### PROCEEDINGS VOLUME 6600

Noise and Fluctuations in Circuits, Devices, and MaterialsFormat | Member Price | Non-Member Price |
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Softcover | $105.00 * | $105.00 * |

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Volume Details

Volume Number: 6600

Date Published: 7 June 2007

Softcover: 61 papers (602) pages

ISBN: 9780819467379

Date Published: 7 June 2007

Softcover: 61 papers (602) pages

ISBN: 9780819467379

Table of Contents

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Front Matter: Volume 6600

Author(s): Proceedings of SPIE

Author(s): Proceedings of SPIE

Stationary and non-stationary noise in superconducting quantum devices

Author(s): I. Martin; L. Bulaevskii; A. Shnirman; Y. M. Galperin

Author(s): I. Martin; L. Bulaevskii; A. Shnirman; Y. M. Galperin

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A deterministic solver for the Langevin Boltzmann equation including the Pauli principle

Author(s): Christoph Jungemann

Author(s): Christoph Jungemann

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Adiabatic ac-drive as a tool for acceleration of diffusion in spatially periodic structures and of reset process in threshold devices

Author(s): Slanislav M. Soskin; Riccardo Mannella; Oleg M. Yevtushenko

Author(s): Slanislav M. Soskin; Riccardo Mannella; Oleg M. Yevtushenko

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Numerical investigation of noise and transport properties of multiple mesoscopic cavities

Author(s): Paolo Marconcini; Massimo Macucci

Author(s): Paolo Marconcini; Massimo Macucci

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Assessing the 1/f noise contributions of accidental defects in advanced semiconductor devices

Author(s): Gijs Bosman; Derek O. Martin; Shahed Reza

Author(s): Gijs Bosman; Derek O. Martin; Shahed Reza

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Resistive switching and noise in conductive polymers for non-volatile organic memories

Author(s): Lode K. J. Vandamme; Michael Cölle; Dago M. de Leeuw; Frank Verbakel

Author(s): Lode K. J. Vandamme; Michael Cölle; Dago M. de Leeuw; Frank Verbakel

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On the mechanisms of low-frequency noise in vertical silicon pnp BJTs

Author(s): Peng Cheng; Enhai Zhao; John D. Cressler; Jayasimha Prasad

Author(s): Peng Cheng; Enhai Zhao; John D. Cressler; Jayasimha Prasad

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Low-frequency noise characterizations of GaN-based visible-blind UV detectors fabricated using a double buffer layer structure

Author(s): H. F. Lui; W. K. Fong; C. Surya

Author(s): H. F. Lui; W. K. Fong; C. Surya

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A semiconductor device noise model: integration of Poisson type stochastic Ohmic contact conditions with semiclassical transport

Author(s): B. A. Noaman; C. E. Korman; A. J. Piazza

Author(s): B. A. Noaman; C. E. Korman; A. J. Piazza

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Low-frequency noise and random telegraph signal noise in SiGe:C heterojunction bipolar transistors: impact of carbon concentration

Author(s): Jeremy Raoult; Colette Delseny; Fabien Pascal; Mathieu Marin; M. Jamal Deen

Author(s): Jeremy Raoult; Colette Delseny; Fabien Pascal; Mathieu Marin; M. Jamal Deen

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1/f noise in SiGe HBTs fabricated on CMOS-compatible thin-film SOI

Author(s): Marco Bellini; Peng Cheng; Aravind Appaswamy; John D. Cressler; Jin Cai

Author(s): Marco Bellini; Peng Cheng; Aravind Appaswamy; John D. Cressler; Jin Cai

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Current and optical low-frequency noise of GaInN/GaN green light emitting diodes

Author(s): Sergey L. Rumyantsev; Christian Wetzel; Michael S. Shur

Author(s): Sergey L. Rumyantsev; Christian Wetzel; Michael S. Shur

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Impact of BOX/substrate interface on low frequency noise in FD-SOI devices

Author(s): L. Zafari; J. Jomaah; G. Ghibaudo

Author(s): L. Zafari; J. Jomaah; G. Ghibaudo

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A very low noise voltage reference for high sensitivity noise measurements

Author(s): C. Ciofi; G. Cannatà; G. Scandurra; R. Merlino

Author(s): C. Ciofi; G. Cannatà; G. Scandurra; R. Merlino

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Noise characteristic and quality investigation of ultrafast avalanche photodiodes

Author(s): S. Pralgauskaitė; V. Palenskis; J. Matukas; A. Vizbaras

Author(s): S. Pralgauskaitė; V. Palenskis; J. Matukas; A. Vizbaras

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Noise and hysteresis in charged stripe, checkerboard, and clump forming systems

Author(s): C. Reichhardt; C. J. Olson Reichhardt; A. R. Bishop

Author(s): C. Reichhardt; C. J. Olson Reichhardt; A. R. Bishop

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Polarization fluctuations in an epoxy system above and below the glass transition

Author(s): M. Lucchesi; D. Prevosto; A. Dominjon; S. Capaccioli; P. A. Rolla

Author(s): M. Lucchesi; D. Prevosto; A. Dominjon; S. Capaccioli; P. A. Rolla

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Numerical simulations of low-frequency noise in RuO2-glass films

Author(s): Adam W. Stadler; Andrzej Kolek

Author(s): Adam W. Stadler; Andrzej Kolek

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Shot-noise of quantum chaotic systems in the classical limit

Author(s): Robert S. Whitney

Author(s): Robert S. Whitney

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Shot noise in transport through quantum dots: ballistic versus diffractive scattering

Author(s): Stefan Rotter; Florian Aigner; Joachim Burgdörfer

Author(s): Stefan Rotter; Florian Aigner; Joachim Burgdörfer

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Non-Gaussian noise in quantum wells

Author(s): A. Ben Simon; Y. Paltiel; G. Jung; H. Schneider

Author(s): A. Ben Simon; Y. Paltiel; G. Jung; H. Schneider

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Fluctuation-enhanced sensing

Author(s): L. B. Kish; G. Schmera; Ch. Kwan; J. Smulko; P. Heszler; C.-G. Granqvist

Author(s): L. B. Kish; G. Schmera; Ch. Kwan; J. Smulko; P. Heszler; C.-G. Granqvist

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Noise optimization of an active pixel sensor for real-time digital x-ray fluoroscopy

Author(s): M. H. Izadi; K. S. Karim

Author(s): M. H. Izadi; K. S. Karim

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Utilising jitter noise in the precise synchronisation of laser pulses

Author(s): Róbert Mingesz; Zoltán Gingl; Gábor Almási; Péter Makra

Author(s): Róbert Mingesz; Zoltán Gingl; Gábor Almási; Péter Makra

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Vibration-induced conductivity fluctuation measurement for soil bulk density analysis

Author(s): Andrea Sz. Kishné; Cristine L. S. Morgan; Hung-Chih Chang; Laszlo B. Kish

Author(s): Andrea Sz. Kishné; Cristine L. S. Morgan; Hung-Chih Chang; Laszlo B. Kish

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SNDR enhancement in noisy sinusoidal signals by non-linear processing elements

Author(s): Ferran Martorell; Mark D. McDonnell; Derek Abbott; Antonio Rubio

Author(s): Ferran Martorell; Mark D. McDonnell; Derek Abbott; Antonio Rubio

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Noise properties of high-T<sub>c</sub> superconducting transition edge bolometers with electrothermal feedback

Author(s): Igor A. Khrebtov; Konstantin V. Ivanov; Valery G. Malyarov

Author(s): Igor A. Khrebtov; Konstantin V. Ivanov; Valery G. Malyarov

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Four channels cross correlation method for high sensitivity current noise measurements

Author(s): C. Ciofi; G. Scandurra; R. Merlino; G. Cannatà; G. Giusi

Author(s): C. Ciofi; G. Scandurra; R. Merlino; G. Cannatà; G. Giusi

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Imaging spatio-temporal fluctuations and local susceptibility in disordered polymers

Author(s): N. E. Israeloff; P. S. Crider; M. E. Majewski

Author(s): N. E. Israeloff; P. S. Crider; M. E. Majewski

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Fluctuation-induced first order transition due to Griffiths anomalies of the cluster glass phase

Author(s): Matthew J. Case; V. Dobrosavljević

Author(s): Matthew J. Case; V. Dobrosavljević

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Numerical modeling of electron noise in nanoscale Si devices

Author(s): Christoph Jungemann

Author(s): Christoph Jungemann

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Microscopic modeling of impact-ionization noise in SiGe heterojunction bipolar transistors

Author(s): Mindaugas Ramonas; Christoph Jungemann; Paulius Sakalas; Michael Schröter; Wolfgang Kraus

Author(s): Mindaugas Ramonas; Christoph Jungemann; Paulius Sakalas; Michael Schröter; Wolfgang Kraus

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Low frequency gate noise modeling of ultrathin oxide MOSFETs

Author(s): F. Martinez; M. Valenza

Author(s): F. Martinez; M. Valenza

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Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs

Author(s): Chih-Hung Chen; Zheng Zeng; Jin-Shyong Jan; Keh-Chung Wang; Chune-Sin Yeh

Author(s): Chih-Hung Chen; Zheng Zeng; Jin-Shyong Jan; Keh-Chung Wang; Chune-Sin Yeh

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Characterization and model enablement of high-frequency noise in 90-nm CMOS technology

Author(s): Zhenrong Jin; Hongmei Li; Susan Sweeney; Radhika Allamraju; David Greenberg; Basanth Jagannanthan; Scott Parker; Xiaowei Tian

Author(s): Zhenrong Jin; Hongmei Li; Susan Sweeney; Radhika Allamraju; David Greenberg; Basanth Jagannanthan; Scott Parker; Xiaowei Tian

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Performance limits of simulation models for noise characterization of mm-wave devices

Author(s): Ali Abou-Elnour

Author(s): Ali Abou-Elnour

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Correlation technique to reach ultimate resolution in noise measurements

Author(s): Giorgio Ferrari; Laura Fumagalli; Marco Sampietro

Author(s): Giorgio Ferrari; Laura Fumagalli; Marco Sampietro

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Application of physical models to circuit simulations

Author(s): F. Bonani; F. Bertazzi; G. Conte; S. Donati Guerrieri; G. Ghione

Author(s): F. Bonani; F. Bertazzi; G. Conte; S. Donati Guerrieri; G. Ghione

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Measurements to reveal phase-noise producing mechanisms in resonator-oscillators

Author(s): Michael H. W. Hoffmann

Author(s): Michael H. W. Hoffmann

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Digital switching noise as a stochastic process

Author(s): Giorgio Boselli; Gabriella Trucco; Valentino Liberali

Author(s): Giorgio Boselli; Gabriella Trucco; Valentino Liberali

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Does measurement noise increase as a phase transition is approached?

Author(s): Zhi Chen; Clare C. Yu

Author(s): Zhi Chen; Clare C. Yu

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Low-temperature resistance noise in lightly doped La2-x Srx CuO4

Author(s): I. Raičević; J. Jaroszyński; Dragana Popović; G. Jelbert; C. Panagopoulos; T. Sasagawa

Author(s): I. Raičević; J. Jaroszyński; Dragana Popović; G. Jelbert; C. Panagopoulos; T. Sasagawa

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Electronic noise in silicon nitride ceramics doped by carbon allotropes

Author(s): Béla Szentpáli; Péter Arató

Author(s): Béla Szentpáli; Péter Arató

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Mechanical-thermal noise characterization of a new micromachined acoustic sensor

Author(s): B. Mezghani; F. Tounsi; M. Masmoudi

Author(s): B. Mezghani; F. Tounsi; M. Masmoudi

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Generation-recombination noise in forward-biased 4H-SiC p-n diode

Author(s): Sergey L. Rumyantsev; Alexander Dmitriev; Michael Levinshtein; Dmitri Veksler; Michael S. Shur; John Palmour; Mrinal Das; Brett Hull

Author(s): Sergey L. Rumyantsev; Alexander Dmitriev; Michael Levinshtein; Dmitri Veksler; Michael S. Shur; John Palmour; Mrinal Das; Brett Hull

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Noise evidence for intermittent channeled vortex motion in laser-processed YBaCuO thin films

Author(s): Artūras Jukna; Ilan Barboy; Grzegorz Jung; Adulfas Abrutis; Satyajit S. Banerjee; Xia Li; Daozhi Wang; Roman Sobolewski

Author(s): Artūras Jukna; Ilan Barboy; Grzegorz Jung; Adulfas Abrutis; Satyajit S. Banerjee; Xia Li; Daozhi Wang; Roman Sobolewski

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Signal recovery from mixed coherent signal and noise

Author(s): Mohammad Reza Salehi; Farzin Emami

Author(s): Mohammad Reza Salehi; Farzin Emami

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Noise characteristics and reliability of light emitting diodes based on nitrides

Author(s): S. Pralgauskaitė; V. Palenskis; J. Matukas; J. Petrulis; G. Kurilčik

Author(s): S. Pralgauskaitė; V. Palenskis; J. Matukas; J. Petrulis; G. Kurilčik

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Main sources of electron mobility fluctuations in semiconductors

Author(s): Slavik V. Melkonyan; Ferdinand V. Gasparyan; Haik V. Asriyan

Author(s): Slavik V. Melkonyan; Ferdinand V. Gasparyan; Haik V. Asriyan

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Usage of microplasma signal noise for solar cells diagnostic

Author(s): Jiri Vanek; Pavel Koktavy; Kristyna Kubickova; Petr Sadovsky; Michal Raska

Author(s): Jiri Vanek; Pavel Koktavy; Kristyna Kubickova; Petr Sadovsky; Michal Raska

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Noises of p-i-n UV photodetectors

Author(s): Ferdinand V. Gasparyan; Can E. Korman; Slavik V. Melkonyan

Author(s): Ferdinand V. Gasparyan; Can E. Korman; Slavik V. Melkonyan

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Noise spectroscopy of new silicon solar cells with double-sided texture

Author(s): Zdeněk Chobola; Vlasta Juránková; Jiří Vaněk; Radim Bařinka

Author(s): Zdeněk Chobola; Vlasta Juránková; Jiří Vaněk; Radim Bařinka

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Impact of self-heating in LF noise measurements with voltage amplifiers

Author(s): A. A. Lisboa de Souza; J.-C. Nallatamby; M. Prigent; J. Obregon

Author(s): A. A. Lisboa de Souza; J.-C. Nallatamby; M. Prigent; J. Obregon

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Effects of circuit elements and harmonic oscillation power on fundamental PM noise power of FET oscillator

Author(s): Ossama Abo-Elnor; Ali Abou-Elnour

Author(s): Ossama Abo-Elnor; Ali Abou-Elnour

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Very long decay time for electron velocity distribution in semiconductors and consequent 1/f noise

Author(s): G. Cavalleri; E. Tonni; L. Bosi

Author(s): G. Cavalleri; E. Tonni; L. Bosi

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