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Proceedings of SPIE Volume 7801

Advances in Metrology for X-Ray and EUV Optics III
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Volume Details

Volume Number: 7801
Date Published: 23 August 2010
Softcover: 15 papers (150) pages
ISBN: 9780819482976

Table of Contents
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Front Matter for Volume 7801
Author(s): Proceedings of SPIE
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Developmental long trace profiler using optimally aligned mirror-based pentaprism
Author(s): Samuel K. Barber; Gregory Y. Morrison; Valeriy V. Yashchuk; Mikhail V. Gubarev; Ralf D. Geckeler; Jana Buchheim; Frank Siewert; Thomas Zeschke
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Present status of upgraded long trace profiler for characterization of high-precision x-ray mirrors at SPring-8
Author(s): Y. Senba; H. Kishimoto; H. Ohashi; H. Yumoto; S. Goto; T. Ishikawa
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Recent upgrades to the Diamond-NOM: A slope measuring profiler capable of characterizing the surface profile of large optics with sub-nanometer repeatability
Author(s): Simon G. Alcock; Kawal J. S. Sawhney; Stewart Scott
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Studies in optimal configuration of the LTP
Author(s): Wayne R. McKinney; Mark Anders; Samuel K. Barber; Edward E. Domning; Yunian Lou; Gregory Y. Morrison; Farhad Salmassi; Brian V. Smith; Valeriy V. Yashchuk
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ESRF metrology laboratory: overview of instrumentation, measurement techniques, and data analysis
Author(s): Amparo Vivo Rommeveaux; Benjamin Lantelme; Raymond Barrett
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Using the power spectral density method to characterise the surface topography of optical surfaces
Author(s): Simon G. Alcock; Geoff D. Ludbrook; Tommy Owen; Richard Dockree
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A double-pass Fizeau interferometer system for measuring the figure error of large synchrotron optics
Author(s): Geoff D. Ludbrook; Simon G. Alcock; Stewart Scott
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Calibration of the modulation transfer function of surface profilometers with binary pseudo-random test standards: expanding the application range
Author(s): Valeriy V. Yashchuk; Erik H. Anderson; Samuel K. Barber; Nathalie Bouet; Rossana Cambie; Raymond Conley; Wayne R. McKinney; Peter Z. Takacs; Dmitriy L. Voronov
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Large-field high-energy KB microscope with aperiodic multilayer
Author(s): Shengzhen Yi; Baozhong Mu; Zhanshan Wang; Xin Wang; Li Jiang; Jingtao Zhu
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At-wavelength optical metrology development at the ALS
Author(s): Sheng Yuan; Kenneth A. Goldberg; Valeriy V. Yashchuk; Richard Celestre; Iacopo Mochi; James Macdougall; Gregory Y. Morrison; Brian V. Smith; Edward E. Domning; Wayne R. McKinney; Tony Warwick
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New capabilities for predicting image degradation from optical surface metrology data
Author(s): Narak Choi; James E. Harvey; Andrey Krywonos
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Characterization of the DT ice layer in a fusion capsule using a two-dimensional x-ray shearing interferometer
Author(s): K. L. Baker
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Study of 18.2-nm Schwarzschild microscope for plasma diagnostics
Author(s): Xin Wang; Baozhong Mu; Yi Huang; Zirong Zhai; Shengzhen Yi; Li Jiang; Jingtao Zhu; Zhanshan Wang; Hongjie Liu; Leifeng Cao; Yuqiu Gu
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Surface profile measurement of KB mirrors using Fizeau laser interferometer
Author(s): J. Qian; L. Assoufid; C. Liu; B. Shi; W. Liu
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In situ long trace profiler for measurement of Wolter type-I mirror
Author(s): Tian Gang Cui; Yong Gang Wang; Wen Sheng Ma; Bo Chen
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