Share Email Print
cover

PROCEEDINGS VOLUME 7361

Damage to VUV, EUV, and X-Ray Optics II
Editor(s): Libor Juha; Saša Bajt; Ryszard Sobierajski
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 7361
Date Published: 11 May 2009
Softcover: 31 papers (308) pages
ISBN: 9780819476357

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 7361
Author(s): Proceedings of SPIE
Damage study for the design of the European XFEL beamline optics.
Author(s): J. Gaudin; H. Sinn; L. Samoylova; F. Yang; T. Tschentscher
Show Abstract
The FERMI@Elettra FEL photon transport system
Author(s): D. Cocco; A. Abrami; A. Bianco; I. Cudin; C. Fava; D. Giuressi; R. Godnig; F. Parmigiani; L. Rumiz; R. Sergo; C. Svetina; M. Zangrando
Show Abstract
Interaction of intense ultrashort XUV pulses with silicon
Author(s): R. Sobierajski; D. Klinger; M. Jurek; J. B. Pelka; L. Juha; J. Chalupský; J. Cihelka; V. Hakova; L. Vysin; U. Jastrow; N. Stojanovic; S. Toleikis; H. Wabnitz; J. Krzywinski; S. Hau-Reige; R. London
Show Abstract
Response of molecular solids to ultra-intense femtosecond soft x-ray pulses
Author(s): J. Chalupský; L. Juha; V. Hájková; J. Cihelka; L. Vysin; J. Gautier; J. Hajdu; S. P. Hau-Riege; M. Jurek; J. Krzywinski; Ri. A. London; E. Papalazarou; J. B. Pelka; G. Rey; S. Sebban; R. Sobierajski; N. Stojanovic; K. Tiedtke; S. Toleikis; T. Tschentscher; C. Valentin; H. Wabnitz; P. Zeitoun
Show Abstract
Efficient materials processing by dual action of XUV/Vis-NIR ultrashort laser pulses
Author(s): Krzysztof Jakubczak; Tomas Mocek; Jiri Polan; Pavel Homer; Bedrich Rus; I Jong Kim; Chul Min Kim; Seung Beom Park; Tae Keun Kim; Gye Hwang Lee; Chang Hee Nam; Jaromir Chalupsky; Vera Hájková; Libor Juha; Jaroslav Sobota; Tomas Forst
Show Abstract
Silica nano-ablation using laser plasma soft x-rays
Author(s): Tetsuya Makimura; Shuichi Torii; Hiroyuki Niino; Kouichi Murakami
Show Abstract
Surface changes of solids under intense EUV irradiation using a laser-plasma source
Author(s): Andrzej Bartnik; Henryk Fiedorowicz; Roman Jarocki; Jerzy Kostecki; Rafal Rakowski; Miroslaw Szczurek
Show Abstract
Direct structuring of solids by EUV radiation from a table-top laser produced plasma source
Author(s): Frank Barkusky; Armin Bayer; Christian Peth; Klaus Mann
Show Abstract
Dynamic of electronic subsystem of semiconductors excited with an ultrashort VUV laser pulse
Author(s): N. Medvedev; B. Rethfeld
Show Abstract
Radiation damage within atomic clusters irradiated with intense VUV radiation
Author(s): B. Ziaja; H. Wabnitz; F. Wang; E. Weckert; T. Möller
Show Abstract
Modelling of damage processes of the optical-cryogenic sensor at microscopic and macroscopic levels
Author(s): Vitaliy Yatsenko; Leonid Yatsenko; Anatoliy Negriyko; Janna Potemkina; Elena Udovitskaya
Show Abstract
Damage studies of multilayer optics for XUV free electron lasers
Author(s): E. Louis; A. R. Khorsand; R. Sobierajski; E. D. van Hattum; M. Jurek; D. Klinger; J. B. Pelka; L. Juha; J. Chalupský; J. Cihelka; V. Hajkova; U. Jastrow; S. Toleikis; H. Wabnitz; K. I. Tiedtke; J. Gaudin; E. M Gullikson; F. Bijkerk
Show Abstract
Sub-micron focusing of soft x-ray free electron laser beam
Author(s): S. Bajt; H. N. Chapman; A. J. Nelson; R. W. Lee; S. Toleikis; P. Mirkarimi; J. B. Alameda; S. L. Baker; H. Vollmer; R. T. Graff; A. Aquila; E. M. Gullikson; J. Meyer Ilse; E. A. Spiller; J. Krzywinski; L. Juha; J. Chalupský; V. Hájková; J. Hajdu; T. Tschentscher
Show Abstract
Competitive reactions of carbon deposition and oxidation on the surface of Mo/Si multilayer mirrors by EUV irradiation
Author(s): Masahito Niibe; Keigo Koida
Show Abstract
Laser damage densities measurements on fused silica optics: round-robin test at 351-355 nm
Author(s): Laurent Lamaignère; Marc Loiseau; Thierry Donval; Roger Courchinoux; Stéphane Bouillet; Jean-Christophe Poncetta; Bertrand Bertussi; Hervé Bercegol
Show Abstract
Laser-induced damage studies in optical elements using X-ray laser interferometric microscopy
Author(s): D. Margarone; M. Kozlova; J. Nejdl; B. Rus; T. Mocek; P. Homer; J. Polan; M. Stupka; G. Jamelot; K. Cassou; S. Kazamias; A. Klisnick; D. Ros; H. Bercegol; C. Danson; S. Hawkes
Show Abstract
Characterization of the focused beam of desktop 10-Hz capillary-discharge 46.9-nm laser
Author(s): Ludek Vyšin; Tomás Burian; Jaromír Chalupský; Michael Grisham; Vera Hájková; Scott Heinbuch; Krzysztof Jakubczak; Dale Martz; Tomás Mocek; Peter Pira; Jirí Polan; Jorge J. Rocca; Bedrich Rus; Jaroslav Sobota; Libor Juha
Show Abstract
Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser
Author(s): J. Cihelka; L. Juha; J. Chalupský; F. B. Rosmej; O. Renner; K. Saksl; V. Hájková; L. Vyšin; E. Galtier; R. Schott; A. R. Khorsand; D. Riley; T. Dzelzainis; A. Nelson; R. W. Lee; P. Heimann; B. Nagler; S. Vinko; J. Wark; T. Whitcher; S. Toleikis; T. Tschentscher; R. Faustlin; H. Wabnitz; S. Bajt; H. Chapman; J. Krzywinski; R. Sobierajski; D. Klinger; M. Jurek; J. Pelka; S. Hau-Riege; R. A. London; J. Kuba; N. Stojanovic; K. Sokolowski-Tinten; A. J. Gleeson; M. Störmer; J. Andreasson; J. Hajdu; N. Timneanu
Show Abstract
Nonlinear 6-fold enhancement of laser drilling efficiency by double pulse mode: prospective in medicine application
Author(s): N. S. Pershina; S. M. Pershin; M. Cech; I. Prochazka
Show Abstract
Phosphor materials under high-density XUV FEL excitation: mechanisms of luminescence quenching
Author(s): Sebastian Vielhauer; Vladimir Babin; Marco De Grazia; Eduard Feldbach; Marco Kirm; Vitali Nagirnyi; Andrej N. Vasil'ev
Show Abstract
Factors affecting the transmission and stability in complex fluorides in VUV spectral region
Author(s): Martin Nikl; Hiroki Sato; Eva Mihokova; Toshiro Mabuchi; Teruhiko Nawata; A. Yoshikawa; Jan Pejchal; Naoriaki Kawaguchi; Sumito Ishizu; Kentaro Fukuda; Toshihisa Suyama
Show Abstract
Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam
Author(s): Pawel E. Malinowski; Joachim John; Frank Barkusky; Jean Yves Duboz; Anne Lorenz; Kai Cheng; Joff Derluyn; Marianne Germain; Piet De Moor; Kyriaki Minoglou; Armin Bayer; Klaus Mann; Jean-Francois Hochedez; Boris Giordanengo; Gustaaf Borghs; Robert Mertens
Show Abstract
Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors
Author(s): Regina Soufli; Sherry L. Baker; Jeff C. Robinson; Eric M. Gullikson; Tom J. McCarville; Michael J. Pivovaroff; Peter Stefan; Stefan P. Hau-Riege; Richard Bionta
Show Abstract
Degradation of thin-film filters irradiated by debris emission of a laser induced plasma
Author(s): David Schäfer; Urs Wiesemann; Thomas Nisius; Thomas Wilhein
Show Abstract
Risk analysis of laser elements for complex characterization of damages by space radiation
Author(s): Mikhailo Brodyn; Vladimir Bezrodnyi; Anatoliy Negriyko; Vitaliy Yatsenko
Show Abstract
Characterization of tin vapor from CO[sub]2[/sub] laser produced EUV light source
Author(s): Yoshifumi Ueno; Tatsuya Yanagida; Takashi Suganuma; Hiroshi Komori; Akira Sumitani; Akira Endo
Show Abstract
Applicability of transmissive diffractive optics to high flux FEL radiation
Author(s): Thomas Nisius; Rolf Früke; David Schäfer; Marek Wieland; Thomas Wilhein
Show Abstract
Toward a better understanding of multi-wavelength effects on KDP crystals
Author(s): Stéphane Reyné; Marc Loiseau; Guillaume Duchateau; Jean-Yves Natoli; Laurent Lamaignère
Show Abstract
Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation
Author(s): V. Hájková; J. Chalupský; H. Wabnitz; J. Feldhaus; M. Störmer; Ch. Hecquet; T. Mocek; M. Kozlová; J. Polan; P. Homer; B. Rus; L. Juha
Show Abstract
Applications of compact laser-driven EUV/XUV plasma sources
Author(s): Frank Barkusky; Armin Bayer; Stefan Döring; Bernhard Flöter; Peter Großmann; Christian Peth; Michael Reese; Klaus Mann
Show Abstract
XUV metrology: surface analysis with extreme ultraviolet radiation
Author(s): M. Banyay; L. Juschkin; T. Bücker; P. Loosen; A. Bayer; F. Barkusky; S. Döring; C. Peth; K. Mann; H. Blaschke; I. Balasa; D. Ristau
Show Abstract

© SPIE. Terms of Use
Back to Top