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Proceedings of SPIE Volume 6000

Two- and Three-Dimensional Methods for Inspection and Metrology III
Editor(s): Kevin G. Harding
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Volume Details

Volume Number: 6000
Date Published: 5 December 2005
Softcover: 28 papers (296) pages
ISBN: 9780819460240

Table of Contents
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Latest optical methods for industrial dimensional metrology
Author(s): Kevin Harding
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3-D optical measurement using phase shifting based methods
Author(s): Peisen S. Huang; Song Zhang
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Vision systems on the internet
Author(s): B. G. Batchelor; S. J. Caton; L. T. Chatburn; R. A. Crowther; J. W. V. Miller
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Fast grey-level co-occurrence matrix calculations for texture analysis
Author(s): Frederick M. Waltz; John W. V. Miller
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Fast software implementations of common 3x3 operators
Author(s): Frederick M. Waltz; John W. V. Miller
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Online inspection of thermo-chemical heat treatment processes with CCD camera system
Author(s): Gerald Zauner; Gerald Darilion; Ronald Pree; Daniel Heim; G. Hendorfer
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Online temperature measurement and flow analysis of hot dross in a steel plant
Author(s): Helmut Urban; Oliver Sidla
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Hausdorff distance based PCB inspection system with defect classification
Author(s): Chun-Jen Chen; Shang-Hong Lai; Win-How Lee; Chun-Yu Lin; Terry Ku; Chiu-Hui Chen; Yueh-Ching Chung
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Performance evaluation of different depth from defocus (DFD) techniques
Author(s): Tao Xian; Murali Subbarao
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Camera calibration and performance evaluation of depth from defocus (DFD)
Author(s): Tao Xian; Murali Subbarao
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3D method via time and spatially multiplexed confocal microscope
Author(s): Fei Wu; Kebin Shi; Zhiwen Liu; Xueqian Zhang; Joseph Cheung; Karl Reichard; Stuart Yin
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3D measurements using a programmable projector and a grating
Author(s): Kevin Harding; Russ Demuth; Robert Tait
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Shiny parts measurement using color separation
Author(s): Qingying Hu; Kevin G. Harding; Xiaoming Du; Don Hamilton
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Phase error compensation for a 3D shape measurement system based on the phase-shifting method
Author(s): Song Zhang; Peisen S. Huang
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A fast three-step phase shifting algorithm
Author(s): Peisen S. Huang; Song Zhang
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A contrast between DLP and LCD digital projection technology for triangulation-based phase measuring optical profilometers
Author(s): Matthew J. Baker; Jiangtao Xi; Joe Chicharo; Enbang Li
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Liquid crystal grating for profilmetry using structured light
Author(s): Toru Yoshizawa; Hiroo Fujita
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Surface profile measurement by grating projection method with dual-projection optics
Author(s): Masayuki Yamamoto; Toru Yoshizawa
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Three-dimensional shape measurement using focus method by liquid crystal grating and liquid varifocus lens
Author(s): Yasuhiro Mizutani; Ryoichi Kuwano; Yukitoshi Otani; Norihiro Umeda; Toru Yoshizawa
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Sub-pixel accuracy thickness calculation of poultry fillets from scattered laser profiles
Author(s): Hansong Jing; Xin Chen; Yang Tao; Bin Zhu; Fenghua Jin
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A handheld profile measurement system for high accurate wear measurement of railway wheels
Author(s): Albert Niel; Edwin Deutschl; Clemens Gasser; Peter Kaufmann
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Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases
Author(s): Peter Moeck; Ondřej Čertik; Bjoern Seipel; Rebecca Groebner; Lori Noice; Girish Upreti; Philip Fraundorf; Rolf Erni; Nigel D. Browning; Andreas Kiesow; Jean-Pierre Jolivet
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MEMS measurement by optical holography method
Author(s): R. Dauksevicius; V. Ostasevicius; A. Palevicius; M. Ragulskis; R. Palevicius
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Full field displacement measurement and data processing of 3D components of mechatronic systems
Author(s): D. Rubliauskas; R. Palevicius; V. Ostasevicius; M. Ragulskis; A. Palevicius
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Nanometrology device standards for scanning probe microscopes and processes for their fabrication and usage
Author(s): Peter Moeck
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3D surface reconstruction of apples from 2D NIR images
Author(s): Bin Zhu; Lu Jiang; Xuemei Cheng; Yang Tao
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Stereovision-based 3D field recognition for automatic guidance system of off-road vehicle
Author(s): Fangming Zhang; Yibin Ying; Chuan Shen; Huanyu Jiang; Qin Zhang
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Characterization and integrity testing of flexible film materials utilizing a unique corona beam technology
Author(s): Gregory J. Gormley
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