Share Email Print
cover

PROCEEDINGS VOLUME 6291

Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 6291
Date Published: 5 September 2006
Softcover: 28 papers (294) pages
ISBN: 9780819463708

Table of Contents
show all abstracts | hide all abstracts
The instrumentation and the contamination control activity of thermal and near-infrared sensor for carbon observation (TANSO) on GOSAT
Author(s): Tomoyuki Urabe; Akihiko Kuze; Takashi Hamazaki; Naoko Baba; Shintaro Minami; Hideki Saruwatari
Show Abstract
Use of design of experiments techniques to investigate resistance change of chip resistors in MESSENGER
Author(s): Manny Uy; Ronald Hardesty; Johnny Fogle; Andrew Moor
Show Abstract
Monte Carlo based contamination modeling using GEANT
Author(s): David M. Huber; Mark T. Boies; Gary E. Galica
Show Abstract
Contamination control of space-based laser instruments
Author(s): Philip Chen; Randy Hedgeland; Larry Ramsey; Rachel Rivera; Karrie Houston
Show Abstract
Use of solid phase microextraction to verify nitrogen purge gas purity
Author(s): Amy A. Hofstra; Patrick G. Hogue
Show Abstract
Quartz crystal microbalance operation and in situ calibration
Author(s): K. Albyn; H. D. Burns
Show Abstract
Comparative mirror cleaning study: a study on removing particulate contamination
Author(s): Karrie D. Houston
Show Abstract
Comparison of particulate verification techniques study
Author(s): Rachel Rivera
Show Abstract
New Horizons Pluto lessons learned during ground processing
Author(s): Patrick Hogue
Show Abstract
GOES-12 molecular contamination
Author(s): Jack Sanders; Glenn Rosecrans
Show Abstract
Control of molecular contamination and outgassing of the SOFIE instrument
Author(s): James Dyer; Jim Herrick; Andrew Shumway; Chad Fish; John Stauder; Scott Schicker; Tim Gordon
Show Abstract
Formation of contaminant droplets on surfaces
Author(s): Kenneth T. Luey; Dianne J. Coleman
Show Abstract
Interaction of vacuum ultraviolet radiation with molecular deposits
Author(s): K. Albyn; H. D. Burns
Show Abstract
Digital imaging of particulate contamination
Author(s): Kenneth T. Luey; David P. Taylor; Dianne J. Coleman; Kelsey A. Folgner
Show Abstract
Comparing surface particle coverage predictions with image analysis measurements
Author(s): Chien W. Chang
Show Abstract
A numerical evaluation of the correlation of surface cleanliness level and percent area coverage
Author(s): Radford L. Perry
Show Abstract
Particle deposition in confined vessels
Author(s): Thomas K. Lesniewski
Show Abstract
Potential biofouling of spacecraft propellant systems due to contaminated deionized water
Author(s): Patrick Hogue
Show Abstract
No such thing as sigma: flowdown and measurement of surface roughness requirements
Author(s): Michael G. Dittman; Frank Grochocki; Kathleen Youngworth
Show Abstract
Improved Mie theory scatter model for particulate contamination that conserves energy and obeys reciprocity
Author(s): David G. Jenkins; Eric C. Fest; Rex M. Kremer; Paul R. Spyak
Show Abstract
K-correlation power spectral density and surface scatter model
Author(s): Michael G. Dittman
Show Abstract
Recent developments in the analysis of surface scatter phenomena
Author(s): Andrey Krywonos; James E. Harvey
Show Abstract
Modeling particle distributions for stray light analysis
Author(s): John Fleming; Bruce Matheson; Michael G. Dittman; Frank Grochocki; Brenda Firth
Show Abstract
Stray light in packaged detectors
Author(s): D. M. Waters; M. M. Blouke; A. Harwit; D. Heath
Show Abstract
Stray light reduction in testing of NIRSpec subsystems: the focal plane array and micro-shutter assembly
Author(s): Joseph A. Connelly; Theo J. Hadjimichael; Rene A. Boucarut; June L. Tveekrem; D. Brent Mott
Show Abstract
General algorithm for stray light measurements of remote sensing imagery
Author(s): Mark A. Goforth
Show Abstract
The art of specifying optics for scatter
Author(s): John C. Stover
Show Abstract
Measuring reality, solving the slope dilemma, and redefining the particle size distribution model
Author(s): Kerri J. Wilkerson; Philip G. Magallanes; Jonathan P. Elders; Ronald V. Peterson
Show Abstract

© SPIE. Terms of Use
Back to Top