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Proceedings of SPIE Volume 6762

Two- and Three-Dimensional Methods for Inspection and Metrology V
Editor(s): Peisen S. Huang
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Volume Details

Volume Number: 6762
Date Published: 25 September 2007
Softcover: 16 papers (158) pages
ISBN: 9780819469229

Table of Contents
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Front Matter: Volume 6762
Author(s): Proceedings of SPIE
Smooth 3D edge detection in scarfed composite surfaces
Author(s): Rajesh Ramamurthy; Megha Navalgund; Qingying Hu; Kevin G. Harding
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Depth and focused image recovery from defocused images for cameras operating in macro mode
Author(s): Xue Tu; Youn-sik Kang; Murali Subbarao
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Absolute phase retrieval for 3D shape measurement by Fourier transform method
Author(s): Hong Guo; Peisen S. Huang
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Single image depth edges classification using a red, green, and blue light
Author(s): Matthias Voigt; Felix Ospald; Visvanathan Ramesh
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Multiple views merging from different cameras in fringe-projection based phase-shifting method
Author(s): Qingying Hu; Kevin Harding; Don Hamilton; Jay Flint
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The concept of virtual landmarks in 3D multi-view fringe projection
Author(s): Gunther Notni; Peter Kühmstedt; Matthias Heinze; Christoph Munkelt
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3D data merging using Holoimage
Author(s): Song Zhang; Shing-Tung Yau
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Improved feature descriptors for 3D surface matching
Author(s): Luke J. Skelly; Stan Sclaroff
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Applications of a MEMS scanner to profile measurement
Author(s): Toru Yoshizawa; Toshitaka Wakayama; Hiroshi Takano
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Development of a compact inner profile measuring instrument
Author(s): T. Wakayama; H. Takano; T. Yoshizawa
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Intraoral 3D scanner
Author(s): Peter Kühmstedt; Christian Bräuer-Burchardt; Christoph Munkelt; Matthias Heinze; Martin Palme; Ingo Schmidt; Josef Hintersehr; Gunther Notni
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Hybrid interferometric structured light method for surface mapping
Author(s): Kevin Harding; Gil Abramovich
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Network-based production quality control
Author(s): Yongjin Kwon; Tzu-Liang B. Tseng; Richard Chiou
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Optimized scattering compensation for time-of-flight camera
Author(s): James Mure-Dubois; Heinz Hügli
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A ray tracing approach to inverse pattern profilometry
Author(s): Veronika Putz; Bernhard G. Zagar
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Mobile shearography in applications
Author(s): Michael Kalms
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