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PROCEEDINGS VOLUME 5766

Testing, Reliability, and Application of Micro- and Nano-Material Systems III
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Volume Details

Volume Number: 5766
Date Published: 9 May 2005
Softcover: 19 papers (178) pages
ISBN: 9780819457479

Table of Contents
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X-ray refraction topography and computed tomography for NDE of lightweight materials
Author(s): Bernd R. Mueller; Axel Lange; Michael Harwardt; Manfred P. Hentschel; Bernhard Illerhaus; Juergen Goebbels; Joachim Bamberg; Falko Heutling
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X-ray diffraction topography image materials by molecular probe
Author(s): Manfred P. Hentschel; Axel Lange; Joerg Schors; Oliver Wald
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Micro-mechanical properties of fiber composites characterized by X-ray refraction
Author(s): Volker Trappe; Manfred Hentschel; Heinz Ivers
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Direct iterative reconstruction of computed tomography trajectories (DIRECTT)
Author(s): M. P. Hentschel; A. Lange; J. Schors
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Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering
Author(s): M. Herms; G. Irmer; P. Verma; G. Goerigk
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X-ray microscopy for NDE of micro- and nano-structrues
Author(s): Steve Wang; Frederick Duewer; Michael Feser; David Scott; Wenbing Yun
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Self-regulating charge control for ultra high resolution scanning electron microscopy
Author(s): Milos Toth; Brad L. Thiel; William R. Knowles
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FIB based measurements for material characterization on MEMS structures
Author(s): Dietmar Vogel; Daniel Lieske; Astrid Gollhardt; Juergen Keller; Neus Sabate; Joan Ramon Morante; Bernd Michel
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Application of photo and particle acoustic methods
Author(s): Bernd Koehler; Frank Schubert; Gert Hentges; Norbert Meyendorf
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Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects
Author(s): Bernard Nysten; Christian Fretigny; Stephane Cuenot
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Photoacoustic characterization of the mechanical properties of thin film materials
Author(s): Feifei Zhang; Sridhar Krishnaswamy; Dong Fei; Douglas A. Rebinsky
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Nondestructive mechanical imaging of carbon nanotubes
Author(s): Yuegui Zheng; Balasubramanian Sankaran; Robert Geer
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Numerical time-domain simulation of wave propagation and scattering in acoustic microscopy for subsurface defect characterization
Author(s): Frank Schubert; Bernd Koehler; Pavel Zinin
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Shearographic technique for NDE analysis of high frequency bending vibrations of microstructures
Author(s): Liutauras Ragulskis; Minvydas Ragulskis; Arvydas Palevicius; Vytautas Ostasevicius; Ramutis Palevicius
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Antenna-based near-field scanning optical microscopy
Author(s): Hendrik F. Hamann
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Near-field nano-Raman imaging of Si device structures
Author(s): Jacob Atesang; Robert Geer
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Nondestructive characterization of micromachined ceramics
Author(s): Adam Cooney; Kenneth E. Hix; Perry Yaney; Qiwen Zhan; Larry R. Dosser; James L. Blackshire
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Statistical signal parameters of acoustic emission for process monitoring
Author(s): Mareike Stephan; Klaus-Jochen Froehlich; Bernd Frankenstein; Dieter Hentschel
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Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy
Author(s): Stephen Olson; Balasubramanian Sankaran; Bruce Altemus; Bai Xu; Robert Geer
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