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PROCEEDINGS VOLUME 6616

Optical Measurement Systems for Industrial Inspection V
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Volume Details

Volume Number: 6616
Date Published: 18 June 2007
Softcover: 144 papers (1338) pages
ISBN: 9780819467584

Table of Contents
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Front Matter: Volume 6616
Author(s): Proceedings of SPIE
Paradigm shifts in optical coherence tomography
Author(s): Rainer A. Leitgeb
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White light spectral interferometric technique used to measure thickness of thin films
Author(s): P. Hlubina; D. Ciprian; R. Clebus; J. Luňáček; M. Lesňák
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Dual-wavelength vertical scanning low-coherence interference microscopy
Author(s): Jan Niehues; Peter Lehmann
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White light interferometry in combination with a nanopositioning and nanomeasuring machine (NPMM)
Author(s): Daniel Kapusi; Torsten Machleidt; Karl-Heinz Franke; Rainer Jahn
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Vertical scanning interferometry with a mixed-coherence light source
Author(s): Gabor Molnar; Rainer Tutsch
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Photon-noise limited distance resolution of optical metrology methods
Author(s): Peter Seitz
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A method for edge detection of textile preforms using a light-section sensor for the automated manufacturing of fibre-reinforced plastics
Author(s): Robert Schmitt; Alexandre Orth; Christian Niggemann
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Real-time multicamera system for measurement of 3D coordinates by pattern projection
Author(s): Ventseslav Sainov; Elena Stoykova; Jana Harizanova
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3D shape measurement with phase correlation based fringe projection
Author(s): Peter Kühmstedt; Christoph Munckelt; Matthias Heinze; Christian Bräuer-Burchardt; Gunther Notni
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Time-of-flight based pixel architecture with integrated double-cathode photodetector
Author(s): Klaus Oberhauser; Gerald Zach; Alexander Nemecek; Horst Zimmermann
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The Confocal Raman AFM: a powerful tool for the characterization of surface coatings
Author(s): U. Schmidt; W. Ibach; J. Mueller; O. Hollricher
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Super-heterodyne laser interferometer using femtosecond frequency comb for linear encoder calibration system
Author(s): Mariko Kajima; Hirokazu Matsumoto
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Differential signal scatterometry overlay metrology: an accuracy investigation
Author(s): Daniel Kandel; Mike Adel; Berta Dinu; Boris Golovanevsky; Pavel Izikson; Vladimir Levinski; Irina Vakshtein; Philippe Leray; Mauro Vasconi; Bartlomiej Salski
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Improved microinterferometric tomography method for reconstruction of refractive index
Author(s): Paweł Kniażewski; Małgorzata Kujawińska
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High-resolution tomographic interferometry of optical phase elements
Author(s): W. Gorski; S. Rafler; W. Osten
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Properties of the DMD digital micromirror device for new emerging applications in optical engineering
Author(s): Cheraina Dunn; Roland Höfling
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Realisation of quantitative Makyoh topography using a digital micromirror device
Author(s): Ferenc Riesz; I. E. Lukács; J. P. Makai
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A beam halo monitor based on adaptive optics
Author(s): C. P. Welsch; E. Bravin; T. Lefèvre
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Realisation of a holographic microlaser scalpel using a digital micromirror device
Author(s): Susanne Zwick; Michael Warber; Tobias Haist; Wolfgang Osten
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Digital micromirror device application for inline characterization of solar cells by tomographic light beam-induced current imaging
Author(s): R. Gupta; O. Breitenstein
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External-cavity diode laser utilizing a micromirror device for spectral tuning
Author(s): Michael Breede; Christoph Kasseck; Carsten Brenner; Nils C. Gerhardt; Roland Höfling; Martin Hofmann
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In situ monitoring of periodic domain formation in ferroelectric crystals
Author(s): Simonetta Grilli; Melania Paturzo; Lisa Miccio; Pietro Ferraro
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Terahertz multiwavelength phase imaging without 2π ambiguity
Author(s): Yan Zhang; Liangliang Zhang; Cunlin Zhang
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Fiber-coupled THz spectroscopy for monitoring polymeric compounding processes
Author(s): N. Vieweg; N. Krumbholz; T. Hasek; R. Wilk; V. Bartels; C. Keseberg; V. Pethukhov; M. Mikulics; L. Wetenkamp; M. Koch
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Polarization correlometry of polarization singularities of biological tissues object fields
Author(s): O. V. Angelsky; A. G. Ushenko; A. O. Angelska; Yu. A. Ushenko
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Fluid mechanics measurement based on the anisotropic core structure of pseudophase singularities in analytic signal representation of speckle pattern
Author(s): Wei Wang; Mark R. Dennis; Reika Ishijima; Tomoaki Yokozeki; Akihiro Matsuda; Steen G. Hanson; Mitsuo Takeda
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W-band speckle contrast images for inspection of concealed objects
Author(s): Irina Jaeger; Lixiao Zhang; Johan Stiens; Gaetan Koers; Hichem Sahli; Roger Vounckx
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About the possibility of using optical bistability effect in metrology systems
Author(s): Claudia Yu. Zenkova
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Reaching lambda/100 resolution in static fringes interferometry using linear prediction
Author(s): Manuel Mestre; Didier Pasquelin; Peter Flug
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Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera
Author(s): Y. Arai; R. Shimamura; S. Yokozeki
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Fourier-based design of asynchronous phase detection algorithms
Author(s): José A. Gómez-Pedrero; D. Crespo; Juan A. Quiroga
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Phase measurement errors due to holographic interferograms compression
Author(s): Emmanouil Darakis; Vijay Raj Singh; Anand K. Asundi; John J. Soraghan
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Phase retrieval based on wavefront modulation
Author(s): Fucai Zhang; Giancarlo Pedrini; Wolfgang Osten
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Real-time dual-wavelength digital holographic microscopy with a single hologram
Author(s): Jonas Kühn; Tristan Colomb; Frédéric Montfort; Florian Charrière; Christian Depeursinge
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Fast demodulation technique for a quasi-distributed temperature sensor
Author(s): C. Crunelle; M. Wuilpart; C. Caucheteur; P. Mégret
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Stability analysis for the TMS method: Influence of high spatial frequencies
Author(s): Axel Wiegmann; Clemens Elster; Ralf D. Geckeler; Michael Schulz
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Characterization and compensation of decorrelations in interferometric set-ups using active optics
Author(s): Emil Hällstig; Angelica Svanbro
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S-transform analysis of projected fringe patterns
Author(s): Özlem Kocahan; Serhat Özder; Emre Coşkun
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An efficient mesh oriented algorithm for 3D measurement in multiple camera fringe projection
Author(s): A. V. Fantin; A. Albertazzi; T. L. Pinto
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A complete digital optics applied to digital holographic microscopy: application to chromatic aberration compensation
Author(s): Tristan Colomb; Florian Charrière; Jonas Kühn; Frédéric Montfort; Christian Depeursinge
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3D defect detection using optical wide-field microscopy
Author(s): Volker Tympel; Marko Schaaf; Bernd Srocka
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A novel algorithm to stitch adjacent cloud of points of long cylindrical surfaces
Author(s): M. R. Viotti; A. Albertazzi; A. Dal Pont; A. V. Fantin
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Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometer
Author(s): Adam Styk; Krzysztof Patorski
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Influence of non-linearities in wavelength-swept absolute distance interferometry
Author(s): Luc Perret; Pierre Pfeiffer; Ayoub Chakari
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Proposal on MEMS-based interferometric profiler for in-situ etching depth control
Author(s): Andrei G. Smirnov; Juergen Schreiber; Uwe Richter; Ingo Wullinger
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Improving the measurement of thick and thin films with optical profiling techniques
Author(s): Cristina Cadevall; Carles Oriach-Font; Roger Artigas; Agustí Pintó; Ferran Laguarta
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Interferometry of thick and thin films
Author(s): Michael Conroy
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Precision mechatronics based on high-precision measuring and positioning systems and machines
Author(s): Gerd Jäger; Eberhard Manske; Tino Hausotte; Rostyslav Mastylo; Natalja Dorozhovets; Norbert Hofmann
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Experimental validation of 20nm sensitivity of singular beam microscopy
Author(s): Boris Spektor; Alexander Normatov; Joseph Shamir
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Measuring 3D geometries of microstructures with the laser-scanning confocal vibrometer microscope
Author(s): Christian Rembe; Sebastian Bödecker; Bernd Armbruster; Martin Bauer
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Application of the metrological scanning probe microscope for high-precision, long-range, traceable measurements
Author(s): N. Dorozhovets; T. Hausotte; G. Jäger; E. Manske
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Grating projection Moire interferometry for high-speed 3D inspection of mesoscale objects
Author(s): Sang-Yoon Lee; Min-Gu Kang; Seung-Woo Kim
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Artefacts with rough surfaces for verification of optical microsensors
Author(s): Wiebke Ehrig; Ulrich Neuschaefer-Rube
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Superposition fringes for profiling applications
Author(s): J. Schwider
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Using phase objects to qualify the transfer function of Fizeau interferometers for high spatial frequencies
Author(s): Stéphane Bouillet; Jérôme Daurios
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New technique for flexible and rapid measurement of precision aspheres
Author(s): Eugenio Garbusi; Christof Pruss; Jan Liesener; Wolfgang Osten
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Surface metrology with a stitching Shack-Hartmann profilometric head
Author(s): J. Floriot; X. Levecq; S. Bucourt; M. Thomasset; F. Polack; M. Idir; P. Mercère; S. Brochet; T. Moreno
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Large-scale full-field metrology using projected fringes: some challenges and solutions
Author(s): Jonathan M. Huntley; Tokunbo Ogundana; Richard L. Burguete; C. Russell Coggrave
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Optical scanner for the measurement of surface profile of large size panels: analysis of metrologic performance and measurement uncertainty
Author(s): Paolo Castellini
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3D optical measurement of curved edges
Author(s): S. Naudet-Collette; F. Gaspard; H. Martinsson; F. Dekeyser
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Optical correlation measurement of surface roughness
Author(s): Oleg V. Angelsky; Alexander P. Maksimyak; Peter P. Maksimyak
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Profile detection by projection of coloured patterns
Author(s): Daniela Fontani; Franco Francini; Paola Sansoni; David Jafrancesco; Luca Mercatelli
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Nonlinearity correction in digital fringe projection profilometry by using histogram matching technique
Author(s): Hongwei Guo; Zhan Zhao
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Digital holocameras for laboratory and outdoor measurements of engineering objects
Author(s): Aneta Michalkiewicz; Malgorzata Kujawinska; Karol Stasiewicz; Leszek R. Jaroszewicz
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Infrared Electronic speckle pattern interferometry at 10 um
Author(s): J.-F. Vandenrijt; M. Georges
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Stress behavior of ball grid array (BGA) studied by dynamic electronic speckle pattern interferometry (DESPI)
Author(s): Violeta Dimitrova Madjarova; Satoru Toyooka; Hiroyuki Chida; Hirofumi Kadono
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Measurement of surface strain using multi-component pulsed laser shearography with coherent fibre-optic bundles
Author(s): D. Francis; S. W. James; R. P. Tatam
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Application of reflection hologram interferometry with a high resolution to residual stresses characterisation by local material removing
Author(s): Vladimir S. Pisarev; Vitaly V. Balalov
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Advances in optoelectronic methodology for micro- and nano-scale measurements
Author(s): Ryszard J. Pryputniewicz
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In-plane displacement measurement with sub-pixel resolution: application to vibration characterization of a shear-force scanning probe
Author(s): Patrick Sandoz; Jean-Michel Friedt; Émile Carry
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Measurement of the thermal deformation of a highly stable antenna with pulse ESPI
Author(s): E-H. Nösekabel; T. Ernst; W. Haefker
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Projection Moire measurement of the deflection of composite plates subject to bird strike impact
Author(s): A. Shulev; W. Van Paepegem; J. Harizanova; A. Moentjens; J. Degrieck; V. Sainov
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Double exposure time-averaged in-line digital holography
Author(s): Vijay Raj Singh; Anand Asundi; Jianmin Miao
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Laser ultrasound: a flexible tool for the inspection of complex CFK components and welded seams
Author(s): Christoph von Kopylow; Oliver Focke; Michael Kalms
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Multi-technique platform for dynamic and static MEMS characterisation
Author(s): Kay Gastinger; Pål Løvhaugen; Øystein Skotheim; Ola Hunderi
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Interference microscopes for tribology and corrosion quantification
Author(s): Erik Novak; Tom Stout
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DLP based fringe projection as an optical 3D inline measuring method for inspection in manufacturing
Author(s): Gottfried Frankowski; Michael Stenzel
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Shape and vibration measurement of fast rotating objects employing novel laser Doppler techniques
Author(s): Thorsten Pfister; Philipp Günther; Lars Büttner; Jürgen Czarske
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Fibre grating refractometer sensors for composite process monitoring.
Author(s): Stephen J. Buggy; Edmond Chehura; Alexandros A. Skordos; Athanasios Dimopoulos; Stephen W. James; Ivana K Partridge; Ralph P. Tatam
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Quantification of defect size in shearing direction by shearography and wavelet transform
Author(s): Fabrice Michel; Vincent Moreau; Vanessa Rosso; Serge Habraken; Bernard Tilkens
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Simulation of the elastic wave propagation in anisotropic microstructures
Author(s): Juerg Bryner; Jacqueline Vollmann; Dieter M. Profunser; Jurg Dual
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Online monitoring of the laser brazing of titanium overlap joints
Author(s): R. Schmitt; K. Vielhaber; D. Donst; F. Klocke
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Fiber optic strain measurement for machine monitoring
Author(s): L. Hoffmann; M. S. Mueller; A. W. Koch
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Multiscale segmentation method for small inclusion detection in 3D industrial computed tomography
Author(s): G. Zauner; B. Harrer; D. Angermaier; M. Reiter; J. Kastner
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On-axis, non-contact measurement of glass thicknesses and airgaps in optical systems with submicron accuracy
Author(s): Rainer Wilhelm; Alain Courteville; Fabrice Garcia; François de Vecchi
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Dispersive white light interferometry for 3D inspection of thin film layers of flat panel displays
Author(s): Young-Sik Ghim; Joonho You; Seung-Woo Kim
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Polarization metrology of speckle-reconstructed biological layers roughness
Author(s): I. Z. Misevitch; Yuriy Ushenko; A. G. Ushenko
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Inspection of plastic weld joints with terahertz imaging
Author(s): S. Wietzke; N. Krumbholz; C. Jördens; B. Baudrit; M. Bastian; M. Koch
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White light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elements
Author(s): P. Hlubina; D. Ciprian; R. Chlebus
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Designing a new optical sensor using wide band speckle patterns
Author(s): Hatem El Ghandoor; Ashraf F. El Sherif; M. Darwish
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Implementation a new real-time structure for driving an IRFPA and image enhancement
Author(s): Ali Homaei; Ehsan Koohestani
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New features of Doppler-free saturated-absorption resonance in field of counterpropagating waves
Author(s): Denis V. Brazhnikov; Alexey V. Taichenachev; Anatoliy M. Tumaikin; Valeriy I. Yudin; Sergei A. Zibrov; Yaroslav O. Dudin; Peter A. Siushev; Alexander G. Radnaev; Vitaliy V. Vasil'ev; Vladimir L. Velichansky
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Coherent fringe projector for 3D surface profilometry
Author(s): Paulo Tavares; Nuno Viriato; Jorge Reis; Mário Vaz
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Multidirectional holographic interferometer with dodecagon geometry
Author(s): Martin Antoš
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Multi-resolution optical 3D sensor
Author(s): Peter Kühmstedt; Matthias Heinze; Ingo Schmidt; Martin Breitbarth; Gunther Notni
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Point-diffraction interferometer by electro-optic effect in lithium niobate crystals
Author(s): M. Paturzo; S. Grilli; P. Ferraro
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Effective dynamic range measurement for a CCD in full-field industrial x-ray imaging applications
Author(s): Matteo Bettuzzi; Rosa Brancaccio; Maria Pia Morigi; Franco Casali
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White light Fourier spectrometer: Monte Carlo noise analysis and test measurements
Author(s): Elena Stoykova; Branimir Ivanov
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Non-contact torsion transducer based on the measurement of Moire patterns using plastic optical fibres
Author(s): Mauro Lomer; Kevin Contreras
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Special lenslet array with long focal length range for Shack-Hartmann Wavefront Sensor
Author(s): L. P. Zhao; N. Bai; X. Li; Z. P. Fang; A. A. Hein; Z. W. Zhong
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Influences of linear birefringence on bulk glass current sensors with return-back optical paths
Author(s): Zhengping Wang; Xiaoyu Liu; Zongjun Huang
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Influences of reciprocal parameters upon a Faraday-mirror typed OCT
Author(s): Zongjun Huang; Zhengping Wang; Xiaoyu Liu; Chong Kang
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Orthogonal conjugate reflecting current sensor
Author(s): Zongjun Huang; Zhengping Wang; Hongyu Wang
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Two-dimensional method for surface determination by optical deflectometry
Author(s): A. Moreno; M. Espínola; A. Lizana; J. Campos
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Optical scan method for fine surface roughness measurement
Author(s): Zhengping Wang; Lihui Wang
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Conical beam-based laser profilometer for testing roller bearings
Author(s): Nikolai Khilo; Vladimir Belyi; Nikolai Kazak; Aleksander Mashchenko; Piotr Ropot
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Correlation method for shape measurement of optical surfaces
Author(s): Antonin Miks; Jiri Novak; Pavel Novak
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Measurement errors of mirrorlike, tilted objects in white-light interferometry
Author(s): Reinhard Berger; Thomas Sure; Wolfgang Osten
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Accurate measurement of intraocular lens parameters
Author(s): Maurizio Vannoni; Giuseppe Molesini; Rita Mencucci; Roberto Volpe
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Deformation analysis in biomaterials using digital speckle interferometry
Author(s): R. Salvador; R. González-Peña; R. Cibrián; M. Buend­ía; F. Mínguez; V. Micó; J. A. Carrión; J. J. Esteve-Taboada; T. Molina-Jiménez; S. Simón; E. Pérez
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Quantification of displacement and velocity noise in vibrometer measurements on transversely moving or rotating surfaces
Author(s): Alexander Dräbenstedt
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Development of a 3D dynamic measurement system using a high-speed camera with white light scanning interference microscopy associated with real-time FPGA image processing
Author(s): Gyasi Johnson; Paul Montgomery; Freddy Anstotz; Renaud Kiefer
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Interferometric characterization of capacitor micromachined ultrasonic transducers and validation by electrical measurements
Author(s): Hanne Martinussen; Astrid Aksnes; Helge E. Engan; Arne Rønnekleiv
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Fiber optic-based sensors design to test concrete structures
Author(s): V. Micó; M. L. Lozano; J. J. Esteve-Taboada; J. A. Carrión; T. Molina-Jiménez; S. Simón; E. Pérez; J. M. Lloris; M. Cruz-Yusta; M. J. López-Tendero; C. Silvestre; F. López; D. Barrera-Villar; R. García-Olcina; S. Sales
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Performance of optical speckle displacement technique near stress concentrators
Author(s): Leonid I. Muravsky; Olexander M. Sakharuk; Sergiy O. Kostyukevych; Olexander P. Maksymenko; Kateryna V. Kostyukevych
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Phase only SLM as a reference element in Twyman-Green laser interferometer for MEMS measurement
Author(s): Jacek Kacperski; Malgorzata Kujawinska
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Validation of an algorithm for wave propagations in graded materials with an analytical solution
Author(s): L. Aebi; K. Löffel; J. Vollmann; J. Dual
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Optical fiber sensors in health monitoring of composite high-pressure vessels for hydrogen
Author(s): Paweł Gąsior; Jerzy Kaleta; Anna Sankowska
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Feasibility study of in-process weld quality control by means of scanning laser profilometry
Author(s): Matija Jezeršek; Ivan Polajnar; Janez Diaci
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Performance of a fiber optic ring depolarizer in fiber sensing applications
Author(s): M. S. Mueller; L. Hoffmann; A. W. Koch
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AIT of optical payloads in Thales Alenia Space-F: an experience of more than 20 years
Author(s): Rachel Thibout; Hervé Benard; Stéphane Delmonte; Jean-Philippe Chessel
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Depth tracing the influence of oxygen on UV curing
Author(s): Stefan Pieke; Wolfgang Heering
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XtremeFringe: state-of-the-art software for automatic processing of fringe patterns
Author(s): J. Antonio Quiroga; Daniel Crespo; J. A. Gomez-Pedrero
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Optical and contact non-destructive measurement of the laser re-melting layers
Author(s): Hana Chmelíčková; Hana Lapšanská; Helena Hiklová; Martina Havelková; Rostislav Medlín; Petr Beneš
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Laser metrology of statistical and fractal structure of biological tissues polarization images
Author(s): Oleg Angelsky; Alexander Prydij; Alexander Ushenko; Yuriy Ushenko; Olena Olar
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Metrology of biological tissue coherent images by means of estimation of complex degree of mutual polarization
Author(s): I. Z. Misevitch; A. G. Ushenko; Yuriy A. Ushenko; Yu. Ya. Tomka
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Mass transfer studies in transparent liquid solutions by polarization imaging
Author(s): Vani K. Chhaniwal; B. S. Chakrabarty; Arun Anand
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Digital Shack-Hartmann Wavefront Sensor for toroidal surface measurement
Author(s): N. Bai; Li. P. Zhao; X. Li; Zhong P. Fang
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Optical metrology devices for high-power laser large optics
Author(s): J. Daurios; S. Bouillet; G. Gaborit; J. C. Poncetta
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Purity of iodine cells in relation to frequency shift of iodine stabilized Nd:YAG laser
Author(s): Jan Hrabina; František Petru; Petr Jedlička; Ondřej Číp; Josef Lazar
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Total spectral radiant flux measurements on Xe excimer lamps from 115 nm to 1000 nm
Author(s): Klaus E. Trampert; Mark Paravia; Rüdiger Daub; Wolfgang Heering
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Efficient LED spatial measurement to improve optical modeling
Author(s): P. Blanco; A. Cifuentes; J. Arasa; C. Pizarro; S. Royo
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Adopting our heterodyne interferometer with sub-nm sensitivity for industrial position metrology
Author(s): Thilo Schuldt; Martin Gohlke; Dennis Weise; Achim Peters; Ulrich Johann; Claus Braxmaier
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Thin film thickness measurement by double laser interferometry
Author(s): M. Domingo; C. Millán; M. A. Satorre; J. Cantó
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3D digitising using structured illumination: application to mould redesign
Author(s): L. Granero; J. Sánchez; V. Micó; J. J. Esteve; J. Hervás; S. Simón; E. Pérez
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Measurement of index of refraction of air by optical frequency method
Author(s): Radek Šmíd; Martin Čížek; Zdeněk Buchta; Břetislav Mikel; Josef Lazar; Ondřej Číp
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Force plate for measuring small animal forces by digital speckle pattern interferometry
Author(s): M. Pilar Arroyo; José Antonio Bea; Nieves Andrés; Rosario Osta; Manuel Doblaré
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Design of an optical scanner for real time on-line measurement of wood-panel profiles
Author(s): Paolo Castellini; Andrea Bruni; Nicola Paone
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Particles size measurement by spectrophotometric method
Author(s): Daniela Fontani; Franco Francini; Paola Sansoni; David Jafrancesco; Luca Mercatelli
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Absolute interferometric measurement of flatness: application of different methods to test a 600 mm diameter reference flat
Author(s): Franck Morin; Stéphane Bouillet
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Determination of lens parameters with digital holography
Author(s): Vani K. Chhaniwal; Arun Anand
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Optical fiber rotation sensor for application in oil refinery and high electromagnetic noise environment
Author(s): Tomasz R. Woliński; Andrzej W. Domański; Sławomir Ertman; Grzegorz Goleniewski; Michał Wydmański
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Method of optical axis determination in crystals by use of light depolarization measurements
Author(s): Andrzej W. Domanski; Daniel Budaszewski; Pawel Poziemski; Tomasz R. Wolinski
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Nematic liquid crystals light valve: application to phase shifting speckle interferometry
Author(s): Pierre Slangen; Benoit Gautier
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