegmann
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Diffractive simultaneous lateral shearing interferometry
Author(s): Vanusch Nercissian; Irina Harder; Klaus Mantel; Andreas Berger; Norbert Lindlein
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Aspherical surface measurement using quadri-wave lateral shearing interferometry
Author(s): William Boucher; Pascal Delage; Benoit Wattellier
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Advanced studies on the measurement of aspheres and freeform surfaces with the tilted-wave interferometer
Author(s): Eugenio Garbusi; Goran Baer; Wolfgang Osten
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A subaperture stitching algorithm for aspheric surfaces
Author(s): Po-Chih Lin; Yi-Chun Chen; Chung-Min Lee; Chao-Wen Liang
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Axicon metrology using high line density computer-generated holograms
Author(s): Jun Ma; Christof Pruss; Matthias Häfner; Rihong Zhu; Zhishan Gao; Caojin Yuan; Wolfgang Osten
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3D profilometry on aspheric and freeform lenses
Author(s): A. Beutler
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Measurements of aberrations of aspherical lenses using experimental ray tracing
Author(s): Ufuk Ceyhan; Thomas Henning; Friedrich Fleischmann; David Hilbig; Dietmar Knipp
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Automated alignment of aspheric and freeform surfaces in a non-null test interferometer
Author(s): Goran Baer; Eugenio Garbusi; Wolfram Lyda; Christof Pruss; Wolfgang Osten
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Complete characterization of assembled optics with respect to centering error and lens distances
Author(s): J. Heinisch; P. Langehanenberg; H. Pannhoff
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Interferometric measurement of profile deviations of large precision mirrors
Author(s): Andreas Müller; Gerd Jäger; Eberhard Manske
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Measuring amplitude and phase of light emerging from microstructures with HRIM
Author(s): Toralf Scharf; Myun-Sik Kim; Hans Peter Herzig
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Extended range metrology: an age old problem
Author(s): Catherine E. Towers; David P. Towers; K. Falaggis
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Numerical noise reduction via diffraction for surface profiling interferometry
Author(s): Hidemitsu Toba; Shigeru Nakayama; Hideaki Homma; Takashi Gemma; Kiyoshi Uchikawa
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Dynamic measurements using a Fizeau interferometer
Author(s): Daniel M. Sykora; Michael L Holmes
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Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer
Author(s): María Frade; José María Enguita; Ignacio Álvarez; Silvia Rodríguez-Jiménez
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State of polarization mapping using a calibrated interferometric polarimeter
Author(s): Dinesh N. Naik; Rakesh Kumar Singh; Hitoshi Itou; Yoko Miyamoto; Mitsuo Takeda
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High resolution speckle interferometry by replacing temporal information with spatial information
Author(s): Y. Arai; T. Inoue; S. Yokozeki
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SLM-based multipoint vibrometry
Author(s): Tobias Haist; Alena Tarbeyevskaya; Michael Warber; Wolfgang Osten; Christian Rembe; Mario Ludwig; Wilhelm Stork
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Adaptive optical head for industrial vibrometry applications
Author(s): R. Atashkhooei; U. Zabit; S. Royo; T. Bosch; F. Bony
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Vibration amplitude recovery from time averaged interferograms using the directional spatial carrier phase shifting method
Author(s): A. Styk; M. Brzeziński
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Application of wavelet transform and image morphology in processing vibration speckle interferogram for automatic analysis
Author(s): Rajesh Kumar; Dibya Prakash Jena; Chandra Shakher
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High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles
Author(s): Katsuhiro Ishii; Sohichiro Nakamura; Yuki Sato
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Novel non-contact optical characterisation methods of polymeric nanocomposite structures based on their particle loading and dispersion profile
Author(s): Triantafillos Koukoulas; William R. Broughton; Matthew Tedaldi; Pete D. Theobald
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Mueller matrix imaging of nematic textures in colloidal dispersions of Na-fluorohectorite synthetic clay
Author(s): Morten Kildemo; Lars M. S. Aas; Pål G. Ellingsen; Henrik Hemmen; Elisabeth L. Hansen; Jon O. Fossum
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3D optical measuring technologies for industrial applications
Author(s): Yuri Chugui; Alexander Verkhogliad; Vadim Kalikin; Peter Zav'yalov
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Lockin-interferometric imaging of thermal waves for nondestructive testing
Author(s): Philipp Menner; Gerd Busse
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Laser ultrasonics evaluation and testing of coated HTR nuclear fuel
Author(s): Ahmed Amziane; Mohamed Amari; Denis Mounier; Jean-Marc Breteau; Nicolas Joly; Mathieu Edely; Maxime Larcher; Paul Noiré; Julien Banchet; David Tisseur; Vitalyi Gusev
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Laser induced deflection (LID) method for absolute absorption measurements of optical materials and thin films
Author(s): Christian Mühlig; Simon Bublitz; Wolfgang Paa
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Reflectometry for TSV etching depth inspection
Author(s): Wei-Te Hsu; Yi-Sha Ku
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Optical characterization of phase gratings written by a UV femtosecond laser in PMMA
Author(s): S. De Nicola; S. Abdalah; K. Al-Naimee; A. Geltrude; M. Locatelli; R. Meucci; A. Baum; W. Perrie; P. J. Scully; A. Taranu; F. T. Arecchi
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Development of a FD-OCT for the inline process metrology in laser structuring systems
Author(s): Robert Schmitt; Guilherme Mallmann; Pavel Peterka
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Turning process monitoring using a robust and miniaturized non-incremental interferometric distance sensor
Author(s): P. Günther; F. Dreier; T. Pfister; J. Czarske
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Measurement of surface resistivity/conductivity of carbon steel in 5-20ppm of KGR-134 inhibited seawater by holographic interferometry techniques
Author(s): K. Habib
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Reconstruction of 3D refractive index distribution across the graded index optical fibre using digital holographic interferometry
Author(s): H. H. Wahba; M. A. Shams El-Din
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Characterization of a waveguide written by a UV laser into a planar polymer chip by digital holographic interferometry
Author(s): M. A. Shams El-Din; H. H. Wahba; F. Vollertsen
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Influences of colorful LED emissions on spectrophotometric properties of a LED based white light source
Author(s): F. Sametoglu; O. Celikel
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Experimental study of the heat transfer process of air around atmospheric arc plasma
Author(s): F. Salimi Meidanshahi; Kh. Madanipour; Babak Shokri
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Coherence effects in Makyoh topography
Author(s): Ferenc Riesz
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Optical characterization of three-dimensional structures within a DRAM capacitor
Author(s): Martin Krupinski; Alexander Kasic; Thomas Hecht; Matthias Klude; Johannes Heitmann; Elke Erben; Thomas Mikolajick
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Spatial phase-shift interferometry: implementation of an effective phase-recovering algorithm
Author(s): Maurizio Vannoni; Mauro Melozzi; Marco Barilli; Andrea Sordini; Giuseppe Molesini
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3D laser scanner system based on a galvanometer scan head for high temperature applications
Author(s): Torunn Hegna; Hans Pettersson; Karl Magnus Laundal; Katarina Grujic
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Dynamic concentricity measurement of large interval-diameter ratio holes with virtual annular quadrant method
Author(s): Qian Liu; Weichuan Yang; Bing Yao; Jiadong Jang; Jun Hu
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High pressure measurement by fat long period grating sensor on a single mode optical fiber
Author(s): M. I. Zibaii; M. Kheiri; S. Nori; J. Sadeghi; H. Pourbeyram; H. Latifi; M. H. Ghezelaiagh
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Industrial surface inspection by wavelet analysis
Author(s): Thomas Kreis; Lars Rosenboom; Werner Jüptner
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Measurement of five-degrees-of-freedom error motions for a micro high-speed spindle using an optical technique
Author(s): Hiroshi Murakami
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Novel method for misalignments measurement on imaging systems through quality image analysis
Author(s): Esther Oteo; José Fernández-Dorado; J. Arasa; P. Blanco; C. Pizarro
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Design and fabrication of White Light Confocal Microscope with tunable resolution and sensitivity
Author(s): E. Behroodi; A. Mousavian; H. Latifi
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Visual alignment of mechanical structures using a Bessel beam datum: practical implementation
Author(s): David M. Gale
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Choice of the reflector for the autocollimating alignment telescope
Author(s): Andrey G. Anisimov; Alexandr N. Timofeev; Valery V. Korotaev
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In-process fault detection for textile fabric production: onloom imaging
Author(s): Florian Neumann; Timm Holtermann; Dorian Schneider; Ashley Kulczycki; Thomas Gries; Til Aach
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Compensation of reference beam sphericity in a multi-perspective digital holography based record-display setup
Author(s): Nitesh Pandey; Bryan Hennelly
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Measurement system for hot heavy forgings and its calibration
Author(s): Yueyang Du; Zhengchun Du
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3D shape measurement of optical free-form surface based on fringe projection
Author(s): Shaohui Li; Shugui Liu; Hongwei Zhang
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Hybrid light source for scanning white light interferometry-based MEMS quality control
Author(s): V. Heikkinen; K. Hanhijärvi; J. Aaltonen; H. Räikkönen; B. Wälchli; T. Paulin; I. Kassamakov; K. Grigoras; S. Franssila; E. Hæggström
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Adaptive holographic illumination in comparative electronic speckle pattern interferometry
Author(s): Richárd Séfel; János Kornis; Szilvia Varga-Fogarasi
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Fluorescence errors in integrating sphere measurements of remote phosphor type LED light sources
Author(s): A. Keppens; Y. Zong; V. B. Podobedov; M. E. Nadal; P. Hanselaer; Y. Ohno
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Optimization of measuring and calibration procedures for gas analyser based on acousto-optical tunable filters
Author(s): A. V. Fadeyev; V. E. Pozhar
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Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference
Author(s): Iakyra B. Couceiro; Thiago Ferreira da Silva; Luiz V. G. Tarelho; Carlos L. S. Azeredo; Igor Malinovski; Hans P. H. Grieneisein; Wellington S. Barros; Giancarlo V. Faria; Jean P. von der Weid; Marcello M. Amaral; Marcus P. Raele; Anderson Z. de Freitas
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Shape and thickness measurements using a reconstruction method for linear sensor microscopy based on improvement of lateral resolution isotropy
Author(s): M. P. Macedo; C. M. B. A. Correia
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Spectral polarimetry-based measurement of the thickness of a thin film
Author(s): P. Hlubina; J. Luňáček; D. Ciprian
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Spectrally resolved measurement of small optical losses by cavity enhanced spectroscopy techniques
Author(s): T. Zeuner; W. Paa; G. Schmidl; Ch. Mühlig
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Dispersion optimized white-light interferometer based on a Schwarzschild objective
Author(s): Peter Kühnhold; Peter Lehmann; Jan Niehues
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Comparative analysis of interferometric measurements of PMD on optical fibers
Author(s): T. Ferreira da Silva; J. Ferreira; G. Borghi; T. Menegotto; G. Vilela de Faria; J. P. von der Weid
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Transmission sphere calibration and its current limits
Author(s): Pengqian Yang; Jia Xu; Jianqiang Zhu; Stefan Hippler
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Time-resolved oblique incidence interferometer for vibration analysis of rough surface
Author(s): Yasuhiro Mizutani; Takayuki Higuchi; Tetsuo Iwata; Yukitoshi Otani
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Novel method for automatic filtering in the Fourier space applied to digital hologram reconstruction
Author(s): O. J. Rincon; R. Amezquita; Y. M. Torres; V. Agudelo
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Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces
Author(s): J. A. Böhm; A. Vernes; G. Vorlaufer; M. J. Vellekoop
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Digital holographic microscopy for dynamic imaging of hydrogels
Author(s): Caojin Yuan; Giancarlo Pedrini; Guodong Fu; Jun Ma; Wolfgang Osten
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Determination of the characteristics of the surface of objects at optical remote sensing by the polarization-holographic imaging Stokes spectropolarimeter
Author(s): Barbara Kilosanidze; George Kakauridze
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Particle concentration effect on diffraction efficiency in two views off-axis holograms
Author(s): L. Bouamama; S. Kara; O. Chaab; S. Simoëns
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Material tests using the ARAMIS system: a laboratory report
Author(s): Carlos Acevedo Pardo; Jens Ohlendieck; Manuel Krahwinkel; Harald Sternberg
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Calibration routine for in-process roundness measurements of steel rings during heat treatment
Author(s): H. Gafsi; G. Goch
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A new type of color-coded light structures for an adapted and rapid determination of point correspondences for 3D reconstruction
Author(s): Yannick Caulier; Luc Bernhard; Klaus Spinnler
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New method for evaluating high-quality fog protective coatings
Author(s): Grzegorz Czeremuszkin; Mohamed Latreche; Guillermo Mendoza-Suarez
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AFM nanometrology interferometric system with the compensation of angle errors
Author(s): Jan Hrabina; Josef Lazar; Petr Klapetek; Ondrej Cip
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Noncontact interferometric technique for calibration of coordinate measuring machines
Author(s): A. Miks; J. Novak; P. Novak
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Submicron displacements measurement by measuring autocorrelation of the transmission function of a grating
Author(s): K. Madanipour; M. T. Tavassoly
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Optimized dust-proof optical fiber sensing system for real-time monitoring of frequency, phase, and vibration of rotating parts
Author(s): K. Prokopczuk; P. Lesiak; T. Poczęsny; K. Rozwadowski; T. R. Woliński; A. W. Domański
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Optical sensor based on combined GI/DSPI technique for strain monitoring in crucial points of big engineering structures
Author(s): Dariusz Łukaszewski; Leszek Sałbut; Małgorzata Kujawińska; Krzysztof Malowany
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Mueller matrix imaging of plasmonic polarizers on nanopatterned surface
Author(s): Lars Martin S. Aas; Ingar Stian Nerbø; Morten Kildemo; Daniele Chiappe; Christian Martella; Francesco Buatier de Mongeot
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Measuring the performance of visible, NIR, and LWIR optical components: a reliable, robust, high-accuracy lens measurement system
Author(s): Stephen D. Fantone; Daniel G. Orband
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Optical fiber macro-bend seismic sensor for real-time vibration monitoring in harsh industrial environment
Author(s): T. Poczęsny; K. Prokopczuk; P. L. Makowski; A. W. Domański
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The Ronchi test using a liquid crystal display as a phase grating
Author(s): Miguel Mora-González; Francisco J. Casillas; Jesús Muñoz-Maciel; Roger Chiu-Zarate; Francisco G. Peña-Lecona
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High temperature sensing with FBGs using a tunable laser interrogation system
Author(s): B. Eder; M. Plattner; P. Putzer; P. Eckert; A. Reutlinger; T. Zeh
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Interferometric multiwavelength system for long gauge blocks measurements
Author(s): Michal Wengierow; Leszek Sałbut; Zbigniew Ramotowski
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Evaluation of thermal expansion coefficient of Fabry-Perot cavity using an optical frequency comb
Author(s): Jindřich Oulehla; Radek Šmíd; Zdeněk Buchta; Martin Čížek; Břetislav Mikel; Petr Jedlička; Josef Lazar; Ondřej Číp
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Development of error estimation method for phase detection in phase shift method
Author(s): Ryohei Hanayama; Kenichi Hibino
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Optical vibration measurements of cross coupling effects in capacitive micromachined ultrasonic transducer arrays
Author(s): Erlend Leirset; Astrid Aksnes
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Software configurable optical test system for refractive optics
Author(s): Margaret Z. Dominguez; Lirong Wang; Peng Su; Robert E. Parks; James H. Burge
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Optic-electronic systems for measuring the angle deformations and line shifts of the reflecting elements at the rotateable radio-telescope
Author(s): Igor A. Konyakhin; Alexandr N. Timofeev; Alexandr A. Usik; Dmitry V. Zhukov
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Zero-order elimination in digital holography by use of two holograms: one is made by tilting the CCD
Author(s): Mohammad Abolhassani; Yadollah Rostami
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Sub-ppm absolute distance measurements using an optical frequency comb generated by a conventional dual-drive Mach-Zehnder modulator
Author(s): S. Le Floch; M. Llera; Y. Salvadé
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A novel diffractive encoding principle for absolute optical encoders
Author(s): D. Hopp; D. Wibbing; C. Pruss; W. Osten; J. Binder; W. Schinköthe; F. Sterns; J. Seybold; K.-P. Fritz; V. Mayer; H. Kück
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Positioning of scanned part inside of the laser triangulation system
Author(s): M. Stankiewicz; J. Reiner; G. Kotnarowski
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Microlens array manufactured by inkjet printing: study of the effects of the solvent and the polymer concentration on the microstructure shape
Author(s): I. A. Grimaldi; A. De Girolamo Del Mauro; F. Loffredo; G. Nenna; F. Villani; C. Minarini
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Laser self-mixing sensor to monitor in situ the penetration depth during short pulse laser drilling of metal targets
Author(s): Francesco P. Mezzapesa; Antonio Ancona; Teresa Sibillano; Francesco De Lucia; Maurizio Dabbicco; Pietro Mario Lugarà; Gaetano Scamarcio
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Investigation of organic light emitting diodes for interferometric purposes
Author(s): Anna Pakula; Marzena Zimak; Leszek Sałbut
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