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Proceedings of SPIE Volume 6600

Noise and Fluctuations in Circuits, Devices, and Materials
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Volume Details

Volume Number: 6600
Date Published: 7 June 2007
Softcover: 61 papers (602) pages
ISBN: 9780819467379

Table of Contents
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Front Matter: Volume 6600
Author(s): Proceedings of SPIE
Stationary and non-stationary noise in superconducting quantum devices
Author(s): I. Martin; L. Bulaevskii; A. Shnirman; Y. M. Galperin
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A deterministic solver for the Langevin Boltzmann equation including the Pauli principle
Author(s): Christoph Jungemann
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Adiabatic ac-drive as a tool for acceleration of diffusion in spatially periodic structures and of reset process in threshold devices
Author(s): Slanislav M. Soskin; Riccardo Mannella; Oleg M. Yevtushenko
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Numerical investigation of noise and transport properties of multiple mesoscopic cavities
Author(s): Paolo Marconcini; Massimo Macucci
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Assessing the 1/f noise contributions of accidental defects in advanced semiconductor devices
Author(s): Gijs Bosman; Derek O. Martin; Shahed Reza
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Resistive switching and noise in conductive polymers for non-volatile organic memories
Author(s): Lode K. J. Vandamme; Michael Cölle; Dago M. de Leeuw; Frank Verbakel
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On the mechanisms of low-frequency noise in vertical silicon pnp BJTs
Author(s): Peng Cheng; Enhai Zhao; John D. Cressler; Jayasimha Prasad
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Low-frequency noise characterizations of GaN-based visible-blind UV detectors fabricated using a double buffer layer structure
Author(s): H. F. Lui; W. K. Fong; C. Surya
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A semiconductor device noise model: integration of Poisson type stochastic Ohmic contact conditions with semiclassical transport
Author(s): B. A. Noaman; C. E. Korman; A. J. Piazza
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On the origin of 1/f noise in MOSFETs
Author(s): Lode K. J. Vandamme
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Low-frequency noise and random telegraph signal noise in SiGe:C heterojunction bipolar transistors: impact of carbon concentration
Author(s): Jeremy Raoult; Colette Delseny; Fabien Pascal; Mathieu Marin; M. Jamal Deen
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1/f noise in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
Author(s): Marco Bellini; Peng Cheng; Aravind Appaswamy; John D. Cressler; Jin Cai
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Current and optical low-frequency noise of GaInN/GaN green light emitting diodes
Author(s): Sergey L. Rumyantsev; Christian Wetzel; Michael S. Shur
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Impact of BOX/substrate interface on low frequency noise in FD-SOI devices
Author(s): L. Zafari; J. Jomaah; G. Ghibaudo
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A very low noise voltage reference for high sensitivity noise measurements
Author(s): C. Ciofi; G. Cannatà; G. Scandurra; R. Merlino
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Noise characteristic and quality investigation of ultrafast avalanche photodiodes
Author(s): S. Pralgauskaitė; V. Palenskis; J. Matukas; A. Vizbaras
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Noise and hysteresis in charged stripe, checkerboard, and clump forming systems
Author(s): C. Reichhardt; C. J. Olson Reichhardt; A. R. Bishop
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Polarization fluctuations in an epoxy system above and below the glass transition
Author(s): M. Lucchesi; D. Prevosto; A. Dominjon; S. Capaccioli; P. A. Rolla
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Numerical simulations of low-frequency noise in RuO2-glass films
Author(s): Adam W. Stadler; Andrzej Kolek
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Shot-noise of quantum chaotic systems in the classical limit
Author(s): Robert S. Whitney
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Shot noise in transport through quantum dots: ballistic versus diffractive scattering
Author(s): Stefan Rotter; Florian Aigner; Joachim Burgdörfer
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The noise susceptibility of a coherent conductor
Author(s): J. Gabelli; B. Reulet
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Non-Gaussian noise in quantum wells
Author(s): A. Ben Simon; Y. Paltiel; G. Jung; H. Schneider
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Fluctuation-enhanced sensing
Author(s): L. B. Kish; G. Schmera; Ch. Kwan; J. Smulko; P. Heszler; C.-G. Granqvist
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Noise optimization of an active pixel sensor for real-time digital x-ray fluoroscopy
Author(s): M. H. Izadi; K. S. Karim
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Utilising jitter noise in the precise synchronisation of laser pulses
Author(s): Róbert Mingesz; Zoltán Gingl; Gábor Almási; Péter Makra
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Vibration-induced conductivity fluctuation measurement for soil bulk density analysis
Author(s): Andrea Sz. Kishné; Cristine L. S. Morgan; Hung-Chih Chang; Laszlo B. Kish
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SNDR enhancement in noisy sinusoidal signals by non-linear processing elements
Author(s): Ferran Martorell; Mark D. McDonnell; Derek Abbott; Antonio Rubio
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Noise properties of high-T<sub>c</sub> superconducting transition edge bolometers with electrothermal feedback
Author(s): Igor A. Khrebtov; Konstantin V. Ivanov; Valery G. Malyarov
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Four channels cross correlation method for high sensitivity current noise measurements
Author(s): C. Ciofi; G. Scandurra; R. Merlino; G. Cannatà; G. Giusi
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Imaging spatio-temporal fluctuations and local susceptibility in disordered polymers
Author(s): N. E. Israeloff; P. S. Crider; M. E. Majewski
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Fluctuation-induced first order transition due to Griffiths anomalies of the cluster glass phase
Author(s): Matthew J. Case; V. Dobrosavljevi&#263;
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Numerical modeling of electron noise in nanoscale Si devices
Author(s): Christoph Jungemann
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Microscopic modeling of impact-ionization noise in SiGe heterojunction bipolar transistors
Author(s): Mindaugas Ramonas; Christoph Jungemann; Paulius Sakalas; Michael Schröter; Wolfgang Kraus
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Low frequency gate noise modeling of ultrathin oxide MOSFETs
Author(s): F. Martinez; M. Valenza
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Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs
Author(s): Chih-Hung Chen; Zheng Zeng; Jin-Shyong Jan; Keh-Chung Wang; Chune-Sin Yeh
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Characterization and model enablement of high-frequency noise in 90-nm CMOS technology
Author(s): Zhenrong Jin; Hongmei Li; Susan Sweeney; Radhika Allamraju; David Greenberg; Basanth Jagannanthan; Scott Parker; Xiaowei Tian
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Performance limits of simulation models for noise characterization of mm-wave devices
Author(s): Ali Abou-Elnour
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Correlation technique to reach ultimate resolution in noise measurements
Author(s): Giorgio Ferrari; Laura Fumagalli; Marco Sampietro
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Application of physical models to circuit simulations
Author(s): F. Bonani; F. Bertazzi; G. Conte; S. Donati Guerrieri; G. Ghione
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Measurements to reveal phase-noise producing mechanisms in resonator-oscillators
Author(s): Michael H. W. Hoffmann
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Digital switching noise as a stochastic process
Author(s): Giorgio Boselli; Gabriella Trucco; Valentino Liberali
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Does measurement noise increase as a phase transition is approached?
Author(s): Zhi Chen; Clare C. Yu
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Low-temperature resistance noise in lightly doped La2-x Srx CuO4
Author(s): I. Rai&#269;evi&#263;; J. Jaroszy&#324;ski; Dragana Popovi&#263;; G. Jelbert; C. Panagopoulos; T. Sasagawa
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Electronic noise in silicon nitride ceramics doped by carbon allotropes
Author(s): Béla Szentpáli; Péter Arató
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Mechanical-thermal noise characterization of a new micromachined acoustic sensor
Author(s): B. Mezghani; F. Tounsi; M. Masmoudi
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Theoretical aspects of nonlinear thermal fluctuations
Author(s): Boris M. Grafov
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Generation-recombination noise in forward-biased 4H-SiC p-n diode
Author(s): Sergey L. Rumyantsev; Alexander Dmitriev; Michael Levinshtein; Dmitri Veksler; Michael S. Shur; John Palmour; Mrinal Das; Brett Hull
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Noise evidence for intermittent channeled vortex motion in laser-processed YBaCuO thin films
Author(s): Art&#363;ras Jukna; Ilan Barboy; Grzegorz Jung; Adulfas Abrutis; Satyajit S. Banerjee; Xia Li; Daozhi Wang; Roman Sobolewski
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Signal recovery from mixed coherent signal and noise
Author(s): Mohammad Reza Salehi; Farzin Emami
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Noise characteristics and reliability of light emitting diodes based on nitrides
Author(s): S. Pralgauskait&#279;; V. Palenskis; J. Matukas; J. Petrulis; G. Kuril&#269;ik
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Main sources of electron mobility fluctuations in semiconductors
Author(s): Slavik V. Melkonyan; Ferdinand V. Gasparyan; Haik V. Asriyan
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Usage of microplasma signal noise for solar cells diagnostic
Author(s): Jiri Vanek; Pavel Koktavy; Kristyna Kubickova; Petr Sadovsky; Michal Raska
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Noises of p-i-n UV photodetectors
Author(s): Ferdinand V. Gasparyan; Can E. Korman; Slavik V. Melkonyan
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Noise spectroscopy of new silicon solar cells with double-sided texture
Author(s): Zden&#283;k Chobola; Vlasta Juránková; Ji&#345;í Van&#283;k; Radim Ba&#345;inka
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Noise in superconducting MgB2 thin film
Author(s): B. Lakew; S. Aslam; H. Jones
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Impact of self-heating in LF noise measurements with voltage amplifiers
Author(s): A. A. Lisboa de Souza; J.-C. Nallatamby; M. Prigent; J. Obregon
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Effects of circuit elements and harmonic oscillation power on fundamental PM noise power of FET oscillator
Author(s): Ossama Abo-Elnor; Ali Abou-Elnour
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Very long decay time for electron velocity distribution in semiconductors and consequent 1/f noise
Author(s): G. Cavalleri; E. Tonni; L. Bosi
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Origins of randomness in statistical and quantum mechanics
Author(s): M. B. Weissman
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Thermal noise informatics: totally secure communication via a wire, zero-power communication, and thermal noise driven computing
Author(s): Laszlo B. Kish; Robert Mingesz; Zoltan Gingl
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