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PROCEEDINGS VOLUME 7063

Interferometry XIV: Techniques and Analysis
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Volume Details

Volume Number: 7063
Date Published: 10 August 2008
Softcover: 49 papers (488) pages
ISBN: 9780819472830

Table of Contents
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Front Matter: Volume 7063
Author(s): Proceedings of SPIE
It's a (meta)material world! The final frontier?
Author(s): A. D. Boardman; R. C. Mitchell-Thomas; Y. G. Rapoport; N. J. King
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Coarse frequency comb interferometry
Author(s): J. Schwider
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Generalized quantitative approach to two-beam fringe visibility (coherence) with different polarizations and frequencies
Author(s): Chandrasekhar Roychoudhuri; A. Michael Barootkoob
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Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements
Author(s): Peter Blake; Perry Greenfield; Warren Hack; J. Todd Miller; Ivo Busko; Babak Saif; Bente Eegholm; Ritva Keski-Kuha; Marcel Bluth
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Instantaneous phase-shift Fizeau interferometer utilizing a synchronous frequency shift mechanism
Author(s): Brad Kimbrough; Eric Frey; James Millerd
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Development of a multi-component shearography instrument for surface strain measurement on dynamic objects
Author(s): D. Francis; S. W. James; R. P. Tatam
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Optical wavefront sensor based on sub-wavelength metallic structures
Author(s): Riad Haïdar; Bruno Toulon; Grégory Vincent; Stéphane Collin; Sabrina Velghe; Jérôme Primot; Jean-Luc Pelouard
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A dynamic in-plane deformation measurement using virtual speckle patterns
Author(s): Yasuhiko Arai; Ryouich Shimamura; Shunsuke Yokozeki
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The spatial degree of polarization and the first-order statistical properties of polarization speckle
Author(s): Wei Wang; Akihiro Matsuda; Steen G. Hanson; Mitsuo Takeda
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Lockin-speckle-interferometry for non-destructive testing
Author(s): Philipp Menner; Henry Gerhard; Gerd Busse
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Denoising of digital speckle pattern interferometry fringes by means of Bidimensional Empirical Mode Decomposition
Author(s): María Belén Bernini; Alejandro Federico; Guillermo H. Kaufmann
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Filtering-based phase unwrapping
Author(s): Kemao Qian; Wenjing Gao; Haixia Wang
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Investigations and improvements of digital holographic tomography applied for 3D studies of transmissive photonics microelements
Author(s): Malgorzata Kujawinska; Agata Jozwicka; Tomasz Kozacki
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Strain distribution measurement by digital holographic interferometry using three spherical waves
Author(s): Motoharu Fujigaki; Kohhei Shiotani; Ryosuke Kido; Yoshiharu Morimoto
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Modeling and optical characterization of vibrating micro- and nanostructures
Author(s): Astrid Aksnes; Erlend Leirset; Hanne Martinussen; Helge E. Engan
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Real-time vibration amplitude and phase imaging with heterodyne interferometry and correlation image sensor
Author(s): Seichi Sato; Toru Kurihara; Shigeru Ando
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Laser confocal feedback profilometry
Author(s): Xinjun Wan; Shulian Zhang; Zhou Ren
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New algorithms and error analysis for sinusoidal phase shifting interferometry
Author(s): Peter J. de Groot; Leslie L. Deck
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Iterative algorithm for phase shifting interferometry with finite bandwidth illumination
Author(s): Florin Munteanu; Joanna Schmit
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Simultaneous geometry and color texture acquisition using a single-chip color camera
Author(s): Song Zhang; Shing-Tung Yau
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Shape and colour measurement of colourful objects by fringe projection
Author(s): Zonghua Zhang; Catherine E. Towers; David P. Towers
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Moiré topography using a liquid-crystal-grating based frequency modulation technique
Author(s): Fumio Kobayashi; Yukitoshi Otani; Toru Yoshizawa
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Fizeau interferometer for quasi parallel optical plate testing
Author(s): Adam Styk; Krzysztof Patorski
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Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures
Author(s): Woo-Deok Joo; Joonho You; Young-Sik Ghim; Seung-Woo Kim
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Uncertainty analysis on the absolute thickness of a cavity using a commercial wavelength scanning interferometer
Author(s): Amit Suratkar; Young-Sik Ghim; Angela Davies
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Measurement of absolute optical thickness distribution of a mask-glass by wavelength tuning interferometry
Author(s): Kenichi Hibino; Kim Yangjin; Youichi Bitou; Sonko Ohsawa; Naohiko Sugita; Mamoru Mitsuishi
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Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology
Author(s): Alexandre Cabral; José M. Rebordão; Manuel Abreu
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Micro Fabry-Perot sensor for surface measurement
Author(s): Andrei Brunfeld; Gregory Toker; Morey T. Roscrow; Bryan Clark
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Optimum wavelength selection for the method of excess fractions
Author(s): Konstantinos Falaggis; David P. Towers; Catherine E. Towers
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Multiple wavelength interferometry for surface profiling
Author(s): U. Paul Kumar; N. Krishna Mohan; M. P. Kothiyal
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A hybrid technique for ultra-high dynamic range interferometry
Author(s): Konstantinos Falaggis; David P. Towers; Catherine E. Towers
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Surface profile detection of nanostructures using a Mueller matrix polarimeter
Author(s): Yukitoshi Otani; Tomohito Kuwagaito; Yasuhiro Mizutani
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3D profilometer employing white-light interferometry for microstructures with large-bevel inclines in brightness-enhanced films
Author(s): Wei Cheng Wang; Yan Jen Su; Shih Hsuan Kuo
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Surface metrology of silicon wafers using a femtosecond pulse laser
Author(s): Taekmin Kwon; Ki-Nam Joo; Seung-Woo Kim
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Noncollinear autocorrelation with radially symmetric nondiffracting beams
Author(s): Silke Huferath-von Luepke; Volker Kebbel; Martin Bock; Susanta Kumar Das; Ruediger Grunwald
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Testing of a diamond-turned off-axis parabolic mirror
Author(s): Jan Burke; Kai Wang; Adam Bramble
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Distortion mapping correction in aspheric null testing
Author(s): M. Novak; C. Zhao; J. H. Burge
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Interferometric null test of a parabolic reflector generating a Hertzian dipole field
Author(s): G. Leuchs; K. Mantel; A. Berger; H. Konermann; M. Sondermann; U. Peschel; N. Lindlein; J. Schwider
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Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer
Author(s): Luis Rodríguez-Castillo; Fermín S. Granados-Agustín; Alejandro Cornejo-Rodríguez
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Stitching of off-axis sub-aperture null measurements of an aspheric surface
Author(s): Chunyu Zhao; James H. Burge
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Measurements of aspheric surfaces
Author(s): Piotr Szwaykowski; Raymond Castonguay
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Wide dynamic beam size range lateral-shear interferometer
Author(s): K. U. Hii; K. H. Kwek
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Interferometer design for optical stochastic cooling demonstration at Bates
Author(s): James Hays-Wehle; Wilbur Franklin; Franz X. Kärtner; Jan van der Laan; Richard Milner; Aleem Siddiqui; Christoph Tschalär; Fuhua Wang
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Optical heterodyne laser encoder for in-plane nanopositioning
Author(s): Chyan-Chyi Wu; Cheng-Chih Hsu; Ju-Yi Lee; Cheng-Yang Liu
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Temporal phase detection of interferograms without frequency carrier
Author(s): J. C. Estrada; M. Servin; D. Arroyo
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Spatial coherence wavelets and the phase-space representation of holography
Author(s): R. Betancur; R. Castañeda; J. Restrepo
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Method for distant diagnostics of layered media inner structure
Author(s): A. L. Kalyanov; V. V. Lychagov; D. V. Lyakin; V. P. Ryabukho
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Dynamic measurement of strain in test specimen by fringe projection
Author(s): Andrea León-Huerta; Amalia Martinez; Juan Antonio Rayas; Raúl Cordero
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An ESPI technique based on panoramic interferometry with paraboloid mirrors
Author(s): Araceli Soto; Juan B. Hurtado-Ramos; Liliana Reséndiz; J. Joel González Barbosa
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