Share Email Print
cover

Proceedings of SPIE Volume 7448

Advances in X-Ray/EUV Optics and Components IV
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 7448
Date Published: 24 August 2009
Softcover: 26 papers (248) pages
ISBN: 9780819477385

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 7448
Author(s): Proceedings of SPIE
Binary pseudo-random gratings and arrays for calibration of the modulation transfer function of surface profilometers: recent developments
Author(s): Samuel K. Barber; Paul Soldate; Erik H. Anderson; Rossana Cambie; Stefano Marchesini; Wayne R. McKinney; Peter Z. Takacs; Dmitriy L. Voronov; Valeriy V. Yashchuk
Show Abstract
High-precision profile measurement of a small radius lens by surface gradient integrated profiler
Author(s): Y. Ueno; Y. Higashi; S. Tachibanada; J. Uchikoshi; T. Kume; K. Enami; H. Uchimura; K. Tanaka; K. Endo
Show Abstract
Improved efficiency of materials processing by dual action of XUV/Vis-NIR ultrashort laser pulses and comprehensive study of high-order harmonic source at PALS
Author(s): Krzysztof Jakubczak; Tomas Mocek; Bedrich Rus; Jan Hrebicek; Magdalena Sawicka; I Jong Kim; Seung Beom Park; Tae Keun Kim; Gye Hwang Lee; Chang Hee Nam; Jaromir Chalupsky; Vera Hajkova; Libor Juha; Jaroslav Sobota; Tomas Fort
Show Abstract
Modeling of heat-bump formation in x-ray optics under SR beams
Author(s): Peter Revesz; Alexander Kazimirov; James J. Savino; Christopher J. MacGahan; Emmett L. Windisch
Show Abstract
The fabrication and characterisation of piezoelectric actuators for active x-ray optics
Author(s): Dou Zhang; Daniel Rodriguez Sanmartin; Tim W. Button; Carl Meggs; Carolyn Atkins; Peter Doel; David Brooks; Charlotte Feldman; Richard Willingale; Alan Michette; Slawka Pfauntsch; Shahin Sahraei; Ady James; Camelia Dunare; Tom Stevenson; William Parkes; Andrew Smith; Hongchang Wang
Show Abstract
Progress on the development of active micro-structured optical arrays for x-ray optics
Author(s): Daniel Rodriguez Sanmartin; Dou Zhang; Tim Button; Carolyn Atkins; Peter Doel; Hongchang Wang; David Brooks; Charlotte Feldman; Richard Willingale; Alan Michette; Slawka Pfauntsch; Shahin Sahraei; Matthew Shand; Ady James; Camelia Dunare; Tom Stevenson; William Parkes; Andy Smith
Show Abstract
Optical path function calculation for an incoming cylindrical wave
Author(s): Wayne R. McKinney; James M. Glossinger; Howard A. Padmore; Malcolm R. Howells
Show Abstract
Improvement of the angular resolution of a thin-foil-nested x-ray telescope
Author(s): Takayuki Hayashi; Takuro Sato; Manabu Ishida; Yoshitomo Maeda; Hideyuki Mori; Ryoko Nakamura; Takayuki Shirata; Kentaro Someya; Yasushi Ogasaka; Kenichi Torii
Show Abstract
Nested mirrors for x-rays and neutrons
Author(s): Gene E. Ice; Rozaliya I. Barabash; Ali Khounsary
Show Abstract
Absolute efficiency measurement of high-performance zone plates
Author(s): Sharon Chen; Alan Lyon; Janos Kirz; Srivatsan Seshadri; Yan Feng; Michael Feser; Simone Sassolini; Fred Duewer; Xianghui Zeng; Carson Huang
Show Abstract
Thickness control of large area x-ray multilayers
Author(s): Ch. Morawe; J.-Ch. Peffen
Show Abstract
5000 groove/mm multilayer-coated blazed grating with 33% efficiency in the 3rd order in the EUV wavelength range
Author(s): Dmitriy L. Voronov; Erik H. Anderson; Rossana Cambie; Farhad Salmassi; Eric M. Gullikson; Valeriy V. Yashchuk; Howard A. Padmore; Minseung Ahn; Chih-Hao Chang; Ralf K. Heilmann; Mark L. Schattenburg
Show Abstract
1D-KBA microscope using double-periodic multilayer
Author(s): Baozhong Mu; Zhanshan Wang; Shengzhen Yi; Jingtao Zhu; Xin Wang; Li Jiang; Qiushi Huang; Yuhong Bai
Show Abstract
Multilayer optics for femtosecond-diffractometry
Author(s): J. Wiesmann; F. Hertlein; C. Michaelsen
Show Abstract
Narrowband multilayer mirrors for the extreme ultraviolet spectral range of 50 to 95 nm
Author(s): M. Vidal-Dasilva; M. Fernández-Perea; J. I. Larruquert; J. A. Méndez; J. A. Aznárez
Show Abstract
A fixed included angle monochromator for the 4th generation light source at FERMI@Elettra
Author(s): Cristian Svetina; Marco Zangrando; Anna Bianco; Daniele Cocco
Show Abstract
Analysis of a spatial structure of a focused x-ray beam diffracted from crystals
Author(s): A. Kazimirov; V. Kohn; A. Snigirev; I. Snigireva
Show Abstract
New microfocus source for x-ray diffractometry in the home-lab
Author(s): Bernd Hasse; Jörg Wiesmann; Carsten Michaelsen
Show Abstract
Methods to improve the accuracy of the surface reconstruction with a Fizeau interferometer
Author(s): Josep Vidal; Josep Nicolas; Juan Campos
Show Abstract
Evaluation of data storage layer thickness best fitted for digital data read-out procedure from hard x-ray optical memory
Author(s): Hakob P. Bezirganyan; Siranush E. Bezirganyan; Petros H. Bezirganyan; Hayk H. Bezirganyan
Show Abstract
Zone plate tilt study in transmission x-ray microscope system at 8-11 keV
Author(s): Fu-Han Chao; Gung-Chian Yin; Keng S. Liang; Yin-Chieh Lai
Show Abstract
Development of a high-precision slit for x-ray beamline at SPring-8
Author(s): T. Takeuchi; M. Tanaka; T. Miura; Y. Senba; Y. Shimada; H. Tajiri; O. Sakata; M. Sato; T. Koganezawa; K. Uesugi; H. Ohashi; S. Goto
Show Abstract
Design optimization of highly accurate elliptical mirrors for hard-x-ray microfocusing probes at SPring-8
Author(s): Hirokatsu Yumoto; Kunio Hirata; Atsushi Nisawa; Go Ueno; Masugu Sato; Jin-Young Son; Tomoyuki Koganezawa; Masatake Machida; Takayuki Muro; Ichiro Hirosawa; Motohiro Suzuki; Naomi Kawamura; Masaichiro Mizumaki; Haruhiko Ohashi; Masaki Yamamoto; Yoshio Watanabe; Shunji Goto
Show Abstract
Comparative study of x-ray scattering by first-order perturbation theory and generalized Harvey-Shack theory
Author(s): Yong-gang Wang; Yan-li Meng; Wen-sheng Ma; Bin Chen; Bo Chen
Show Abstract
Gain spectrum in gated x-ray MCPs
Author(s): G. A. Kyrala; J. Oertel; T. Archuleta; Joe Holder
Show Abstract
The NSLS-II multilayer Laue lens deposition system
Author(s): Ray Conley; Nathalie Bouet; James Biancarosa; Qun Shen; Larry Boas; John Feraca; Leonard Rosenbaum
Show Abstract

© SPIE. Terms of Use
Back to Top