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Advances in X-Ray/EUV Optics and Components V
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Volume Details

Volume Number: 7802
Date Published: 23 August 2010
Softcover: 22 papers (200) pages
ISBN: 9780819482983

Table of Contents
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Front Matter for Volume 7802
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Development of a one-dimensional Wolter mirror for an advanced Kirkpatrick-Baez mirror
Author(s): S. Matsuyama; T. Wakioka; H. Mimura; T. Kimura; N. Kidani; Y. Sano; Y. Nishino; K. Tamasaku; M. Yabashi; T. Ishikawa; K. Yamauchi
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WSi2/Si multilayer sectioning by reactive ion etching for multilayer Laue lens fabrication
Author(s): N. Bouet; R. Conley; J. Biancarosa; R. Divan; A. T. Macrander
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Compensation of fabrication errors in segmented x-ray optics
Author(s): Martina Atanassova; William Zhang; Timo Saha
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Beam splitting mirrors for miniature Fourier transform soft x-ray (FTXR) interferometer
Author(s): Jaroslava Wilcox; Victor White; Kirill Shcheglov; Robert Kowalczyk
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High-efficiency multilayer blazed gratings for EUV and soft x-rays: recent developments
Author(s): Dmitriy L. Voronov; Minseung Ahn; Eric H. Anderson; Rossana Cambie; Chih-Hao Chang; Leonid I. Goray; Eric M. Gullikson; Ralf K. Heilmann; Farhad Salmassi; Mark L. Schattenburg; Tony Warwick; Valeriy Yashchuk; Howard A. Padmore
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Optical properties of carbon coatings for extreme-ultraviolet high-order laser harmonics
Author(s): S. Coraggia; F. Frassetto; L. Poletto; J. A. Aznarez; J. I. Larruquert; J. A. Mendez; M. Negro; S. Stagira; C. Vozzi
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Compact spectrometer for the analysis of high harmonics content of extreme-ultraviolet free-electron-laser radiation
Author(s): F. Frassetto; S. Coraggia; L. Poletto; N. Guerassimova; S. Dziarzhytski; E. Ploenjes; H. Weigelt
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DLC/Si multilayer mirrors for EUV radiation
Author(s): Peter Gawlitza; Stefan Braun; Andreas Leson; Wouter Soer; Martin Jak; Vadim Banine
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In-situ stress measurements of sputtered multilayers
Author(s): Ch. Morawe; J.-Ch. Peffen; K. Friedrich
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Stress analysis of Mo, MoSi2 and Si mono-layer thin films and multilayers prepared by magnetron sputtering
Author(s): Jingtao Zhu; Qiushi Huang; Haochuan Li; Fengli Wang; Xiaoqiang Wang; Zhanshan Wang; Lingyan Chen
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Investigation of aberrations of Kirkpatrick-Baez mirrors
Author(s): Bodo Ehlers; Boris Verman
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Platinum Kirkpatrik-Baez mirrors for a hard x-ray microfocusing system made by profile coating
Author(s): Bing Shi; Chian Liu; Jun Qian; Wenjun Liu; Lahsen Assoufid; Ali Khounsary; Raymond Conley; Albert T. Macrander
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Computer-controlled cylindrical polishing process for development of grazing incidence optics for the hard x-ray region
Author(s): Gufran S. Khan; Mikhail Gubarev; Chet Speegle; Brian Ramsey
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Robust liquid metal collector mirror for EUV and soft x-ray plasma sources
Author(s): Kenneth Fahy; Fergal O'Reilly; Enda Scally; Paul Sheridan
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Micro-imaging performance of multilayers used as monochromators for coherent hard x-ray synchrotron radiation
Author(s): A. Rack; T. Weitkamp; M. Riotte; T. Rack; R. Dietsch; T. Holz; M. Krämer; F. Siewert; M. Meduna; Ch. Morawe; P. Cloetens; E. Ziegler
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Beam coherence and x-ray windows
Author(s): Ali Khounsary; Barry Lai; Jun Qian; Ruben Khachatryan; Jozef Maj; Xianrong Huang
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Analysis of mutual coherence of x-ray beam from rocking curves by perfect crystal
Author(s): Hiroshi Yamazaki; Tetsuya Ishikawa
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Modeling complex x-ray optical systems
Author(s): R. Schmitz; C. A. MacDonald
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EUV spectroscopic imaging observations of the first mission of Japanese small scientific satellites series
Author(s): Kouichi Sakai; Go Murakami; Gentaro Ogawa; Tatsuro Homma; Ichiro Yoshikawa; Kazuo Yoshioka; Munetaka Ueno; Atsushi Yamazaki; Kazunori Uemizu; Masato Kagitani; Fuminori Tsuchiya; Naoki Terada
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Compact extreme ultraviolet source by use of a discharge-produced potassium plasma for surface morphology application
Author(s): Hiromitsu Terauchi; Mami Yamaguchi; Keisuke Kikuchi; Takamitsu Otsuka; Takeshi Higashiguchi; Noboru Yugami; Toyohiko Yatagai; Padraig Dunne; Gerry O'Sullivan
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Improved synchrotron performance from indium antimonide crystals
Author(s): Brian Yates; Yongfeng Hu; Vinay Nagarkal
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Ultrasound artificial anisotropy of crystals in x-ray frequency range
Author(s): Vahram P. Mkrtchyan; Laura G. Gasparyan; Minas K. Balyan
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