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Proceedings of SPIE Volume 8036

Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
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Volume Details

Volume Number: 8036
Date Published: 9 June 2011
Softcover: 26 papers (254) pages
ISBN: 9780819486103

Table of Contents
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Front Matter: Volume 8036
Author(s): Proceedings of SPIE
Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shape
Author(s): Dale E. Newbury; Nicholas W. M. Ritchie
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Probative value of gunshot residue on victims of shootings and comparison of gunshot residue results with modern technology versus older testing of samples
Author(s): Robert S. White; William J. Mershon
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Scientific working group on gunshot residue (SWGGSR): a progress report
Author(s): Michael A. Trimpe
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Characterization and source identification of fugitive dusts by light and electron microscopy
Author(s): Richard S. Brown
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Application possibilities of several modern methods of microscopy and microanalysis in forensic science field
Author(s): Marek Kotrly; Ivana Turkova
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The characterization of nanoparticles using analytical electron microscopy
Author(s): Whitney B. Hill
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Transmission electron microscopy of electrospun GaN nanofibers
Author(s): Joshua L. Robles-García; Anamaris Meléndez; Douglas Yates; Jorge J. Santiago-Avilés; Idalia Ramos; Eva M. Campo
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Study of LCE nanocomposites through electron microscopy
Author(s): N. Torras; J. Jobet; J. E. Marshall; K. Zinoviev; D. Yates; L. Rotkina; J. Esteve; E. M. Terentjev; E. M. Campo
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Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosion
Author(s): Giovanni F. Crosta
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Nanodispersion, nonlinear image filtering, and materials classification
Author(s): Giovanni F. Crosta; Jun S. Lee
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Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary
Author(s): J. Matney Wyatt
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Investigation of cellular interactions of nanoparticles by helium ion microscopy
Author(s): B. W. Arey; V. Shutthanandan; Y. Xie; A. Tolic; N. Williams; G. Orr
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Creating nanohole arrays with the helium ion microscope
Author(s): Mohan Ananth; Lewis Stern; David Ferranti; Chuong Huynh; John Notte; Larry Scipioni; Colin Sanford; Bill Thompson
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Secondary electron emission spectra and energy selective imaging in helium ion microscope
Author(s): Yu. Petrov; O. Vyvenko
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A metrological scanning probe microscope based on a quartz tuning fork detector
Author(s): Bakir Babic; Christopher H. Freund; Malcolm Lawn; John R. Miles; Jan Herrmann
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Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFM
Author(s): V. Korpelainen; J. Seppä; A. Lassila
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Study of a large range metrological atomic force microscope applied for calibration of a vertical PZT stage
Author(s): S. H. Wang; S. L. Tan; G. Xu
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Traceable calibration of a critical dimension atomic force microscope
Author(s): Ronald Dixson; Ndubuisi G. Orji; Craig D. McGray; Jon Geist
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Particle number density gradient samples for nanoparticle metrology with atomic force microscopy
Author(s): Malcolm A. Lawn; Renee V. Goreham; Jan Herrmann; Asa K. Jämting
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Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJ
Author(s): Kentaro Sugawara; Osamu Sato; Ichiko Misumi; Satoshi Gonda; Mingzi Lu
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New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategy
Author(s): G. Dai; W. Hässler-Grohne; D. Hüser; H. Wolff; J. Fluegge; H. Bosse
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Through-focus scanning optical microscopy
Author(s): Ravikiran Attota; Ronald G Dixson; Andras E. Vladár
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Dispersion free all reflective confocal microscope objective
Author(s): Wojtek J. Walecki; Mike Scaggs; Peter S Walecki; Fanny Szondy
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Use of fluorescence and scanning electron microscopy as tools in teaching biology
Author(s): Nabarun Ghosh; Jessica Silva; Aracely Vazquez; A B. Das; Don W. Smith
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3D-measurement using a scanning electron microscope with four Everhart-Thornley detectors
Author(s): Taras Vynnyk; Renke Scheuer; Eduard Reithmeier
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