### Proceedings of SPIE Volume 6292

Interferometry XIII: Techniques and AnalysisFormat | Member Price | Non-Member Price |
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Softcover | $105.00 * | $105.00 * |

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Volume Details

Volume Number: 6292

Date Published: 13 August 2006

Softcover: 57 papers (524) pages

ISBN: 9780819463715

Date Published: 13 August 2006

Softcover: 57 papers (524) pages

ISBN: 9780819463715

Table of Contents

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A critical look at the source characteristics used for time varying fringe interferometry

Author(s): Chandrasekhar Roychoudhuri; Negussie Tirfessa

Author(s): Chandrasekhar Roychoudhuri; Negussie Tirfessa

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Development of precision double corner cubes for the Space Interferometer Mission

Author(s): Bozenko F. Oreb; Jan Burke; Roger P. Netterfield; Jeffrey A. Seckold; Achim Leistner; Mark Gross; Svetlana Dligatch

Author(s): Bozenko F. Oreb; Jan Burke; Roger P. Netterfield; Jeffrey A. Seckold; Achim Leistner; Mark Gross; Svetlana Dligatch

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Ray-trace simulation of the random ball test to improve microlens metrology

Author(s): Neil W. Gardner; Angela D. Davies

Author(s): Neil W. Gardner; Angela D. Davies

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Self-calibration of wavefront testing interferometers by use of diffractive elements

Author(s): Stephan Reichelt; Hans Tiziani; Hans Zappe

Author(s): Stephan Reichelt; Hans Tiziani; Hans Zappe

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A new traceable method for determination of periodic nonlinearities of interferometers

Author(s): I. Schmidt; G. Jäger; T. Hausotte; E. Manske; R. Füßl

Author(s): I. Schmidt; G. Jäger; T. Hausotte; E. Manske; R. Füßl

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Detection and assessment of the nonuniform phase displacement error in temporal phase shifting interferometry

Author(s): Krzysztof Patorski; Adam Styk; Luigi Bruno; Piotr Szwaykowski

Author(s): Krzysztof Patorski; Adam Styk; Luigi Bruno; Piotr Szwaykowski

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Calibration of phase shifter in phase-shifting shearography

Author(s): Y. Gan; W. Steinchen

Author(s): Y. Gan; W. Steinchen

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Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

Author(s): Adam Styk; Krzysztof Patorski

Author(s): Adam Styk; Krzysztof Patorski

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Single fringe pattern with closed fringes demodulation using row by row scanners

Author(s): J. C. Estrada; M. Servín; J. A. Quiroga; J. L. Marroquín

Author(s): J. C. Estrada; M. Servín; J. A. Quiroga; J. L. Marroquín

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Phase unwrapping by a noise immune algorithm: fringe estimation, quality segmentation, and sorted extraction

Author(s): Sheng Liu; Lian X. Yang

Author(s): Sheng Liu; Lian X. Yang

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Phase recovery from a single interferogram using multiple Fourier transforms

Author(s): Jesús Muñoz-Maciel; F. Gerardo Lecona-Peña; Cesar Castillo-Quevedo; Franciso J. Casillas-Rodríguez; Víctor Duran-Martínez; Miguel Mora-González

Author(s): Jesús Muñoz-Maciel; F. Gerardo Lecona-Peña; Cesar Castillo-Quevedo; Franciso J. Casillas-Rodríguez; Víctor Duran-Martínez; Miguel Mora-González

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Advanced wave-front sensing by quadri-wave lateral shearing interferometry

Author(s): Sabrina Velghe; Jérôme Primot; Nicolas Guérineau; Riad Haïdar; Sébastien Demoustier; Mathieu Cohen; Benoît Wattellier

Author(s): Sabrina Velghe; Jérôme Primot; Nicolas Guérineau; Riad Haïdar; Sébastien Demoustier; Mathieu Cohen; Benoît Wattellier

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Low-coherence vibration insensitive Fizeau interferometer

Author(s): Brad Kimbrough; James Millerd; James Wyant; John Hayes

Author(s): Brad Kimbrough; James Millerd; James Wyant; John Hayes

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Fringe localization in the Twyman-Green interferometer using extended monochromatic sources

Author(s): Johannes Schwider

Author(s): Johannes Schwider

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Absolute calibration of null correctors using twin computer-generated holograms

Author(s): Proteep C. V. Mallik; Rene Zehnder; James H. Burge; Alexander Poleshchuk

Author(s): Proteep C. V. Mallik; Rene Zehnder; James H. Burge; Alexander Poleshchuk

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Experimental investigation of testing large aspheric surfaces with annular subaperture interferometric method

Author(s): Xi Hou; Fan Wu; Li Yang; Qiang Chen

Author(s): Xi Hou; Fan Wu; Li Yang; Qiang Chen

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Optimized setup for active compensation of distortions for interferometric techniques onboard the International Space Station

Author(s): Christoph von Kopylow; Volker Kebbel; Joachim Becker; Werner Jüptner

Author(s): Christoph von Kopylow; Volker Kebbel; Joachim Becker; Werner Jüptner

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Wavefront sensing for 3D particle metrology and velocimetry

Author(s): N. Angarita-Jaimes; E. McGhee; M. Chennaoui; H. I. Campbell; S. Zhang; C. E. Towers; A. H. Greenaway; D. P. Towers

Author(s): N. Angarita-Jaimes; E. McGhee; M. Chennaoui; H. I. Campbell; S. Zhang; C. E. Towers; A. H. Greenaway; D. P. Towers

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Application of digital interferometry to study of density field around sphere with flow separation

Author(s): Igor V. Ershov; Yuri D. Babichev

Author(s): Igor V. Ershov; Yuri D. Babichev

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Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples

Author(s): Ki-Nam Joo; Seung-Woo Kim

Author(s): Ki-Nam Joo; Seung-Woo Kim

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Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser

Author(s): Jonghan Jin; Young-Jin Kim; Yunseok Kim; Chu-Shik Kang; Seung-Woo Kim

Author(s): Jonghan Jin; Young-Jin Kim; Yunseok Kim; Chu-Shik Kang; Seung-Woo Kim

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Analysis of spectrally resolved white light interferometry by Hilbert transform method

Author(s): Sanjit K. Debnath; Mahendra P. Kothiyal

Author(s): Sanjit K. Debnath; Mahendra P. Kothiyal

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Absolute interferometry for surface shapes with large steps by wavelength tuning with a mechanical phase shift

Author(s): Kenichi Hibino; Yosuke Tani; Toshiyuki Takatsuji; Youichi Bitou; Shinichi Warisawa; Mamoru Mitsuishi

Author(s): Kenichi Hibino; Yosuke Tani; Toshiyuki Takatsuji; Youichi Bitou; Shinichi Warisawa; Mamoru Mitsuishi

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Generic nonsinusoidal phase error correction for 3D shape measurement using a digital video projector

Author(s): Song Zhang; Shing-Tung Yau

Author(s): Song Zhang; Shing-Tung Yau

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Color fringe projection system based on optimum frequency selection

Author(s): Zonghua Zhang; Catherine E. Towers; David P. Towers

Author(s): Zonghua Zhang; Catherine E. Towers; David P. Towers

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Effect of varied fringe width on measured profile in structured line projection method

Author(s): Guiju Song; Ming Jia; Yu Ning; Jianming Zheng; Kevin Harding

Author(s): Guiju Song; Ming Jia; Yu Ning; Jianming Zheng; Kevin Harding

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Transmission digital holography microscopy applied to the study of coal palynofacies

Author(s): Alejandro Restrepo; Jorge Herrera; Román Castañeda; Christopher Mann; Myung Kim

Author(s): Alejandro Restrepo; Jorge Herrera; Román Castañeda; Christopher Mann; Myung Kim

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Surface shape measurement by phase-shifting digital holography with dual wavelengths

Author(s): Ichirou Yamaguchi; Takashi Ida; Masayuki Yokota

Author(s): Ichirou Yamaguchi; Takashi Ida; Masayuki Yokota

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Speckle photography: linear canonical transform metrology systems in mixed domains with apertures

Author(s): Jennifer E. Ward; Damien P. Kelly; Bryan M. Hennelly; Robert F. Patten; John T. Sheridan

Author(s): Jennifer E. Ward; Damien P. Kelly; Bryan M. Hennelly; Robert F. Patten; John T. Sheridan

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Nanometric displacement measurement using phase singularities in Laguerre-Gauss transform of speckle pattern

Author(s): Wei Wang; Tomoaki Yokozeki; Reika Ishijima; Steen G. Hanson; Mitsuo Takeda

Author(s): Wei Wang; Tomoaki Yokozeki; Reika Ishijima; Steen G. Hanson; Mitsuo Takeda

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Vibration mode shape visualization with dual function DSPI system

Author(s): Basanta Bhaduri; M. P. Kothiyal; N. Krishna Mohan

Author(s): Basanta Bhaduri; M. P. Kothiyal; N. Krishna Mohan

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Heterodyne interferometry for high sensitivity absolute amplitude vibrational measurements

Author(s): Hanne Martinussen; Astrid Aksnes; Helge E. Engan

Author(s): Hanne Martinussen; Astrid Aksnes; Helge E. Engan

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Real-time measurement of micrometer-order amplitude transverse vibrations using the photo-EMF effect in photoconductive materials

Author(s): Juan Silva; Kevin Contreras; Guillermo Baldwin; Luis Mosquera

Author(s): Juan Silva; Kevin Contreras; Guillermo Baldwin; Luis Mosquera

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Fast and accurate non-contact in situ optical metrology for end-point detection

Author(s): Wojciech J. Walecki; Alexander Pravdivstev; Manuel Santos; Ann Koo

Author(s): Wojciech J. Walecki; Alexander Pravdivstev; Manuel Santos; Ann Koo

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Novel techniques for random depth access three-dimensional white-light optical metrology

Author(s): Patrick Egan; Fereydoun Lakestani; Maurice P. Whelan; Michael J. Connelly

Author(s): Patrick Egan; Fereydoun Lakestani; Maurice P. Whelan; Michael J. Connelly

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Displacement measurement by spectro-polarization modulator

Author(s): Yukitoshi Otani; Toshitaka Wakayama; Dmitry Orlov; Norihiro Umeda

Author(s): Yukitoshi Otani; Toshitaka Wakayama; Dmitry Orlov; Norihiro Umeda

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Thickness-profile measurement of transparent thin-film layers by spectrally resolved phase-shifting interferometry

Author(s): Sanjit K. Debnath; Mahendra P. Kothiyal; Joanna Schmit; Parameswaran Hariharan

Author(s): Sanjit K. Debnath; Mahendra P. Kothiyal; Joanna Schmit; Parameswaran Hariharan

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Chromatic confocal spectral interferometry (CCSI)

Author(s): Evangelos Papastathopoulos; Klaus Körner; Wolfgang Osten

Author(s): Evangelos Papastathopoulos; Klaus Körner; Wolfgang Osten

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Study of a new design of an incremental optical encoder

Author(s): A. Lutenberg; F. Perez Quintián; M. A. Rebollo

Author(s): A. Lutenberg; F. Perez Quintián; M. A. Rebollo

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A curvature sensor using white-light scanning interferometry

Author(s): ByoungChang Kim; SeHeon Kim; YongKwan Kwon; YunWoo Lee; HoSoon Yang; HyugGyo Rhee

Author(s): ByoungChang Kim; SeHeon Kim; YongKwan Kwon; YunWoo Lee; HoSoon Yang; HyugGyo Rhee

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High-resolution real-time 3D absolute coordinates measurement using a fast three-step phase-shifting algorithm

Author(s): Song Zhang; Dale Royer; Shing-Tung Yau

Author(s): Song Zhang; Dale Royer; Shing-Tung Yau

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High resolution deformation measurement method using one sheet of specklegram

Author(s): Yasuhiko Arai; Shunsuke Yokozeki

Author(s): Yasuhiko Arai; Shunsuke Yokozeki

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Analysis and application for a new type of optical fiber interferometer with three-beam system

Author(s): Kai Yin; Liwei Wang; Tianhuai Ding; Min Zhang; Yanbiao Liao

Author(s): Kai Yin; Liwei Wang; Tianhuai Ding; Min Zhang; Yanbiao Liao

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A hybrid phase-unwrapping method for optical interferometry based on new parameter map and local plane approximation

Author(s): Yongjian Zhu; Liren Liu; Zhu Luan; Jianfeng Sun; Yuanjun Guo

Author(s): Yongjian Zhu; Liren Liu; Zhu Luan; Jianfeng Sun; Yuanjun Guo

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Comparison of the contrast-phase map reconstruction by Fresnel transform method and the angular spectrum backward propagation algorithm in RuO<sub>2</sub>:LiNbO<sub>3</sub> crystal

Author(s): Weijuan Qu; Ya'nan Zhi; De'an Liu; Wei Lu; Zhijuan Hu; Chunhua Wang; Liren Liu

Author(s): Weijuan Qu; Ya'nan Zhi; De'an Liu; Wei Lu; Zhijuan Hu; Chunhua Wang; Liren Liu

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The arctangent approach of digital PGC demodulation for optic interferometric sensors

Author(s): Liwei Wang; Min Zhang; Xianhui Mao; Yanbiao Liao

Author(s): Liwei Wang; Min Zhang; Xianhui Mao; Yanbiao Liao

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Fast surface profiling using monochromatic phase and fringe order in white-light interferometry

Author(s): Chi-Hong Tung; Chiung-Huei Huang; Ching-Fen Kao; Calvin C. Chang

Author(s): Chi-Hong Tung; Chiung-Huei Huang; Ching-Fen Kao; Calvin C. Chang

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Temporal demodulation of fringe patterns using continuous phase curvature constraint

Author(s): J. C. Estrada; A. Sanchez; M. Servín

Author(s): J. C. Estrada; A. Sanchez; M. Servín

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Describing and measuring the time-frequency parameters of low-power bright picosecond optical pulses using the interferometric technique

Author(s): Alexandre S. Shcherbakov; Ana Luz Muñoz Zurita; Alexey Yu. Kosarsky

Author(s): Alexandre S. Shcherbakov; Ana Luz Muñoz Zurita; Alexey Yu. Kosarsky

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Development and application of Talbot images technique for reconstruction of three dimensional objects

Author(s): David I. Serrano; Amalia Martínez; Alfonso Serrano-Heredia; J. A. Rayas

Author(s): David I. Serrano; Amalia Martínez; Alfonso Serrano-Heredia; J. A. Rayas

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Effects of spatial and temporal coherence of optical wide frequency and angle spectrum fields in Michelson interferometer

Author(s): Alexander L. Kalyanov; Vladislav V. Lychagov; Dmitry V. Lyakin; Vladimir P. Ryabukho

Author(s): Alexander L. Kalyanov; Vladislav V. Lychagov; Dmitry V. Lyakin; Vladimir P. Ryabukho

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A comparison between 2D phase unwrapping techniques

Author(s): J. Sánchez-Paredes; J. Castro-Ramos; S. Vázquez-Montiel

Author(s): J. Sánchez-Paredes; J. Castro-Ramos; S. Vázquez-Montiel

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Nonlinear interference of two successive coherent anti-Stokes Raman scattering signals for the biological imaging applications

Author(s): Eun Seong Lee; Jae Yong Lee; Yong Shim Yoo

Author(s): Eun Seong Lee; Jae Yong Lee; Yong Shim Yoo

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Measurement of the non-common vertex error of a double corner cube

Author(s): Alireza Azizi; Martin Marcin; Douglas Moore; Steve Moser; John Negron; Eung-Gi Paek; Daniel Ryan; Alex Abramovici; Paul Best; Ian Crossfield; Bijan Nemati; Tim Neville; B. Platt; Leonard Wayne

Author(s): Alireza Azizi; Martin Marcin; Douglas Moore; Steve Moser; John Negron; Eung-Gi Paek; Daniel Ryan; Alex Abramovici; Paul Best; Ian Crossfield; Bijan Nemati; Tim Neville; B. Platt; Leonard Wayne

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The NIST Advanced Measurement Laboratory: at the leading edge of measurement science and technology

Author(s): C. Londoño; J. Lawall; M. Postek; J. Stone; J. Stoup

Author(s): C. Londoño; J. Lawall; M. Postek; J. Stone; J. Stoup

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