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PROCEEDINGS VOLUME 7378

Scanning Microscopy 2009
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Volume Details

Volume Number: 7378
Date Published: 8 June 2009
Softcover: 46 papers (438) pages
ISBN: 9780819476548

Table of Contents
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Recent progress in understanding the imaging and metrology using the helium ion microscope
Author(s): Michael T. Postek; Andras E. Vladar; Bin Ming
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Application of He ion microscopy for material analysis
Author(s): F. Altmann; M. Simon; R. Klengel
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Novel choices for formulating embedding media kits
Author(s): José A. Mascorro
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Methodologies for the preparation of soft materials using cryoFIB SEM
Author(s): Debbie J. Stokes; Mike F. Hayles
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FIB/SEM cell sectioning for intracellular metal granules characterization
Author(s): Marziale Milani; Claudia Brundu; Grazia Santisi; Claudio Savoia; Francesco Tatti
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Implementation of ion-beam techniques in microsystems manufacturing: opportunities in cell biology
Author(s): E. M. Campo; M. J. Lopez-Martinez; E. Fernández; J.. Esteve; J. A. Plaza
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Advanced methods in scanning x-ray microscopy
Author(s): A. Menzel; M. Dierolf; C. M. Kewish; P. Thibault; K. Jefimovs; C. David; M. Bech; T. H. Jensen; R. Feidenhans'l; A.-M. Heegaard; R. Hansen; T. Berthing; K. L. Martinez; J. Als-Nielsen; S. Kapishnikov; L. Leiserowitz; F. Pfeiffer; O. Bunk
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Solving the micro-to-macro spatial scale problem with milliprobe x-ray fluorescence/x-ray spectrum imaging
Author(s): Dale E. Newbury; Jeff M. Davis
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Characterizing heterogeneous particles with SEM/SDD-EDS mapping and NIST Lispix
Author(s): Dale Newbury; Nicholas Ritchie; David Bright
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IR analysis of polyvinylidene fluoride doped with transition metal halides
Author(s): Somia M. El Hefnawy; Mervet M. Aboelkher; H. Abdelkader
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X-ray analysis of polyvinylidene fluoride doped with transition metal halides
Author(s): Somia M. El Hefnawy; Mervet M. Aboelkher; H. Abdelkader
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Extreme high resolution scanning electron microscopy (XHR SEM) and beyond
Author(s): Laurent Y. Roussel; Debbie J. Stokes; Ingo Gestmann; Mark Darus; Richard J. Young
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The role of oxygen in secondary electron contrast of doped semiconductors in LVSEM
Author(s): M. M. El Gomati; F. N. Zaggout; C. G. H. Walker; X. Zha
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Recent developments in the understanding and application of backscattered and secondary electrons in the SEM
Author(s): M. M. El Gomati; C. G. H. Walker; J. A. D. Matthew
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Variable probe current using a condenser lens in a miniature electron beam column
Author(s): C. S. Silver; J. P. Spallas; L. P. Muray
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Russian standards for dimensional measurements for nanotechnologies
Author(s): V. P. Gavrilenko; M. N. Filippov; Yu. A. Novikov; A. V. Rakov; P. A. Todua
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Test objects for automated dimensional measurements at the nanoscale level using a scanning electron microscope
Author(s): V. P. Gavrilenko; M. N. Filippov; Yu. A. Novikov; A. V. Rakov; P. A. Todua
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Optimization of accurate SEM imaging by use of artificial images
Author(s): Petr Cizmar; András E. Vladár; Michael T. Postek
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Monte Carlo simulation to determine the measurement uncertainty of a metrological scanning probe microscope measurement
Author(s): Ph. Kreutzer; N. Dorozhovets; E. Manske; R. Füßl; G. Jäger; R. Grünwald
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On the relationship between hidden Markov models and convex functional transforms for simulating scanning probe microscopy
Author(s): Omolabake A. Adenle; William J. Fitzgerald
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Automated nanoscale AFM measurements using a-priori-knowledge
Author(s): C. Recknagel; H. Rothe
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Identification of scanning probe microscopes sensor heads and validation of a mechanical model by a laser vibrometer
Author(s): Bernd R. Arminger; Bernhard G. Zagar
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Kelvin probe force microscopy: measurement data reconstruction
Author(s): Torsten Machleidt; Erik Sparrer; Tim Kubertschak; Rico Nestler; Karl-Heinz Franke
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A control approach to cross coupling compensation of piezotube scanners in tapping-mode imaging
Author(s): Jian Shi; Ying Wu; Chanmin Su; Qingze Zou
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Enabling accurate gate profile control with inline 3D-AFM
Author(s): Tianming Bao; Andrew Lopez; Dean Dawson
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Scanning electron microscopy in characterizing seeds of some leguminous trees
Author(s): Nabarun Ghosh; Amiyanghshu Chatterjee; Don W. Smith
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Fresh fruit: microstructure, texture, and quality
Author(s): Delilah F. Wood; Syed H. Imam; William J. Orts; Gregory M. Glenn
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Microstructure and nutrient distribution in oats: influence on quality
Author(s): S. Shea Miller; Judith Frégeau-Reid
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Characterization of some biological specimens using TEM and SEM
Author(s): Nabarun Ghosh; Don W. Smith
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Construction of a new type of low-energy scanning electron microscope with atomic resolution
Author(s): D. A. Eastham; P. Edmondson; S. Donnelly; E. Olsson; K. Svensson; A. Bleloch
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Quantum dot conjugates for SEM of bacterial communities
Author(s): Jay Nadeau; Randall Mielke; Samuel Clarke
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A novel confocal line scanning sensor
Author(s): Sirichanok Chanbai; Georg Wiora; Mark Weber; Hubert Roth
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Hybrid FDTD-Fresnel modeling of the scanning confocal microscopy
Author(s): Bartlomiej Salski; Wojciech Gwarek
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Three-dimensional image formation under single-photon ultra-short pulsed illumination
Author(s): Arijit Kumar De; Debabrata Goswami
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Microspectroscopic method for determination of size and distribution of protein complexes in vivo
Author(s): S. Rath; A. P. Sullivan; M. R Stoneman; V. Raicu
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Applying fluorescence microscopy to the investigation of the behavior of foodborne pathogens on produce
Author(s): Maria T. Brandl
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Transport imaging with near-field scanning optical microscopy
Author(s): Nancy M. Haegel; Chun-Hong Low; Lee Baird; Goon-Hwee Ang
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Use of a scanning optical profilometer for toolmark characterization
Author(s): L. S. Chumbley; D. J. Eisenmann; M. Morris; S. Zhang; J. Craft; C. Fisher; A. Saxton
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Forensic document analysis using scanning microscopy
Author(s): Douglas K. Shaffer
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Gunshot residue inserted under hair scales as a result of a muzzle blast
Author(s): Bryan R. Burnett
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SEM-EDX analysis of an unknown "known" white powder found in a shipping container from Peru
Author(s): Douglas C. Albright
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Quality assurance aspects of GSR analysis by SEM/EDX: a report of first-hand experiences
Author(s): Sebastien Charles; Didier Dehan; Nadia Geusens; Bart Nys
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Multiscale 3D bioimaging: from cell, tissue to whole organism
Author(s): S. H. Lau; Ge Wang; Margam Chandrasekeran; Victor Fan; Mohd Nazrul; Hauyee Chang; Tiffany Fong; Jeff Gelb; Michael Feser; Wenbing Yun
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Modeling of charge and discharge in scanning electron microscopy
Author(s): S. Babin; S. Borisov; A. Ivanchikov
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New prospects for electron beams as tools for semiconductor lithography
Author(s): Hans C. Pfeiffer
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XHR SEM: enabling extreme high resolution scanning electron microscopy
Author(s): Richard Young; Sander Henstra; Jarda Chmelik; Trevor Dingle; Albert Mangnus; Gerard van Veen; Ingo Gestmann
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