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Two- and Three-Dimensional Methods for Inspection and Metrology VI
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Volume Details

Volume Number: 7066
Date Published: 28 August 2008

Table of Contents
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Front Matter: Volume 7066
Author(s): Proceedings of SPIE
Standardization of noncontact 3D measurement
Author(s): Toshiyuki Takatsuji; Sonko Osawa; Osamu Sato
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Geometric errors in 3D optical metrology systems
Author(s): Kevin Harding; Chris Nafis
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Modelling and compensating measurement errors caused by scattering in time-of-flight cameras
Author(s): Tom Kavli; Trine Kirkhus; Jens T. Thielemann; Borys Jagielski
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Measurement of optical free-form surfaces with fringe projection
Author(s): Martin Breitbarth; Christian Braeuer-Burchardt; Peter Kuehmstedt; Matthias Heinze; Gunther Notni
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Development of real-time shape measurement system using whole-space tabulation method
Author(s): Motoharu Fujigaki; Akihiro Takagishi; Toru Matui; Yoshiharu Morimoto
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Measurement and stitching of regular cloud of points
Author(s): A. V. Fantin; T. L. Pinto; C. A. de Carvalho; A. Albertazzi
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3D surface defect analysis and evaluation
Author(s): B. Yang; M. Jia; G. J. Song; L. Tao; K. G. Harding
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Robust depth-from-defocus for autofocusing in the presence of image shifts
Author(s): Younsik Kang; Xue Tu; Satyaki Dutta; Murali Subbarao
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High dynamic range scanning technique
Author(s): Song Zhang; Shing-Tung Yau
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Phase-shifting shadow moiré using the Carré algorithm
Author(s): Peisen S. Huang; Hong Guo
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Simultaneous measurement of internal and external profiles using a ring beam device
Author(s): Toshitaka Wakayama; Toru Yoshizawa
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3-D shape measurement by use of a modified Fourier transform method
Author(s): Hong Guo; Peisen S. Huang
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Challenges and opportunities for 3D optical metrology: what is needed today from an industry perspective
Author(s): Kevin Harding
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Camera-based 10KHz distance gage
Author(s): Gil Abramovich; Kevin Harding
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Calibration of a soft x-ray projection system
Author(s): Robert Schmitt; Bjoern Damm; Raimund Volk
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Merging of range images for inspection or safety applications
Author(s): James Mure-Dubois; Heinz Hügli
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Optimal measurement method for diffraction-based overlay metrology
Author(s): Wei-Te Hsu; Yi-Sha Ku
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3D profile measurement of large-scale curvature plates using structured light source
Author(s): EunChang Heo; ByoungChang Kim; Hyunho Lee; JongMan Han
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Evaluation of large conic concave surfaces using a coordinate measurement machine and genetic algorithms
Author(s): A. Santiago-Alvarado; S. Vázquez-Montiel; J. González-García; A. López-López
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