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Proceedings of SPIE Volume 7101

Advances in Optical Thin Films III
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Volume Details

Volume Number: 7101
Date Published: 16 September 2008
Softcover: 62 papers (652) pages
ISBN: 9780819473318

Table of Contents
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Front Matter: Volume 7101
Author(s): Proceedings of SPIE
Progress in optical coatings
Author(s): Angus Macleod
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Design principles for broadband AR coatings
Author(s): Uwe Schallenberg
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Estimation for the number of layers of broad band anti-reflection coatings
Author(s): Tatiana Amotchkina; Alexander Tikhonravov; Michael Trubetskov
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'Gedankenspektrum' methods in optical coatings
Author(s): Fred T. Goldstein
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Frequency filtering in optical thin film design revisited
Author(s): Pierre G. Verly
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New plasma processes for antireflective structures on plastics
Author(s): U. Schulz; P. Munzert; R. Leitel; N. Bollwahn; I. Wendling; N. Kaiser; A. Tünnermann
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Closed field magnetron sputtering: new generation sputtering process for optical coatings
Author(s): D. R. Gibson; I. Brinkley; E. M. Waddell; J. M. Walls
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Plasma ion-assisted deposition with radio frequency powered plasma sources
Author(s): H. Hagedorn; M. Klosch; H. Reus; A. Zoeller
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New developments in magnetron sputter processes for precision optics
Author(s): Michael Vergöhl; Oliver Werner; Stefan Bruns
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State of the art in deterministic production of optical thin films
Author(s): D. Ristau; H. Ehlers; S. Schlichting; M. Lappschies
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All-optical in-situ monitoring of PIAD deposition processes
Author(s): Steffen Wilbrandt; Olaf Stenzel; Norbert Kaiser
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Forces in rotary motion systems
Author(s): Markus K Tilsch; Gregory K. Elliott
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A method for the determination of substrate temperature during thin film coating deposition
Author(s): St. Günster; H. Ehlers; D. Ristau
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Computer simulation of coating processes with monochromatic monitoring
Author(s): A. Zöller; M. Boos; H. Hagedorn; B. Romanov
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Advanced optical coatings for telecom and spectroscopic applications
Author(s): Adam Badeen; Michelle Briere; Peter Hook; Claude Montcalm; Robert Rinfret; Joshua Schneider; Brian T. Sullivan
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High performance notch filter coatings produced with PIAD and magnetron sputtering
Author(s): M. Scherer; U. Schallenberg; H. Hagedorn; W. Lehnert; B. Romanov; A. Zoeller
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Sputter process with time-variant reactive gas mixture for the deposition of optical multilayer and gradient layer systems
Author(s): H. Bartzsch; J. Weber; K. Lau; D. Glöß; P. Frach
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Optimization and characterization of transparent photocatalytic TiO2 thin films prepared by ion-assisted deposition
Author(s): Redouan Boughaled; Sebastian Schlichting; Henrik Ehlers; Detlev Ristau; Inga Bannat; Michael Wark
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Metal fluoride coatings prepared by ion-assisted deposition
Author(s): Martin Bischoff; Maik Sode; Dieter Gäbler; Helmut Bernitzki; Christoph Zaczek; Norbert Kaiser; Andreas Tünnermann
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Toward picometer optical figuring of ultra-precision optical components using multi-aperture deposition techniques
Author(s): John W. Arkwright; Jan Burke; Mark Gross
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Optical thin films on polarization preserving cube corner retroreflectors
Author(s): Hakchu Lee
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Structural and electrical properties of low temperature deposited ITO films
Author(s): Kevin Füchsel; Ulrike Schulz; Norbert Kaiser; Andreas Tünnermann
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Reliable production of steep edge interference filters
Author(s): Marc Lappschies; Peter Pfeifer; Uwe Schallenberg; Henrik Ehlers; Detlev Ristau
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Characterization of the optical properties of hydrophobic coatings and realization of high performance AR coatings with dust- and water-repellent properties
Author(s): S. Bruynooghe; S. Spinzig; M. Fliedner; G. J. Hsu
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Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection spectroscopy and plasmon resonance spectroscopy
Author(s): Anna Krasilnikova Sytchkova
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Determination of thermal and elastic coefficients of optical thin-film materials
Author(s): S. Michel; F. Lemarquis; M. Lequime
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Measurement of thermal expansion coefficient and biaxial modulus of DWDM filters using phase-shift interferometer
Author(s): Chien-Cheng Kuo; Sheng-Hui Chen; Cheng-Chung Lee
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Extraction of film interface surfaces from scanning white light interferometry
Author(s): Daniel Mansfield
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Light scattering to isolate a single interface within a multilayer
Author(s): Gaëlle Georges; Carole Deumié; Claude Amra
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Characterization of the optical constants of materials from the visible to the soft x-rays
Author(s): Juan I. Larruquert; Mónica Fernández-Perea; Manuela Vidal-Dasilva; José A. Aznárez; José A. Méndez; Luca Poletto; Denis Garoli; A. Marco Malvezzi; Angelo Giglia; Stefano Nannarone
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Coatings for next generation lithography
Author(s): C. Zaczek; S. Müllender; H. Enkisch; F. Bijkerk
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Low-loss HR coatings on fused silica substrates for 193 nm micro-lithography applications
Author(s): Sven Laux; Helmut Bernitzki; Dieter Fasold; Michael Klaus; Uwe Schuhmann
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High performance EUV multilayer optics
Author(s): Norbert Kaiser; Sergiy Yulin; Marco Perske; Torsten Feigl
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Non-periodic multilayer coatings in EUV, soft x-ray and x-ray range
Author(s): Zhanshan Wang
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Thin-film filters for a high resolution miniaturized spectrometer
Author(s): Angela Piegari; Anna K. Sytchkova; Jiri Bulir; Bernd Harnisch; Andreas Wuttig
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Mid-infrared filters for astronomical and remote sensing instrumentation
Author(s): Gary Hawkins; Richard Sherwood; Karim Djotni
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Status of NIF mirror technologies for completion of the NIF facility
Author(s): C. J. Stolz
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1.5 octave dispersive dielectric multilayers for pulse compression
Author(s): Vladimir Pervak; Ferenc Krausz; Alexander Apolonski
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Theoretical and experimental analysis of the laser irradiation parameters influence on the LIDT of optical coatings
Author(s): Laurent Gallais; Jérémie Capoulade; Jean-Yves Natoli; Mireille Commandré
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Non-destructive evaluation on optical components for high power density applications
Author(s): Jean-Yves Natoli; Frank Wagner; A. Ciapponi; S. Palmier; Laurent Gallais; Mireille Commandré
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Spatial dispersion of optical thin films
Author(s): Xu Liu; Zhen-yue Luo; Wei-dong Shen; Xue-zhen Sun; Pei-fu Gu
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Resonant gratings for narrow band pass filtering applications
Author(s): Olga Boyko; Fabien Lemarchand; Anne Talneau; Anne-Laure Fehrembach; Anne Sentenac
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Photochromic mesoporous hybrid coatings
Author(s): L. Raboin; M. Matheron; T. Gacoin; J.-P. Boilot
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Bulk-micromachined dielectric tunable optical filter realized with inductively coupled plasma chemical vapour deposition
Author(s): Sandro Jatta; Klaus Haberle; Kuldip Singh; Benjamin Koegel; Hubert Halbritter; Peter Meissner
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Design and monitoring of narrow bandpass filters composed of non-quarter-wave thicknesses
Author(s): Ronald R. Willey
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Reactively sputtered aluminium nitride films for spectral emission control
Author(s): S. Zhao; C.-G. Ribbing
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Optical and structural properties of Nb<sub>x</sub>Si<sub>y</sub>O composite films prepared by metallic co-sputtering process
Author(s): Xinbin Cheng; Bin Fan; Haruo Takahashi; Zhanshan Wang
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A simple system for measuring small phase retardation of an optical thin film
Author(s): T. N. Hansen; H. Fabricius
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Optimizing the phase retardation caused by optical coatings
Author(s): H. Fabricius; Tue N. Hansen
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Metal layer beamsplitters with one dielectric achromatisation layer
Author(s): M. Schürmann; W. Stöckl; N. Kaiser
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ZnS films for infrared optical coatings: improvement of adhesion to Ge substrates
Author(s): M. Sánchez-Agudo; I. Génova; H. J. B. Orr; G. Harris; G. Pérez
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Next generation end hall ion source in the optical thin film production process
Author(s): Hansjörg Niederwald; Leonard Mahoney
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Fabrication of far infrared rib waveguides based on Te-Ge-Ga films deposited by co-thermal evaporation
Author(s): Stéphanie Albert; Eleonore Barthelemy; Caroline Vigreux; Annie Pradel; Marc Barillot
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Synthesis and study of structure and nonlinear optical properties of silicon carbide nanocrystal films
Author(s): A. Borshch; M. Brodyn; V. Volkov; V. Lyakhovetski; V. Rudenko; A. Semenov; V. Pusikov
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AZO films prepared by r.f. magnetron sputtering: structural, electrical, and optical properties
Author(s): Maria Luisa Grilli; Anna Krasilnikova Sytchkova; Sylvia Boycheva; Angela Piegari
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Laser induced fluorescence and absorption measurements for DUV optical thin film characterization
Author(s): Ch. Mühlig; W. Triebel; S. Kufert; S. Bublitz
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Nonlinear refraction of gold island films
Author(s): A. Borshch; M. Brodyn; R. Fedorovych; V. Liakhovetskyi; V. Volkov
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Metrology in the soft x-ray range: from EUV to the water window
Author(s): Christian Laubis; Frank Scholze; Gerhard Ulm
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Comparison of measured and calculated performance of a 7-channel astronomical instrument
Author(s): St. Günster; D. Ristau; Jochen Greiner; Christian Tafelmaier
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Modification of optical properties of metal island films by electric field-assisted dissolution of clusters
Author(s): J. Sancho-Parramon; V. Janicki; H. Zorc; M. Lon&#269;ari&#263;
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Development of a hybrid monitoring strategy to the deposition of chirped mirrors by plasma-ion assisted electron evaporation
Author(s): Olaf Stenzel; Steffen Wilbrandt; Norbert Kaiser; Dieter Fasold
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An in-situ investigation of the surface oxidation of ultra-thin films of Ni and Hf
Author(s): Shigeng Song; Frank Placido
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