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Proceedings of SPIE Volume 7155

Ninth International Symposium on Laser Metrology
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Volume Details

Volume Number: 7155
Date Published: 2 October 2008
Softcover: 114 papers (1088) pages
ISBN: 9780819473981

Table of Contents
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Front Matter: Volume 7155
Author(s): Proceedings of SPIE
Some answers to new challenges in optical metrology
Author(s): W. Osten
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Hardware-based error compensation in 3D optical metrology systems
Author(s): Kevin Harding
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Characterization of optical surfaces for the present generations of synchrotron sources
Author(s): M. Thomasset; F. Polack
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Enhanced resolution methods in shearography and holography for time-average vibration measurement
Author(s): D. N. Borza
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Characterisation of laser marks using digital holographic microscopy
Author(s): Vijay Raj Singh; Oi Choo Chee; Eddy Sim; Anand Asundi
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Structure measurement of phase grating on post-magnification digital micro-holography
Author(s): Wenjing Zhou; Yingjie Yu; Anand Asundi
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Comparison of digital holographic microscope and confocal microscope methods for characterization of micro-optical diffractive components
Author(s): Hao Yan; Anand Asundi
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Reduction of speckle noise by multi-kinoforms in holographic three-dimensional display
Author(s): Huadong Zheng; Yingjie Yu; Haiyan Qian; Anand Asundi
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Deformation analysis on micro objects using multiple wavelength microscopic TV holography
Author(s): U. Paul Kumar; N. Krishna Mohan; M. P. Kothiyal; A. K. Asundi
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Applications of laser ultrasound NDT methods on composite structures in aerospace industry
Author(s): Michael Kalms; Oliver Focke; Christoph v. Kopylow
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Experimental study of unconveniant static and dynamic deformations of piezoelectric actuators
Author(s): D. N. Borza
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Long-term reliability measurements on MEMS using a laser-Doppler vibrometer
Author(s): J. De Coster; L. Haspeslagh; A. Witvrouw; I. De Wolf
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Defect inspection by an active 3D multiresolution technique
Author(s): Javier Vargas; Juan Antonio Quiroga
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Development of a metrological atomic force microscope for nano-scale standards calibration
Author(s): S. H. Wang; G. Xu; S. L. Tan
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In-situ evaluation of nanoparticle diameter for visualizing self-assembly process
Author(s): Satoshi Ota; Terutake Hayashi; Yasuhiro Takaya
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Evaluation on the probing error of a micro-coordinate measuring machine
Author(s): Z. X. Chao; S. L. Tan; G. Xu
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High-resolution interferometry with Nd:YAG laser for local probe microscopy
Author(s): Josef Lazar; Ondřej Číp; Martin Čížek; Mojmír Šerý
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High throughput measurement techniques for wafer level yield inspection of MEMS devices
Author(s): O. Varela Pedreira; T. Lauwagie; J. De Coster; L. Haspeslagh; A. Witvrouw; I. De Wolf
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Frequency-shifting method for phase retrieval from fringe patterns
Author(s): Haixia Wang; Kemao Qian; Wenjing Gao
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Fast auto-focusing based on partial image characteristics
Author(s): Jiwen Cui; Jiubin Tan
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Inspection method for directional texture defects on steel strip surface
Author(s): J. H. Cong; Y. H. Yan
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General structure for real-time fringe pattern preprocessing and implementation of median filter and average filter on FPGA
Author(s): Wenjing Gao; Kemao Qian; Haixia Wang; Feng Lin; Hock Soon Seah; Lee Sing Cheong
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Phase measurement via in-line digital holographic microscopy
Author(s): Weijuan Qu; Yingjie Yu; Wenjing Zhou; Hao Yan; Anand Asundi
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Random-phase-shift Fizeau interferometer
Author(s): Nicolae Radu Doloca; Rainer Tutsch
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Faster window Fourier transform filters for fringe pattern analysis
Author(s): Le Tran Hoai Nam; Kemao Qian
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Application of plate vibration and DSPI in evaluation of elastic modulus
Author(s): Rajesh Kumar; Chandra Shakher
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Optical metrology of micro- and nanostructures at PTB: status and future developments
Author(s): Bernd Bodermann; Egbert Buhr; Gerd Ehret; Frank Scholze; Matthias Wurm
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Influence of line edge roughness (LER) on angular resolved and on spectroscopic scatterometry
Author(s): Thomas Schuster; Stephan Rafler; Karsten Frenner; Wolfgang Osten
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Detection and active stabilization of beams position at a high-resolution laser interferometer
Author(s): Ondřej Číp; Zdeněk Buchta; Martin Čížek; Radek Šmíd; Josef Lazar
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Model-free and model-based methods for dimensional metrology during the lifetime of a product
Author(s): Peter Weidner; Alexander Kasic; Thomas Hingst; Carsten Ehlers; Sylke Philipp; Thomas Marschner; Manfred Moert
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Determination of flatness on patterned wafer surfaces using wavefront sensing methods
Author(s): A. Nutsch; L. Pfitzner; T. Grandin; X. Levecq; S. Bucourt
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New simplified measuring method for distributed low-level birefringence
Author(s): Kenji Gomi; Tomoyuki Suzuki; Yasushi Niitsu; Kensuke Ichinose
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Phase shift polarimetry for non-invasive detection of laser-induced damage
Author(s): Pin Wang; Anand Asundi
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Residual stress in silicon wafer using IR polariscope
Author(s): Zhijia Lu; Pin Wang; Anand Asundi
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Absolute and dynamic position and shape measurement of fast moving objects employing novel laser Doppler techniques
Author(s): Thorsten Pfister; Philipp Günther; Lars Büttner; Jürgen Czarske
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An endoscopic optical system for inner cylindrical measurement using fringe projection
Author(s): Armando Albertazzi G.; Allan C. Hofmann; Analucia V. Fantin; João M. C. Santos
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Surface measurement with Shack-Hartmann wavefront sensing technology
Author(s): X. Li; L. P. Zhao; Z. P. Fang; A. Asundi; X. M. Yin
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A simple method to estimate surface reflectance parameters for three light photometric stereo
Author(s): Mohammad A. Younes; M. A. Al-Nady
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A low-cost antenna reflector shape and distortion measuring system with high accuracy
Author(s): Xudong Li; Hongzhi Jiang; Jie Zhou; Dong Li; Huijie Zhao
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The comparison of different temporal phase analysis algorithms in optical dynamic measurement
Author(s): H. Miao; Y. Fu
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A polarization sensitive interferometer for stress analysis
Author(s): Mahuya Sarkar; S. K. Sarkar; A. Basuray
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A double-prism lateral shear interferometer for wavefront analysis and collimation testing
Author(s): K. U. Hii; K. H. Kwek
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A cube splitter interferometer for phase shifting interferometry and birefringence analysis
Author(s): K. Bhattacharya; N. Ghosh
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Model building and measurement of the temporal noise for thermal infrared imager
Author(s): Xun Yu; Liang Nie; Tieli Hu; Xu Jiang; Fang Wang
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Speckle noise suppression in shape and deformation measurements by phase-shifting digital holography
Author(s): Ichirou Yamaguchi
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A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel components
Author(s): T. Liu; A. A. Malcolm; X. M. Yin; S. J. Liew; T. P. Prawiradiraja
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Full-field swept-source optical coherence tomography with Gaussian spectral shaping
Author(s): Satish Kumar Dubey; Gyanendra Sheoran; Tulsi Anna; Arun Anand; Dalip Singh Mehta; Chandra Shakher
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Phase shifting interferograms processing for fiber point-diffraction interferometer
Author(s): Liang Nie; Jun Han; Xun Yu; Baoyuan Liu; Xu Jiang; Fang Wang
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Study on a new method for measuring volumetric error of CMM
Author(s): Enxiu Shi; Junjie Guo; Yumei Huang
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Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transform
Author(s): Wen Chen; Chenggen Quan; Cho Jui Tay
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Power loss due to beam splitter cascade in the simultaneous sampling of a volume speckle field for phase retrieval
Author(s): Anne Margarette S. Maallo; Percival F. Almoro
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On-line digital holographic measurement of size and shape of microparticles for crystallization processes
Author(s): Taslima Khanam; Emmanouil Darakis; Arvind Rajendran; Vinay Kariwala; Anand K. Asundi; Thomas J. Naughton
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Reduction of speckle noise in digital holographic images using wavelet transform
Author(s): Akshay Sharma; Gyanendra Sheoran; Z. A. Jaffery; . Moinuddin
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The characterization of the double fiber Bragg grating fiber ring laser and its applications in a real time fiber sensing system
Author(s): C. L. Ko; C. Y. Yang; K. R. Huang; Ming Chang Shih
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NDT detection and quantification of induced defects on composite helicopter rotor blade and UAV wing sections
Author(s): Dirk Findeis; Jasson Gryzagoridis; Vincent Musonda
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Development of an inexpensive optical method for studies of dental erosion process in vitro
Author(s): A. M. T. Nasution; B. Noerjanto; L. Triwanto
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Modeling of coupling coefficient as a function of coupling ratio
Author(s): . Saktioto; Jalil Ali; Mohammed Fadhali; Rosly Abdul Rahman; Jasman Zainal
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3D investigation of photonics elements by means of interferometric and photoelastic tomography
Author(s): N. Kumar; M. Kujawinska; P. Kniazewski
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A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivity
Author(s): J. Wang; Anand K. Asundi
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Precision optical metrology for MEMS
Author(s): Ryszard J. Pryputniewicz
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A path planning method for large-scale blade profile measurement based on neutral network
Author(s): Fei Zhang; Zhuang-de Jiang; Jian-jun Ding; Bing Li; Lei Chen
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Optical bi-sensorial measurement system for production control of extruded profiles
Author(s): A. Weckenmann; J. Bernstein
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Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diode
Author(s): Masato Aketagawa; Yuta Hoshino; Masashi Ishige; Tuan Banh Quoc
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Adaptive confocal system for 3-D profiling
Author(s): Ravi Kumar K.; Vernon Jialiang Shen; Amitava Talukdar; Anand Asundi
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Measurement of temperature field in steady laminar free convection flow using digital holography
Author(s): Chandra Shakher; Md. Mosarraf Hossain; Dalip Singh Mehta; Gyanendra Sheoran
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Laser spectroscopic study of acetate-capped colloidal ZnO nanoparticles
Author(s): S. A. Oh; X. W. Sim; S. Tripathy
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The output characteristics of the erbium-doped fiber Bragg grating ring laser
Author(s): C. Y. Yang; C. L. Ko; K. R. Huang; Ming Chang Shih
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Active alignment and reliable pigtailing of laser diode transmitter
Author(s): M. Fadhali; . Saktioto; J. Zainal; Y. Munajat; J. Ali; R. Rahman
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Determination of third-order optical absorptive nonlinearity of ZnO nanoparticles by Z-scan technique
Author(s): R. Sreeja; R. Reshmi; George Manu; M. K. Jayaraj
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Influence of iodine cell quality onto the stability and absolute frequency shifts of laser etalons
Author(s): Jan Hrabina; Josef Lazar; Petr Jedlicka; Ondrej Cip
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Investigation of laser produced Fe plasma plume dynamics using time resolved imaging and snow plow model
Author(s): S. Mahmood; L. Jiaji; S. V. Springham; T. L. Tan; R. S. Rawat; P. Lee
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Processing of digital holograms for size measurements of microparticles
Author(s): Emmanouil Darakis; Taslima Khanam; Arvind Rajendran; Vinay Kariwala; Anand K. Asundi; Thomas J. Naughton
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A radial in-plane DSPI interferometer using diffractive optics for residual stresses measurement
Author(s): Armando Albertazzi G.; Matias R. Viotti; Walter A. Kapp
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Electronics speckle interferometry applications for NDE of spacecraft structural components
Author(s): M. V. Rao; R. Samuel; A. Ananthan; S. Dasgupta; P. S. Nair
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Moire fringe method for the measurement of distortions of hot-embossed polymeric substrates
Author(s): Hayden K. Taylor; Zhiguang Xu; Shiguang Li; Kamal Youcef-Toumi; Yoon Soon Fatt; Duane S. Boning
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Crack displacement sensing and measurement in concrete using circular grating moire fringes and pattern matching
Author(s): H. M. Chan; K. S. Yen; M. M. Ratnam
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Static and dynamic 3D contouring by using structured light
Author(s): R. Rodriguez-Vera; D. Vasquez; K. Genovese; J. A. Rayas; F. Mendoza-Santoyo
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Temporal Paul wavelet analysis for phase retrieval using shadow moire technique
Author(s): H. T. Niu; C. Quan; C. J. Tay
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Whole field residual stress measurement using computer aided reflection grating
Author(s): Chi Seng Ng; Yoke Chin Goh; Anand K. Asundi
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The effects of post-annealing on pulse laser deposition of Zr0.8Sn0.2TiO4 thin film on Si(100)
Author(s): C. T. Chuang; Ming Chang Shih; M. H. Weng
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Ultra-thin-film characterization with vacuum ultraviolet spectroscopic reflectometry (VUV-SR)
Author(s): Ibrahim Burki; Cristian Rivas
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Infrared of thin film graphene in a magnetic field and the Hall effect
Author(s): Keshav N. Shrivastava
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Inspection of electroplated gold
Author(s): T. W. Ng; F. Y. Yong
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Sub-pixel matching with consideration of lens distortion
Author(s): Shihao Dong; Xiaobo Zhao; Yongkai Yin; Jindong Tian; Xiang Peng
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The measurement of polymerization shrinkage of composite resins with ESPI
Author(s): Zhang Zhang; Guo Biao Yang
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Study on topography measurement of ultra-smooth surface
Author(s): Yuhe Li; XiaoLei Tong; Haoshan Lin; Huiyu Li; Qingxiang Li
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Study on measurement method for projectile location based on light screen
Author(s): Feng Han; QunHua Liu; GuoBin Sun
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Microlens testing: an application
Author(s): Hooi Leng Ng-Lee; Seach Chyr Ernest Goh; Chris Stephen Naveen Ranjit; . Maryanto; Jie Ying Sarah Ng; Anand Asundi
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Application of laser tracker used in the measuring and the adjusting of the workbench for SAR antenna
Author(s): Bixi Yan; Jun Wang; Naiguang Lu; Wenyi Deng; Mingli Dong; Xiaoping Lou
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Study on key algorithm for scanning white-light interferometry
Author(s): Ailing Tian; Chunhui Wang; Zhuangde Jiang; Hongjun Wang; Bingcai Liu
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High-power laser diode array system for optical pumping of Rb
Author(s): Zdenek Buchta; Ondrej Cíp; Jan Rychnovský; Josef Lazar
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Error analysis of frequency mixing on heterodyne interferometry detecting device for superfinish surface scratch
Author(s): Haoshan Lin; Yuhe Li; Dongsheng Wang; Mei Liu
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Error analysis and compensation of binocular-stereo-vision measurement system
Author(s): Tao Zhang; Junjie Guo
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Research of the conical cavity high-energy laser energy meter energy loss compensation technique
Author(s): Xun Yu; Qian Li; Liang Nie; Xiaoyan Shang; Baoyuan Liu
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Design of laser source for fiber point diffraction interferometer
Author(s): Xun Yu; Liang Nie; Jun Han; Baoyuan Liu; Xu Jiang
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Stabilization of semiconductor lasers by fiber Bragg gratings
Author(s): Bretislav Mikel; Radek Helan; Ondrej Cip; Petr Jedlicka
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The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurement
Author(s): Lu Zhang; Hong Zhao; Xiaopin Wang; Weiguang Zhang
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Vibration influence and error compensation of aspherical surface interferometer
Author(s): Hongjun Wang; Jianfeng Cao; Ailing Tian; Bingcai Liu
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Investigation of light scattering for scratch detection
Author(s): Z. W. Zhong; L. P. Zhao; L. J. Wang
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The interaction performance of white light, laser diode, and He-Ne laser with two wavefront sensing systems
Author(s): Z. W. Zhong; L. P. Zhao; A. A. Hein
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The high resolution actuator based on giant magnetostriction
Author(s): Lei Wang; Jiu-bin Tan; Shan Zhang
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Rigorous accuracy analysis of the fiber point diffraction interferometer
Author(s): Jun Han; Liang Nie; Xun Yu; Xu Jiang; Fang Wang
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Robust isoclinic calculation for automatic analysis of photoelastic fringe patterns
Author(s): J. A. Quiroga; E. Pascual; J. Villa-Hernandez
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Fast wavefront estimation using multiple directional derivatives and quadrature transform
Author(s): Ricardo Legarda-Saenz
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Influence of TFT-LCD pixel structure on holographic representation
Author(s): Hongjun Wang; Zhao Wang; Ailing Tian; Bingcai Liu
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Research of the automatic imaging focusing measurement for off-axis Fresnel digital holography
Author(s): Xun Yu; Liang Nie; Fang Wang; Xu Jiang
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Measurement of human embryonic stem cell in the growing cycle
Author(s): X. Li; L. Zhao; Steve K. W. Oh; W. K. Chong; J. K. Ong; Allen K. Chen; Andre B. H. Choo
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Complete deformation analysis of transparent samples using digital shearography and holography
Author(s): Francesca Celine I. Catalan; Raphael D. Santos; Percival F. Almoro
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The nondestructive testing research on porcelain-fused-to-metal (PFM) of oral cavity
Author(s): Guo-biao Yang; Zhang Zhang; Yi Ding
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Development of a multi-resolution measurement system based on light sectioning method
Author(s): Weiguang Zhang; Hong Zhao; Xiang Zhou; Lu Zhang
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Three-dimensional profile measurement using a flexible new multiview connection method
Author(s): Peng Zheng; Hongwei Guo; Yingjie Yu; Mingyi Chen
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Application research of spectrum measurement technology in thin-film thickness wideband monitoring system
Author(s): Jun Han; Xiao-yan Shang; Yu-ying An; Xu Jiang; Fang Wang
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Raman scattering from Zn/ZnO core-shell nanoparticles
Author(s): Geetika Bajaj; R. K. Soni
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Inspection of thin films failure: optical shearography versus electrochemical impedance spectroscopy
Author(s): K. Habib; F. Al-Sabti
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