Share Email Print
cover

PROCEEDINGS VOLUME 5856

Optical Measurement Systems for Industrial Inspection IV
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a black-and-white photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 5856
Date Published: 13 June 2005
Softcover: 119 papers (1084) pages
ISBN: 9780819458568

Table of Contents
show all abstracts | hide all abstracts
Modern approaches in phase measuring metrology
Author(s): James Millerd; Neal Brock; John Hayes; Brad Kimbrough; Matt Novak; Michael North-Morris; James C. Wyant
Show Abstract
Full-field low-frequency heterodyne interferometry using CMOS and CCD cameras with online phase processing
Author(s): Fereydoun Lakestani; Maurice Patrick Whelan; Julie Garvey; David Newport
Show Abstract
Fast three-dimensional phase-unwrapping algorithm based on sorting by reliability following a non-continuous path
Author(s): Hussein Abdul-Rahman; Munther Gdeisat; David Burton; Michael Lalor
Show Abstract
Gated heterodyne coherent anti-Stokes Raman scattering for high-contrast vibrational imaging
Author(s): Marco Greve; Bernd Bodermann; Harald R. Telle; Peter Baum; Eberhard Riedle
Show Abstract
Study of polarizing intercorrelative function of coherent images of phase-inhomogeneous layer anisotropy
Author(s): O. V. Angelsky; A. G. Ushenko; I. M. Vashenko; L. M. Bodnar
Show Abstract
Reconstruction of in-line hologram by using iterative algorithm
Author(s): Yan Zhang
Show Abstract
Image focusing properties in reconstructing digital holograms
Author(s): D. Alfieri; G. Coppola; S. DeNicola; P. Ferraro; A. Finizio; S. Grilli; G. Pierattini; V. Striano
Show Abstract
High-resolution lensless Fourier-transform digital holography
Author(s): Istvan Banyasz; Janos Kornis
Show Abstract
Determination and applications of contoured windows for ESPI fringe pattern processing
Author(s): Qifeng Yu; Xia Yang; Xiaohu Zhang; Sihua Fu; Xiangyi Sun
Show Abstract
Reflectivity function based illumination and sensor planning for industrial inspection
Author(s): Marc M. Ellenrieder; Christian Wohler; Pablo d'Angelo
Show Abstract
Illumination-based segmentation of structured surfaces in automated visual inspection
Author(s): Christoph Lindner; Javier Arigita; Fernando Puente Leon
Show Abstract
New method of structure light measurement system calibration based on adaptive and effective evaluation of 3D-phase distribution
Author(s): Robert Sitnik
Show Abstract
Optical 3D sensor for large objects in industrial application
Author(s): Peter Kuhmstedt; Matthias Heinze; Michael Himmelreich; Christian Brauer-Burchardt; Peter Brakhage; Gunther Notni
Show Abstract
Confocal micro-optical distance sensor: principle and design
Author(s): Aiko K. Ruprecht; Christof Pruss; Hans J. Tiziani; Wolfgang Osten; Peter Lucke; Arndt Last; Jurgen Mohr; Peter Lehmann
Show Abstract
Confocal micro-optical distance sensor: realization and results
Author(s): Peter Lucke; Arndt Last; Jurgen Mohr; Aiko K. Ruprecht; Christof Pruss; Hans J. Tiziani; Wolfgang Osten; Peter Lehmann; Sven Schonfelder
Show Abstract
Influence of component imperfection on null ellipsometry with phase modulation
Author(s): K. Postava; P. Hlubina; A. Maziewski; R. Ossikovski; M. Foldyna; O. Zivotsky; J. Pistora; S. Visnovsky; T. Yamaguchi
Show Abstract
A compact electronic speckle pattern interferometry system using a photopolymer reflection holographic optical element
Author(s): Sridhar Reddy Guntaka; J. Raghavendra; Vincent Toal; Izabela Naydenova; Suzanne Martin; S. Mintova
Show Abstract
Fiber optic spark plug sensor for UV-LIF measurements close to the ignition spark
Author(s): R. Reichle; C. Pruss; W. Osten; H. J. Tiziani; F. Zimmermann; C. Schulz
Show Abstract
Optical high-speed 3D metrology in harsh environments: recording structural data of railway lines
Author(s): H. Hofler; C. Baulig; A. Blug; M. Dambacher; N. Dimopoulos; H. Wolfelschneider
Show Abstract
Absolute distance metrology for space interferometers
Author(s): Bas L. Swinkels; Nandini Bhattacharya; Arno A. Wielders; Joseph J. M. Braat
Show Abstract
An online laser caliper measurement for the paper industry
Author(s): Jussi Graeffe; Seyhan Nuyan
Show Abstract
Robust high-precision 2D optical range sensor
Author(s): Markus Brandner; Thomas Thurner
Show Abstract
Optical distance measurements for closely spaced targets using a FMCW approach
Author(s): Robert Grosche
Show Abstract
Profiling of gas turbine blade using phase shifting Talbot interferometric technique
Author(s): Chandra Shakher; D. S. Mehta; Saba Mirza; Priti Singh
Show Abstract
Measurements from a novel interferometer for EUVL mirror substrates
Author(s): Max L. Krieg; Joseph J. M. Braat
Show Abstract
Improved optical linewidth measurement by means of alternating dark field illumination and model-based evaluation
Author(s): Gerd Ehret; Bernd Bodermann; Werner Mirande
Show Abstract
Mirror shape detection by reflection grating moiré method with optical design validation
Author(s): D. Fontani; F. Francini; D. Jafrancesco; L. Mercatelli; P. Sansoni
Show Abstract
High-accuracy profile form measurement by a scanning system consisting of an angle sensor and coupled distance sensors
Author(s): Joachim Gerhardt; Ralf Geckeler; Michael Schulz; Clemens Elster
Show Abstract
Industrial inspection of specular surfaces using a new calibration procedure
Author(s): Petra Aswendt; Roland Hofling; Soren Gartner
Show Abstract
High-speed and line-feed Fourier domain optical coherence tomography
Author(s): Yoshiaki Yasuno; Shuichi Makita; Takashi Endo; Gouki Aoki; Masahiro Yamanari; Yoshifumi Nakamura; Masahide Itoh; Toyohiko Yatagai
Show Abstract
2D parallel optical coherence tomography and multiple-layer information extraction
Author(s): Shoude Chang; Xianyang Cai; Erroll Murdock; Costel Flueraru
Show Abstract
White-light spectral interferometric technique used to measure the dispersion of the group birefringence of a uniaxial crystal
Author(s): Petr Hlubina
Show Abstract
Dispersive white-light interferometry for thin-film thickness profile measurement
Author(s): Young-Sik Ghim; Seung-Woo Kim
Show Abstract
Three-dimensional machine vision utilising optical coherence tomography with a direct read-out CMOS camera
Author(s): Patrick Egan; Fereydoun Lakestani; Maurice P. Whelan; Michael J. Connelly
Show Abstract
Micro-optics metrology using advanced interferometry
Author(s): Stephan Reichelt; Alexander Bieber; Bernd Aatz; Hans Zappe
Show Abstract
Microlenses metrology with digital holographic microscopy
Author(s): Florian Charriere; Jonas Kuhn; Tristan Colomb; Frederic Montfort; Etienne Cuche; Yves Emery; Kenneth Weible; Christian D. Depeursinge
Show Abstract
Development of measurement of microstructure using moiré topography in SEM
Author(s): Yasuhiko Arai; Shunsuke Yokozeki
Show Abstract
Edge enhancement of weak-phase object in laser scanning confocal microscope
Author(s): Masahide Itoh; Shin Uematsu; Hiroshi Ishiwata; Toyohiko Yatagai
Show Abstract
Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer
Author(s): Rainer Wilhelm; Alain Courteville; Fabrice Garcia
Show Abstract
A long standoff profilometer for surface inspection in adverse environments based on conoscopic holography
Author(s): Jose M. Enguita; Ignacio Alvarez; Cesar Fraga; Jorge Marina; Yolanda Fernandez; Gabriel Sirat
Show Abstract
3D surface reconstruction based on combined analysis of reflectance and polarisation properties
Author(s): Pablo d'Angelo; Christian Wohler
Show Abstract
Computer generated holograms for the optical shop testing of aspheres
Author(s): R. Schreiner; T. Herrmann; J. Roder; S. Muller-Pfeiffer; O. Falkenstorfer
Show Abstract
3D measurement of human face by stereophotogrammetry
Author(s): Holger Wagner; Axel Wiegmann; Richard Kowarschik; Friedrich Zollner
Show Abstract
Precision inspection of diameters for circular reflecting cylinders
Author(s): Yu. V. Chugui; Yu. A. Lemeshko
Show Abstract
ESPI for contouring of surfaces with discontinuities
Author(s): A. Purde; N. Werth; A. Meixner; A. W. Koch
Show Abstract
Recent issues on development of reference materials and standardized tests of optical methods of strain measurement
Author(s): Richard Burguete; Erwin Hack; Malgorzata Kujawinska; Eann Patterson; Leszek Salbut; Quasim Saleem; Thorsten Siebert; Maurice Whelan
Show Abstract
Polarization plane rotator used as a phase stepping device in a 2-channel shearing speckle interferometer
Author(s): Peter A. A. M. Somers; Nandini Bhattacharya
Show Abstract
TV-holographic mapping of airborne sound fields for the design of parametric arrays
Author(s): Holger Joost; Klaus D. Hinsch; Gerd Gulker
Show Abstract
Comparison of shearography and optical fibre Bragg grating strain sensors with resistance foil strain gauge measurements
Author(s): Roger M. Groves; Edmon Chehura; Weilai Li; Stephen E. Staines; Stephen W. James; Ralph P. Tatam
Show Abstract
Fast distance sensing by use of the speckle effect
Author(s): Ervin Nippolainen; Dmitry V. Semenov; Alexei A. Kamshilin; Andrey V. Belyaev; Sergei V. Andreev; Boris S. Gurevich
Show Abstract
The laser-scanning confocal vibrometer microscope
Author(s): Christian Rembe; Alexander Drabenstedt
Show Abstract
Accuracy analysis of major signal processing techniques in laser Doppler velocimetry
Author(s): Ivan A. Popov
Show Abstract
Interferogram intensity modulation calculations using temporal phase shifting: error analysis
Author(s): Krzysztof Patorski; Adam Styk
Show Abstract
Development and investigation of high resolution resonant pressure sensor with optical interrogation
Author(s): Michal Jozwik; Christophe Gorecki; Andrei Sabac; Dominique Heinis; Thierry Dean; Alain Jacobelli
Show Abstract
Time synchronization of oscillating objects with laser pulse in pulse interferometry
Author(s): Jaroslaw Bartold; Jacek Kacperski; Leszek Salbut
Show Abstract
Specification of vibrational modes and amplitudes in large-scale structure by time averaging moiré technique
Author(s): Saifollah Rasouli; Mohammad Taghi Tavassoly
Show Abstract
Performance evaluation of a residual stress measurement device using indentation and a radial in-plane ESPI interferometer
Author(s): Ricardo Suterio; Armando Albertazzi G.; Felipe Kleber Amaral; Anderson Pacheco
Show Abstract
Superconductor ceramics behavior analyses during service by speckle metrology
Author(s): S. Recuero; N. Andres; M. P. Arroyo; F. Lera; L. A. Angurel
Show Abstract
Automatic detection of the natural frequencies using digital shearography
Author(s): Y. Gan; G. Kupfer; W. Steinchen
Show Abstract
Experimental comparison of shearography and laser optical feedback imaging for crack detection in concrete structures
Author(s): V. Muzet; E. Lacot; O. Hugon; Y. Guillard
Show Abstract
Interferometric optical tomography applied to dendritic crystal growth model scenes
Author(s): J-L. Dewandel; M. Heraud; S. Rex; M. Mathes; T. Lanen; L. Joannes
Show Abstract
Assessment of technology and (thermo)mechanical behaviour of MEMS devices by interference microscopy
Author(s): Alain Bosseboeuf; Cedric Breluzeau; Sylvain Petitgrand
Show Abstract
Laser acoustic characterization of Ta and TaN diffusion barriers beneath Cu layers
Author(s): Jacqueline Vollmann; Dieter M. Profunser; Jurg Bryner; Jurg Dual
Show Abstract
Local measurements by noise in dynamic force microscopy
Author(s): Pascal Vairac; Bernard Cretin; Benjamin Joly
Show Abstract
Enhancement of image contrast by fluorescence in microtechnology
Author(s): Michael Berndt; Rainer Tutsch
Show Abstract
Point-diffraction fiber interferometer for vibration desensitization
Author(s): Jungjae Park; Hagyong Kihm; Seung-Woo Kim
Show Abstract
Digital holography microscopy (DHM): fast and robust systems for industrial inspection with interferometer resolution
Author(s): Yves Emery; Etienne Cuche; Francois Marquet; Nicolas Aspert; Pierre Marquet; Jonas Kuhn; Mikhail Botkine; Tristan Colomb; Frederic Montfort; Florian Charriere; Christian Depeursinge
Show Abstract
Characterisation of high-density particle distributions for optimisation of laser cladding processes using digital holography
Author(s): Volker Kebbel; Jurgen Geldmacher; Knut Partes; Werner Juptner
Show Abstract
Laval nozzle flow characterization by Fourier-transform Mach-Zehnder interferometry
Author(s): Francisco Rodriguez; Benito V. Dorrio; Angel F. Doval; Cristina Trillo; Felix Quintero; Marta Miranda; Carlos Lopez; Jose L. Fernandez
Show Abstract
Methods based on one component laser Doppler anemometer and hot film anemometer for three-dimensional turbulent measurements
Author(s): Athanasios P. Zeris
Show Abstract
Measurements of material refractive index with a circular heterodyne interferometer
Author(s): Zhi-Cheng Jian; Jiun-You Lin; Po-Jen Hsieh; Der-Chin Su
Show Abstract
Comparison of B-spline and Zernike fitting techniques in complex wavefront surfaces
Author(s): M. Ares; S. Royo; J. Caum; C. Pizarro
Show Abstract
Novel real-time infrared image processor with ADSP
Author(s): Cheng-liang Ge; Guo-bin Fan; Zhi-qiang Liu; Zheng-dong Li; Jian-tao Wu; Zhi-wei Huang; Zheng Liang
Show Abstract
A new approach for simple and rapid shape measurement of objects with surface discontinuities
Author(s): Sai Siva Gorthi; Kameswara Rao Lolla
Show Abstract
Polarizing-correlative processing of images of statistical objects in the problem of visualization and topology reconstruction of their phase heterogeneity
Author(s): O. V. Angelsky; A. G. Ushenko; I. M. Vashenko; L. M. Bodnar
Show Abstract
Grid-pattern design for fast scene reconstruction by a 3D vision sensor
Author(s): Qiu Guan; ShengYong Chen; Wanliang Wang; Y. F. Li
Show Abstract
The focusing action of refractive microlens by rigorous method
Author(s): Juan Liu; Ben-Yuan Gu; Bi-Zhen Dong; Guo-Zhen Yang
Show Abstract
Automatic tracing of interference fringes using Fourier filtering, local averaging and simultaneous horizontal and vertical scans
Author(s): Arun Anand; Vani K. Chhaniwal
Show Abstract
Application of matched digital filters to noisy fringe-patterns from complex wavefronts
Author(s): Jesus Caum; J. Arasa; Santiago Royo; M. Ares
Show Abstract
A focus sensor for an application in a nanopositioning and nanomeasuring machine
Author(s): Rostyslav Mastylo; Denis Dontsov; Eberhard Manske; Gerd Jager
Show Abstract
Application of super image methods in digital holography
Author(s): Janos Kornis; Balazs Gombkoto
Show Abstract
Phase evaluation using interference of polychromatic light and colorimetric analysis
Author(s): Pavel Novak; Jiri Novak; Antonin Miks
Show Abstract
Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry
Author(s): Sai Siva Gorthi; Kameswara Rao Lolla
Show Abstract
Evaluation of spectral modulated interferograms by the extended Kalman filtering method
Author(s): Igor Gurov; Petr Hlubina; Mikhail Taratin; Alexey Zakharov
Show Abstract
A compact frequency-stabilized Nd:YVO4/KTP/I2 laser at 532 nm for laser interferometry and wavelength standards
Author(s): Leonid F. Vitushkin; Oleg A. Orlov
Show Abstract
An objective measure of the quality of honed surfaces
Author(s): Fernando Puente Leon
Show Abstract
Liquid mirror as planarity standard: a simplified experimental approach
Author(s): M. Vannoni; G. Molesini
Show Abstract
Wavefront reconstruction algorithms for the adaptive Shack-Hartmann sensor
Author(s): Lars Seifert; Hans J. Tiziani; Wolfgang Osten
Show Abstract
A new approach for measurement of wire diameter by optical diffraction
Author(s): Yogesh C. Diwan; Kameswara Rao Lolla
Show Abstract
Easy calibration of a structured light vision system based on neural networks
Author(s): Bingbing Xia; ShengYong Chen; Wanliang Wang; Qiu Guan
Show Abstract
Effectible factors in optics profile testing
Author(s): Huan Ren; Xiaodong Jiang; Zuxin Huang; Hua Xu; Wei Zhong; Ke Li
Show Abstract
A compact shearing interferometer for testing optical systems
Author(s): Jiri Novak; Pavel Novak; Antonin Miks
Show Abstract
500-mm-aperture wavelength-tuning phase-shifting interferometer
Author(s): Liqun Chai; Qiao Xu; Yingjie Yu; Yang Deng; Jiancheng Xu
Show Abstract
Possible application of hyperchromatic optical systems for metrology of surfaces
Author(s): Jiri Novak; Antonin Miks
Show Abstract
On-line measurements with optical scanners: metrological aspects
Author(s): Virgil-Florin Duma
Show Abstract
Improving 3D surface measurement accuracy on metallic surfaces
Author(s): Raghu Kokku; Glen Brooksby
Show Abstract
Zeeman laser for straightness measurements
Author(s): Janusz Rzepka; Grzegorz Budzyn; Wojciech Fraczek; Marcin Bielenin
Show Abstract
How to detect object-caused illumination effects in 3D fringe projection
Author(s): Christoph Munkelt; Peter Kuhmstedt; Matthias Heinze; Herbert Suesse; Gunther Notni
Show Abstract
Object surface topography by means of a speckle correlation
Author(s): Petr Smid; Pavel Horvath; Petra Wagnerova; Miroslav Hrabovsky
Show Abstract
Focal spot measurement in ultra-intense ultra-short pulse laser facility
Author(s): Lanqin Liu; Hansheng Peng; Kainan Zhou; Xiaodong Wang; Xiaoming Zeng; Qihua Zhu; Xiaojun Huang; Xiaofeng Wei; Huan Ren
Show Abstract
Coherent introscopy of phase-inhomogeneous surface and layers
Author(s): O. V. Angelsky; A. G. Ushenko; I. M. Vashenko; L. M. Bodnar
Show Abstract
Phase correlation method for subpixel in-plane vibration measurements of MEMS by stroboscopic microscopy
Author(s): B. Serio; J. J. Hunsinger; D. D. Teyssieux; B. Cretin
Show Abstract
Experimental studies of mechanical joints by automated grating (moire) interferometry
Author(s): G. Dymny; M. Kujawinska; L. Salbut; D. Boronski
Show Abstract
Close infrared thermography using an intensified CCD camera: application in nondestructive high resolution evaluation of electrothermally actuated MEMS
Author(s): B. Serio; J. J. Hunsinger; F. Conseil; P. Derderian; D. Collard; L. Buchaillot; M. F. Ravat
Show Abstract
Measurement of beating effects in narrowband multimode Lamb wave displacement fields in aluminum plates by pulsed TV Holography
Author(s): Jose L. Fernandez; Cristina Trillo; Angel F. Doval; Daniel Cernadas; Carlos Lopez; Benito V. Dorrio; Marta Miranda; Francisco Rodriguez
Show Abstract
On-line non-contact measuring of synchronizer hubs
Author(s): Cesar Fraga; Jose M. Enguita; Ignacio Alvarez; Jorge Marina; Nestor Martinez
Show Abstract
Enhancement of high-resolution electronic autocollimators by application of phase grating technology
Author(s): Gerald Futterer
Show Abstract
3D optical measuring technologies and systems for industrial applications
Author(s): Yu. V. Chugui
Show Abstract
Filter radiometer based realization of photometric scale traceable to cryogenic radiometer at UME
Author(s): Murat Durak; Farhad Samedov
Show Abstract
New method for real-time surface cleanliness measurement
Author(s): Gabriel M. Bilmes; Daniel J. O. Orzi; Oscar E. Martinez; Alberto Lencina
Show Abstract
Utilizing a TII aspherical measurement machine in a computer controlled polishing process
Author(s): E. Pitschke; M. Schinhaerl; P. Sperber; R. Rascher
Show Abstract
The evaluation of particle counting efficacy of the new optical scattering method detecting the fluorescence for the particle number concentration standard in liquid
Author(s): Takayuki Sakaguchi; Kensei Ehara
Show Abstract
Seismic damage identification using multi-line distributed fiber optic sensor system
Author(s): Jinping Ou; Shuang Hou
Show Abstract
Diffusion coefficient measurement of transparent liquid solutions using digital holographic interferometry
Author(s): Vani K. Chhaniwal; Arun Anand; C. S. Narayanamurthy
Show Abstract
Pulsed Nd:YAG laser beam profile analyse
Author(s): Hana Chmelickova; Hana Lapsanska; Radim Ctvrtlik
Show Abstract
Birefringence measurement by use of digital holographic microscopy: examples with fiber optics and concrete samples
Author(s): Tristan Colomb; Etienne Cuche; Christian Depeursinge
Show Abstract
CCD based emissivity measurements for surface characterization in heat treatment processes
Author(s): Gerald Zauner; Gerald Darilion; Daniel Heim; G. Hendorfer; Thomas Mueller
Show Abstract
A method for measuring the complex refractive index of a turbid medium
Author(s): Zhi-Cheng Jian; Jiun-You Lin; Po-Jen Hsieh; Huei-Wen Chen; Der-Chin Su
Show Abstract
Dedicated near-field microscopies for electronic materials and devices
Author(s): Ludwig Josef Balk; Ronald Marcus Cramer; Ralf Heiderhoff; Jacob C. H. Phang; Oleg Sergeev; Anne-Katrin Tiedemann
Show Abstract

© SPIE. Terms of Use
Back to Top