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Proceedings of SPIE Volume 7064

Interferometry XIV: Applications
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Volume Details

Volume Number: 7064
Date Published: 10 August 2008
Softcover: 27 papers (256) pages
ISBN: 9780819472847

Table of Contents
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Front Matter: Volume 7064
Author(s): Proceedings of SPIE
Twymann Green interferometry in study of AlN material as an actuation layer in MEMS
Author(s): C. Gorecki; K. Krupa; A. Andrei; M. Jozwik; L. Nieradko; P. Delobelle; L. Hirsinger
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Phase-shift Fizeau interferometer in presence of vibration
Author(s): Radu Doloca; Hagen Broistedt; Rainer Tutsch
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Interferometric characterization of pyroelectrically activated micro-arrays of liquid lenses in lithium niobate crystals
Author(s): S. Grilli; L. Miccio; V. Vespini; P. Ferraro
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Vibration insensitive 3D-profilometry: a new type of white light interferometric microscopy
Author(s): J. Cohen-Sabban; D. Reolon
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Application of interferometry for evaluation of the effect of contact lens material on tear film quality
Author(s): Dorota H. Szczesna; Henryk T. Kasprzak; Ulf Stenevi
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Recurrence quantification analysis applied to sequential speckle images of machined surface for detection of chatter in turning
Author(s): Jacob Elias; V. G. Rajesh; V. N. Narayan Namboothiri
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Permutation entropy based speckle analysis in metal cutting
Author(s): Usha Nair; Bindu M. Krishna; V. N. N. Namboothiri; V. P. N. Nampoori
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Integrated quantum efficiency, reflectance, topography and stress metrology for solar cell manufacturing
Author(s): Wojtek J. Walecki; Fanny Szondy
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Applications of a white light interferometer for wear measurement of cylinders
Author(s): A. Albertazzi G.; M. R. Viotti; R. M. Miggiorin; A. Dal Pont
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Measuring the phase transfer function of a phase-shifting interferometer
Author(s): Jiyoung Chu; Quandou Wang; John P. Lehan; Guangjun Gao; Ulf Griesmann
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The manufacturing and testing of an unrotational-symmetric SiC mirror
Author(s): Feng Yan; Di Fan; Bin-zhi Zhang; Xue-jun Zhang
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Fabrication and testing of a high-precision concave spherical mirror
Author(s): Jan Burke; Katie Green; Wayne Stuart; Edita Puhanic; Achim Leistner; Bob Oreb
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Accurately measuring a surface by using a computer-generated hologram
Author(s): Hua Liu; Zhenwu Lu; Honxin Zhang
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Phase error correction in wavefront curvature sensing via phase retrieval
Author(s): Percival F. Almoro; Steen G. Hanson
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SIM Planet Quest Lite Interferometer Guide 2 Telescope pointing control system
Author(s): Bryan H. Kang; Dhemetrios Boussalis; Nanaz Fathpour
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Tomographic studies of 3D refractive index and birefringence distribution in M-O elements replicated by hot embossing technology
Author(s): Malgorzata Kujawinska; Rafal Krajewski; Nitish Kumar; Juergen Mohr; Hugo Thienpont
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Transparent film profiling and analysis by interference microscopy
Author(s): Peter J. de Groot; Xavier Colonna de Lega; Martin F. Fay
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Automatic three-dimensional localization of micro-particles using digital holographic microscopy
Author(s): Maciej Antkowiak; Natacha Callens; Catherine Yourassowsky; Frank Dubois
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Uncertainty consideration of the mirror-interferometer system in nanopositioning and nanomeasuring machines
Author(s): R. Füßl; R. Grünwald; Ph. Kreutzer
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Scene-based wavefront correction with spatial light modulators
Author(s): Tobias Haist; Jan Hafner; Michael Warber; Wolfgang Osten
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Multi-wavelength interferometer for high accuracy measurement of long gauge blocks
Author(s): Michal Wengierow; Leszek Salbut; Anna Pakula; Dariusz Lukaszewski
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Interferometric method for in-situ monitoring of fiber insertion in 2D fiber connectors fabricated through Deep Proton Writing
Author(s): Anna Pakula; Dariusz Lukaszewski; Slawomir Tomczewski; Leszek Salbut; Jürgen Van Erps; Virginia Gomez; Hugo Thienpont
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Toward automated forensic fracture matching of snap-off blade knives
Author(s): Davy Hollevoet; Patrick De Smet; Johan De Bock; Wilfried Philips
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A sensing system for monitoring the thickness of thin films by spectrum analysis of white-light interference
Author(s): Yongkai Zhu; Lu Zhang; Haitao Wang; Hong Zhao
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Far-infrared Fizeau interferometer for large aspheric mirror
Author(s): Yongqian Wu; Yudong Zhang; Fan Wu; Qiang Chen; Lianghong Li
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A simple method for measuring the small displacements
Author(s): Kun-Huang Chen; Jing-Heng Chen; Kun-Tsan Chen; Her-Lin Chiueh; Jiun-You Lin; Nung-Yu Wu
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Interferometric analysis of the ablation profile in refractive surgery
Author(s): M. I. Rodríguez-Rodríguez; E. López-Olazagasti; M. A. Rosales; G. Ramírez-Zavaleta; R. Cantú; E. Tepichín
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Interference: dark rays description
Author(s): R. Betancur; R. Castañeda; J. Restrepo
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