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Proceedings of SPIE Volume 5846

Noise and Information in Nanoelectronics, Sensors, and Standards III
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Volume Details

Volume Number: 5846
Date Published: 23 May 2005
Softcover: 23 papers (234) pages
ISBN: 9780819458414

Table of Contents
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Control of decoherence
Author(s): Saverio Pascazio; P. Facchi
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Accessible information in molecular-scale systems: physical limits at small sampling volumes
Author(s): Neal G. Anderson
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Quantum search in stochastic planning
Author(s): Sanjeev Naguleswaran; Langford B. White
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Simple quadrature-based quantum feedback of a solid-state qubit
Author(s): Alexander N. Korotkov
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Correlation between destruction of the metal surface caused by pitting corrosion and intensity of the observed electrochemical noise
Author(s): Janusz M. Smulko; A. Zielinski; Kazimierz Darowicki
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Statistical model for noisy data selection
Author(s): Wieslaw Kicinski
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Application of higher order spectra in the electrochemical noise analysis
Author(s): Artur Zielinski
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Phonon engineering in nano-devices and virus-based nano-templates
Author(s): Alexander A. Balandin
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I-V fluctuation of benzene molecule as P-type or N-type active element
Author(s): Jayanta Choudhury; Gholam H. Massiha
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Variation of generation-recombination noise density with 300 K background flux in epitaxial LWIR Hg1-xCdxTe photoconductors having three-layer light absorbing configuration
Author(s): Galina V. Chekanova; Albina A. Drugova; Alexander V. Kurbatov; Mikhail S. Nikitin
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Optical monitoring and cooling of a micro-mechanical oscillator to the quantum limit
Author(s): Pierre-Francois Cohadon; Olivier Arcizet; Tristan Briant; Antoine Heidmann; Michel Pinard
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Oscillator with multiplicative noise
Author(s): M. Gitterman
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Zigzag-shaped AMR magnetic sensors: Transfer characteristics and noise
Author(s): L. Jiang; Aisha Gokce; F. C. S. da Silva; E. R. Nowak
Noise in piezoresistive Si pressure sensors
Author(s): Bela Szentpali; Maria Adam; Tibor Mohacsy
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Temporal signal-to-noise ratio of a CMOS buried double junction image sensor
Author(s): S. Feruglio; V. Fouad Hanna; G. Alquie; G. Vasilescu
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Semiconductor-metal interface influence on the bulk low-frequency noise behavior and role of the phonons refraction points
Author(s): H. V. Asriyan; A. A. Shatveryan; V. M. Aroutiounian; F. V. Gasparyan; S. V. Melkonyan; Z. H. Mkhitharian; G. Ayvazyan
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Two-photon correlation of photon pairs: near field and polarization effects
Author(s): C. H. Raymond Ooi; Anil K. Patnaik; Marlan O. Scully
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