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Proceedings of SPIE Volume 7389

Optical Measurement Systems for Industrial Inspection VI
Editor(s): Peter H. Lehmann
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Volume Details

Volume Number: 7389
Date Published: 17 June 2009
Softcover: 116 papers (1094) pages
ISBN: 9780819476722

Table of Contents
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Front Matter: Volume 7389
Author(s): Proceedings of SPIE
Flexible optical metrology strategies for the control and quality assurance of small series production
Author(s): R. Schmitt; A. Pavim
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Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopy
Author(s): W. Lyda; J. Zimmermann; A. Burla; J. Regin; W. Osten; O. Sawodny; E. Westkämper
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Remote online monitoring and measuring system for civil engineering structures
Author(s): Malgorzata Kujawińska; Robert Sitnik; Grzegorz Dymny; Maciej Karaszewski; Kuba Michoński; Jakub Krzesłowski; Krzysztof Mularczyk; Paweł Bolewicki
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Resolution-enhanced approaches in digital holography
Author(s): M. Paturzo; P. Ferraro
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Investigation of the thermal lens effect of a NdYAG laser
Author(s): A. Ettemeyer; J. Jütz; M. Spiegel; K. Dobler
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Microfluidic system based on the digital holography microscope for analysis of motile sperm
Author(s): G. Di Caprio; G. Coppola; S. Grilli; P. Ferraro; R. Puglisi; D. Balduzzi; A. Galli
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Dynamic holographic interferometry for dilatation measurements in a vacuum-thermal environment
Author(s): C. Thizy; C. Barbier; P. Barzin; I. Tychon; S. Roose; Y. Stockman; M. Georges
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Calibration of a combined system with phase measuring deflectometry and fringe projection
Author(s): Martin Breitbarth; Peter Kühmstedt; Gunther Notni
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Predictive segmentation method for 3D inspection accuracy and robustness improvement
Author(s): J. Reiner; M. Stankiewicz; M. Wójcik
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Quality-guided phase unwrapping for the modified Fourier transform method
Author(s): Hong Guo; Peisen Huang
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3D reconstruction by polarimetric imaging method based on perspective model
Author(s): Rindra Rantoson; Christophe Stolz; David Fofi; Fabrice Mériaudeau
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Optical 3D shape measurement for dynamic object using color fringe pattern projection and empirical mode decomposition
Author(s): Xiang Zhou; Hong Zhao; Pengfei Zhang
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Development of a high resolution pattern projection system using linescan cameras
Author(s): B. Denkena; P. Huke
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Industrial inspections by speckle interferometry: general requirements and a case study
Author(s): Matias R. Viotti; Armando Albertazzi G.
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Out-of-plane vibration analysis with a transmission holographic-optical-element-based electronic speckle pattern interferometer
Author(s): Viswanath Bavigadda; Vincent Toal; Raghavendra Jallapuram; Emilia Mihaylova
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Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm
Author(s): Y. Arai; Y. Tsutsumi; S. Yokozeki
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Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry
Author(s): P. Hlubina; D. Ciprian; M. H. Frosz; K. Nielsen
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Characterization of optical fibers by digital holographic interferometry
Author(s): Hamdy H. Wahba; Thomas Kreis
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Digital holographic tomography of phase objects
Author(s): Arun Anand; Vani K. Chhaniwal; Giancarlo Pedrini; Wolfgang Osten
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Phase object power mapping and cosmetic defects enhancement by Fourier-based deflectometry
Author(s): D. Beghuin; X. Dubois; L. Joannes
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Extraction of shape and roughness using scattering light
Author(s): J. Seewig; G. Beichert; R. Brodmann; H. Bodschwinna; M. Wendel
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The complete acquisition of the topography of a special multi-mirror arrangement with the help of a Fizeau interferometer
Author(s): H. Xu; A. Müller; F. Balzer; B. Percle; E. Manske; G. Jäger
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Ball bearing measurement with white light interferometry
Author(s): Joanna Schmit; Sen Han; Erik Novak
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Highly sensitive wavefront sensor for characterization of micro- to nanometer-scale surface flatness deviations
Author(s): I. Lazareva; A. Nutsch; L. Pfitzner; L. Frey
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Profilometry of semiconductor components by two-colour holography with Bi12TiO20 crystals
Author(s): André Oliveira Preto; Eduardo Acedo Barbosa
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Fast total scattering facility for 2D inspection of optical and functional surfaces
Author(s): P. Kadkhoda; W. Sakiew; S. Günster; D. Ristau
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Soft x-ray projection system for robust roundness measurements
Author(s): Raimund Volk; Ernst Neumann; Alexander Warrikhoff; Randolf Hanke; Stefan Kasperl; Christoph Funk; Jochen Hiller; Michael Krumm; Sudarsan Acharya; Frank Sukowski; Norman Uhlmann; Rolf Behrendt; Robert Schmitt; Andreas Hamacher; Björn Damm
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Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers
Author(s): Jae Wan Kim; Jong-Ahn Kim; Roma Jang; Chu-Shik Kang
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Development of an ultrasensitive interferometry system as a key to precision metrology applications
Author(s): Martin Gohlke; Thilo Schuldt; Dennis Weise; Ulrich Johann; Achim Peters; Claus Braxmaier
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Common-path two-wavelength interferometer with submicron precision for profile measurements in online applications
Author(s): José M. Enguita; Ignacio Álvarez; María Frade; Jorge Marina
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Digital interferometry using sequentially recorded intensity patterns
Author(s): B. Gombkötö; J. Kornis
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Small lens testing method using phase shift shearing interferometer
Author(s): Ryohei Hanayama; Katsuhiro Ishii; Kiyofumi Matsuda
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Reproducibility of contact lens power measurements using the phase shifting schlieren method
Author(s): Luc Joannes; Tony Hough; Xavier Hutsebaut; Xavier Dubois; Renaud Ligot; Bruno Saoul; Philip Van Donink; Kris De Coninck
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Phase analysis error reduction in the Fourier transform method using a virtual interferogram
Author(s): H. Toba; Z. Liu; S. Udagawa; N. Fujiwara; S. Nakayama; T. Gemma; M. Takeda
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Parameter determination of biconvex lenses using confocal imaging
Author(s): Vani K. Chhaniwal; Arun Anand
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Optical testing of lens systems with concentric design
Author(s): Alexander V. Goncharov; Laura Lobato Bailón; Nicholas M. Devaney; Christopher Dainty
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Simplified laser Doppler distance sensor employing a single fan-shaped interference fringe system for dynamic position and shape measurement of laterally moving objects
Author(s): Thorsten Pfister; Lars Büttner; Jürgen Czarske
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Surface profile analysis using a fiber optic low-coherence interferometer
Author(s): Robert Schmitt; Niels König; Elisa Manfrin de Araújo
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Fiber optic interferometric sensor based on mechanical oscillation
Author(s): Peter Lehmann; Markus Schulz; Jan Niehues
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Interferometric measurement of rotationally symmetric aspheric surfaces
Author(s): Michael F. Küchel
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New metrology approach for the production of aspheric lenses
Author(s): Andreas Beutler
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Measuring aspheres with a chromatic Fizeau interferometer
Author(s): L. Seifert; C. Pruss; B. Dörband; W. Osten
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Noncontact methods for optical testing of convex aspheric mirrors for future large telescopes
Author(s): Alexander V. Goncharov; Vladislav V. Druzhin; Vladislav I. Batshev
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Dual-CGH interferometry test for x-ray mirror mandrels
Author(s): Guangjun Gao; John P. Lehan; Ulf Griesmann
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Measurement and simulation of striae in optical glass
Author(s): H. Gross; M. Hofmann; R. Jedamzik; P. Hartmann; S. Sinzinger
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Photothermal measurement of absorptance losses, temperature-induced wavefront deformation, and compaction in DUV optics
Author(s): Bernd Schäfer; Bernhard Flöter; Klaus Mann
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Several micron-range measurements with sub-nanometric resolution by the use of dual-wavelength digital holography and vertical scanning
Author(s): Tristan Colomb; Jonas Kühn; Christian Depeursinge; Yves Emery
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Digital holographic characterization of liquid microlenses array fabricated in electrode-less configuration
Author(s): L. Miccio; V. Vespini; S. Grilli; M. Paturzo; A. Finizio; S. De Nicola; P. Ferraro
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Optical, mechanical, and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS
Author(s): Kay Gastinger; Karl Henrik Haugholt; Malgorzata Kujawinska; Michal Jozwik; Christoph Schaeffel; Stephan Beer
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Thin film interferometer using a light source with spectrally nonequidistantly distributed sampling points
Author(s): Florian Hirth; Sven Dudeck; Martin Jakobi; Detlef Gerhard; Alexander W. Koch
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All-interferometric six-degrees-of-freedom sensor based on laser self-mixing
Author(s): Simona Ottonelli; Francesco De Lucia; Maurizio Dabbicco; Gaetano Scamarcio
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Compensated laser encoder with symmetric and quasi-common-path heterodyne interferometry
Author(s): Cheng-Chih Hsu; Ju-Yi Lee; Chyan-Chyi Wu
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Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances
Author(s): July A. Galeano Zea; Patrick Sandoz
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Determination of the frequency spectrum of Lamb waves from a sequence of maps of the instantaneous acoustic displacement obtained with TV holography
Author(s): J. Luis Deán; Cristina Trillo; J. Carlos López-Vázquez; Ángel F. Doval; José L. Fernández
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Study on the temporal coherence function of a femtosecond optical frequency comb
Author(s): Dong Wei; Satoru Takahashi; Kiyoshi Takamasu; Hirokazu Matsumoto
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In-situ position and vibration measurement of rough surfaces using laser Doppler distance sensors
Author(s): J. Czarske; T. Pfister; P. Günther; L. Büttner
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Structural damage identification based on laser ultrasonic propagation imaging technology
Author(s): Chen-Ciang Chia; Si-Gwang Jang; Jung-Ryul Lee; Dong-Jin Yoon
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Real-time defect detection in transparent multilayer polymer films using structured illumination and 1D filtering
Author(s): Walter Michaeli; Klaus Berdel; Oliver Osterbrink
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Novel fiber-based technique for inspection of holes in narrow-bore tubes
Author(s): Fabien Bernard; Tony Flaherty; Gerard M. O'Connor
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Development and application of a photogrammetric endoscopic system for measurement of misalignment and internal profile of welded joints in pipelines
Author(s): Armando Albertazzi G.; Allan C. Hofmann; Analucia V. Fantin; João M. C. Santos
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Industrial online surface defects detection in continuous casting hot slabs
Author(s): Ignacio Alvarez; Jorge Marina; Jose Maria Enguita; Cesar Fraga; Ricardo Garcia
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Optical classification for quality and defect analysis of train brakes
Author(s): Stefan Glock; Stefan Hausmann; Sebastian Gerke; Alexander Warok; Peter Spiess; Stefan Witte; Volker Lohweg
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Two-sided laser device for online paper caliper measurement and control
Author(s): Michael K. Y. Hughes; Markus Bengtsson; Pak Hui; Graham Duck
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Calibration method for accurate optical measurement of thickness profile for the paper industry
Author(s): Jussi Graeffe
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FASEP ultra-automated analysis of fibre length distribution in glass-fibre-reinforced products
Author(s): Mark R. Hartwich; Norbert Höhn; Helga Mayr; Konrad Sandau; Ralph Stengler
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Electro-optic sensors dedicated to noninvasive electric field characterization
Author(s): A. Warzecha; M. Bernier; G. Gaborit; L. Duvillaret; J.-L. Lasserre
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Spectral peak tracking for enhanced fiber optic sensing
Author(s): Markus P. Plattner; C. N. Brand; T. Mair; S. Schupfer; T. C. Buck; A. W. Koch
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A novel fiber grating array vibration monitoring system for large area safety
Author(s): FanYong Meng; Bin Yang; Zhigang Li; Susan Dong; ZhuanYun Guo
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New 3D high-accuracy optical coordinates measuring technique based on an infrared target and binocular stereo vision
Author(s): Jinjun Li; Hong Zhao; Qiang Fu; Pengfei Zhang; Xiang Zhou
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White-light spectral interferometry and reflectometry to measure thickness of thin films
Author(s): P. Hlubina; J. Luńáček; D. Ciprian
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New approach to workpiece localization in subaperture stitching interferometric testing
Author(s): Pengfei Zhang; Hong Zhao; Tao Jiang; Jinjun Li; Xiang Zhou; Lu Zhang
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Sheath flow stability controlling research in dynamic individual particles scattering measurement
Author(s): Lu Zhang; Hong Zhao; Pengfei Zhang; Xiang Zhou; Jinjun Li
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Non-metal elemental analysis by a compact low-energy high-repetition rate laser-induced-breakdown spectrometer
Author(s): Christian Wagner; Johannes Ewald; Georg Ankerhold; Peter Kohns
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Study on laser vision measurement technology of large-size workpiece straightness
Author(s): Xinglin Zhou; Shenghua Ye; Xinghua Qu
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Polarized optical scattering measurements of metallic nanoparticles upon a silicon wafer
Author(s): Cheng-Yang Liu; Wei-En Fu
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Fabrication and optical characteristics of silicon-based two-dimensional photonic crystal wavelength division multiplexing splitter
Author(s): Cheng-Yang Liu
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Simple method for the measurement of small wavelength differences by optical activity of cholesteric liquid crystal and heterodyne interferometer
Author(s): Jing-Heng Chen; Kun-Huang Chen; Jiun-You Lin; Hsiang-Yung Hsieh; Wei-Yao Chang
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Study of the measurement of solution concentration by surface plasmon resonance heterodyne interferometer
Author(s): Kun-Huang Chen; Jing-Heng Chen; Jiun-You Lin; Wei-Yao Chang; Hsiang-Yung Hsieh
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Wavelength-modulated heterodyne speckle interferometry for displacement measurement
Author(s): Ju-Yi Lee; Kun-Yi Lin; Szu-Han Huang
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3D shape measurement using curvature data
Author(s): ByoungChang Kim; MinChel Kwon; ByoungUck Choo; InJeong Yoon
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Evaluation of aliasing influence on the performance of hybrid optical-digital speckle correlator
Author(s): Leonid I. Muravsky; Olexander M. Sakharuk; Pavel V. Yezhov
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Automated ethernet-based test setup for long wave infrared camera analysis and algorithm evaluation
Author(s): Torsten Edeler; Kevin Ohliger; Sönke Lawrenz; Stephan Hussmann
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Influence of material dispersion on the measurement accuracy of chromatic sensors
Author(s): Antonin Miks; Jiri Novak; Pavel Novak; Pavel Kajnar
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High-precision alignment technique through quality image analysis
Author(s): J. Arasa; E. Oteo; P. Blanco
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Makyoh topography studies of the morphology of periodic and quasi-periodic surfaces
Author(s): Ferenc Riesz
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Surface quality control in diamond abrasive finishing
Author(s): Yuriy D. Filatov; Volodymyr I. Sidorko; Olexandr Yu. Filatov; Vasil P. Yaschuk; Uwe Heisel; Michael Storchak
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Analysis of low activity in dynamic speckle patterns
Author(s): M. N. Guzman; G. H. Sendra; H. J. Rabal; R. Arizaga; M. Trivi
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Rock porosity and fracture parameter estimation by image technique
Author(s): W. Wang; Ch. Z. Wang; Y. Z. Hu
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Interferometric characterization of mono- and polycrystalline CVD diamond
Author(s): Maurizio Vannoni; Giuseppe Molesini; Silvio Sciortino; Stefano Lagomarsino; Paolo Olivero
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Auto-focusing in the scanning white-light interferometer
Author(s): Wei Cheng Wang; Jin-Liang Chen
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Spatial resolution enhancement for Brillouin optical time domain analysis distributed sensor by use of correlation peak
Author(s): Soodabeh Nouri Jouybari; Hamid Latifi; Atefeh Ahmadlou; Morteza Karami
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Simulation and fabrication of white light confocal microscope to attain the surface profile using CCD and image processing techniques
Author(s): E. Behroodi; A. Mousavian; H. Latifi
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Weighted integral method in white-light interferometry: envelope estimation from fraction of interferogram
Author(s): Seichi Sato; Shigeru Ando
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Development of 3D control of a tiny dew droplet by scattered laser light
Author(s): Shigeaki Matsumoto
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Measurement of temperature, refractive index, density distribution, and convective heat transfer coefficient around a vertical wire by the Michelson interferometer
Author(s): K. Madanipour; S. Fatehi; P. Parvin
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Novel instrumentation for interferometric nanoscale comparator
Author(s): Martin Cizek; Zdenek Buchta; Bretislav Mikel; Josef Lazar; Ondrej Cip
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Dynamic evaluation of lateral and vertical displacement of thermally actuated MEMS devices
Author(s): Kalle Hanhijärvi; Juha Aaltonen; Ivan Kassamakov; Lauri Sainiemi; Kestutis Grigoras; Sami Franssila; Edward Hæggström
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Performance analysis of interrogators for fiber Bragg grating sensors based on arrayed waveguide gratings
Author(s): Thorbjörn C. Buck; Mathias S. Müller; Markus Plattner; Alexander W. Koch
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Multiple object image segmentation algorithm based on wavelet theory
Author(s): W. Wang; Z. Wang
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Effect of surface defects on the self-images produced by diffraction gratings
Author(s): Luis Miguel Sanchez-Brea; Francisco Javier Salgado-Remacha; Francisco José Torcal-Milla
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Precise measurement of the length by means of DFB diode and femtosecond laser
Author(s): Radek Šmíd; Ondřej Číp; Josef Lazar; Jan Jezek; Bohdan Ružička
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Classification of mechanical parts using an optical-digital system and the Jacobi-Fourier moments
Author(s): Carina Toxqui-Quitl; Alfonso Padilla-Vivanco; J. Baez-Rojas
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Characterization of deformable elastic lenses using PDI and null screen
Author(s): A. Santiago Alvarado; F. S. Granados Agustín; S. Vázquez Montiel; M. Campos García; R. Dìaz Uribe
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Correlating buried-finger photodetector for time-of-flight applications
Author(s): G. Zach; A. Nemecek; K. Oberhauser; H. Zimmermann
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Modelling for characterizing defects in plates using two-dimensional maps of instantaneous ultrasonic out-of-plane displacement obtained by pulsed TV-holography
Author(s): J. Carlos López-Vázquez; J. Luis Deán; Cristina Trillo; Ángel F. Doval; José L. Fernández; Faisal Amlani; Oscar P. Bruno
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Determination of thermal lens effect by white light interferometry
Author(s): Duygu Önal Tayyar; Ahmet Emir; Zehra Saraç
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A Fizeau interferometer system with double-pass and stitching for characterizing the figure error of large (>1m) synchrotron optics
Author(s): G. D. Ludbrook; S. G. Alcock; K. J. S. Sawhney
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Optical noncontact roughness measurements for the assessment of stress and deformation in tubular metallic parts of auto seats
Author(s): Manuel F. M. Costa; Francisco J. Quierós de Melo; Joaquim A. O. Carneiro
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Combined stereovision and phase shifting method: a new approach for 3D shape measurement
Author(s): Xu Han; Peisen Huang
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Sensor for measurement of hydrocarbons concentration based on optic fiber
Author(s): Joanna Pawłat; Xuefeng Li; Takahiro Matsuo; Yura Zimin; Toshitsugu Ueda
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Three-dimensional shape measurement by means of depth-to-coherence coding of the object shape
Author(s): Vicente Micó; Estela Valero; Zeev Zalevsky; Javier García
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Nondestructive testing of aerospace composites with an infrared matrix laser vibrometer
Author(s): James Kilpatrick; Adela Apostol; Vladimir Markov
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Automated compensation of fringe pattern in digital holography and TV holography
Author(s): János Kornis; Richárd Séfel
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Multifocus microscope image fusion analysis based on Daubechies wavelets
Author(s): Alfonso Padilla-Vivanco; Carina Toxqui-Quitl; C. Santiago-Tepantlan
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Combined stereovision and phase shifting method: use of a visibility-modulated fringe pattern
Author(s): Xu Han; Peisen Huang
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AFM characterization of large area micro-optical elements
Author(s): M. Oliva; T. Benkenstein; M. Flemming; U. D. Zeitner
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Inspection of aspherical lenses by wavefront analysis
Author(s): Ufuk Ceyhan; Thomas Henning; Friedrich Fleischmann; Dietmar Knipp
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