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Proceedings of SPIE Volume 6704

Advances in Metrology for X-Ray and EUV Optics II
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Volume Details

Volume Number: 6704
Date Published: 13 September 2007
Softcover: 17 papers (168) pages
ISBN: 9780819468529

Table of Contents
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Front Matter: Volume 6704
Author(s): Proceedings of SPIE
Suppressing vibration errors in phase-shifting interferometry
Author(s): Leslie L. Deck
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High order harmonics wavefront measurement and optimization
Author(s): J. Gautier; A. S. Morlens; P. Zeitoun; E. Papalarazou; G. Rey; C. Valentin; J. P. Goddet; S. Sebban; Guillaume Dovillaire; Xavier Levecq; Samuel Bucourt
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Hard x-ray wavefront measurement and control for hard x-ray nanofocusing
Author(s): Soichiro Handa; Hidekazu Mimura; Satoshi Matsuyama; Hirokatsu Yumoto; Takashi Kimura; Yasuhisa Sano; Kenji Tamasaku; Yoshinori Nishino; Makina Yabashi; Tetsuya Ishikawa; Kazuto Yamauchi
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Microstitching interferometer and relative angle determinable stitching interferometer for half-meter-long x-ray mirror
Author(s): Haruhiko Ohashi; Takashi Tsumura; Hiromi Okada; Hidekazu Mimura; Tatsuhiko Masunaga; Yasunori Senba; Shunji Goto; Kazuto Yamauchi; Tetsuya Ishikawa
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A microstitching interferometer for evaluating the surface profile of precisely figured x-ray K-B mirrors
Author(s): Lahsen Assoufid; Jun Qian; Cameron M. Kewish; Chian Liu; Ray Conley; Albert T. Macrander; Delvin Lindley; Christopher Saxer
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Optimized use and calibration of autocollimators in deflectometry
Author(s): Ralf D. Geckeler; Andreas Just
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Binary pseudo-random grating as a standard test surface for measurement of modulation transfer function of interferometric microscopes
Author(s): Valeriy V. Yashchuk; Wayne R. McKinney; Peter Z. Takacs
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Precision tiltmeter as a reference for slope measuring instruments
Author(s): Jonathan L. Kirschman; Edward E. Domning; Gregory Y. Morrison; Brian V. Smith; Valeriy V. Yashchuk
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Proposal for a universal test mirror for characterization of slope measuring instruments
Author(s): Valeriy V. Yashchuk; Wayne R. McKinney; Tony Warwick; Tino Noll; Frank Siewert; Thomas Zeschke; Ralf D. Geckeler
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Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors
Author(s): A. Rommeveaux; L. Assoufid; H. Ohashi; H. Mimura; K. Yamauchi; J. Qian; T. Ishikawa; C. Morawe; A. T. Macrander; A. Khounsary; S. Goto
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Comparison of slope and height profiles for flat synchrotron x-ray mirrors measured with a long trace profiler and a PMI Fizeau interferometer
Author(s): Jun Qian; Lahsen Assoufid; Albert Macrander
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Surface gradient integrated profiler for x-ray and EUV optics: self calibration method of measured position for an off-axis parabolic mirror (f=150mm) measurement
Author(s): Y. Higashi; K. Endo; T. Kume; K. Enami; J. Uchikoshi; K. Ueno; Y. Mori
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Progress in the x-ray optics and metrology lab at Diamond Light Source
Author(s): Simon G. Alcock; K. J. S. Sawhney
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Recent developments on the Daresbury Laboratory long trace profiler
Author(s): A. Gleeson
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New procedures for the adjustment of elliptically bent mirrors with the long trace profiler
Author(s): Wayne R. McKinney; Steven C. Irick; Jonathan L. Kirschman; Alastair A. MacDowell; Tony Warwick; Valeriy V. Yashchuk
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Systematic error reduction: non-tilted reference beam method for long trace profiler
Author(s): Shinan Qian; Kun Qian; Yiling Hong; Liusi Sheng; Tonglin Ho; Peter Takacs
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Flat-field calibration of CCD detector for long trace profiler
Author(s): Jonathan L. Kirschman; Edward E. Domning; Keith D Franck; Steven C. Irick; Alastair A. MacDowell; Wayne R. McKinney; Gregory Y. Morrison; Brian V. Smith; Tony Warwick; Valeriy V. Yashchuk
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