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PROCEEDINGS VOLUME 5679

Machine Vision Applications in Industrial Inspection XIII
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Volume Details

Volume Number: 5679
Date Published: 24 February 2005
Softcover: 30 papers (310) pages
ISBN: 9780819456526

Table of Contents
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Automated image analysis of microstructure changes in metal alloys
Author(s): Mohammed E. Hoque; Ralph M. Ford; John T. Roth
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Fast detection of line features in large images
Author(s): Thomas B. Sebastian; Kai F. Goebel; Tahs Saleh
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Precision of computer vision systems for real-time inspection of contact wire wear in railways
Author(s): Susana Borromeo; Jose Luis Aparicio
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Reference-free detection of semiconductor assembly defect
Author(s): Ada N.Y. Ng; Edmund Yin-Mun Lam; Ronald Chung; Kenneth S.M. Fung; Wing Hong Leung
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Classifier combination for wafer segmentation
Author(s): Pierrick T. Bourgeat; Fabrice Meriaudeau
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Three-dimensional reconstruction of wafer solder bumps using binary pattern projection
Author(s): Jun Cheng; Ronald Chung; Edmund Yin-Mun Lam; Kenneth S.M. Fung; Fan Wang; Wing Hong Leung
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Optical PCB inspection system based on Hausdorff distance
Author(s): Chun-Jen Chen; Shang-Hong Lai; Shao-Wei Liu; Terry Ku; Spring Ying-Cheun Yeh
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A simple optical system for real-time size measurements of TRISO fuel pellets
Author(s): Thomas P. Karnowski; Andrew K. Kercher; John D. Hunn; L. Curt Maxey
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Positional and orientational referencing of multiple light sectioning systems for precision profile measurement
Author(s): Mark Tratnig; Helmut Hlobil; Johann Reisinger; Paul L. O'Leary
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Fabric smoothness evaluation using the wavelet domain independent mixture model and a landform classification technique
Author(s): Chris Turner; Hung Yam Chan; Hamed Sari-Sarraf; Eric Francois Hequet
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Video-based cargo fire verification system with fuzzy inference engine for commercial aircraft
Author(s): Mokhtar Sadok; Radek Zakrzewski; Bob Zeliff
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Deflectometric inspection of diffuse surfaces in the far-infrared spectrum
Author(s): Jan W. Horbach; Soeren Kammel
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Square pulse thermography system design considerations for detection of voids inside of the material with different properties and finite differences
Author(s): Gerhard Traxler; Michael Scheerer; Christoph Steiger
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High-temperature video-extensometry for material testing of refractories
Author(s): Peter Schalk; Ewald Fauster; Paul L. O'Leary
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Camber measurement at hot strip mill at Voestalpine by using image processing method
Author(s): Helmut Hlobil; Kurt Niel; Markus Prinz; Gerhard Trinkl; Wolfgang Seyruck; Johann Reisinger
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Broken roll detection, application, algorithm and its basic principles of sensing
Author(s): Gerhard Traxler; Juergen Klarner; Georg Huelble-Koenigsberger
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Shape reconstruction from noisy surface slope information using a multiresolution Bayesian method
Author(s): Xuemei Zhang; Ramakrishna Kakarala; Zachi Izhak Baharav
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Stereovision-based close-up dimensional inspection
Author(s): J. Phillip Mitchell; Allan D. Spence; David W. Capson; Harley Chan; Marc Goldstein
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Polarization imaging applied to 3D reconstruction of specular metallic surfaces
Author(s): Olivier Morel; Fabrice Meriaudeau; Christophe Stolz; Patrick Gorria
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Evaluation and calibration methods for the application of a video-extensometer to tensile testing of polymer materials
Author(s): Ewald Fauster; Peter Schalk; Paul L. O'Leary
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An optical tracked hand-held range sensor
Author(s): Michel Robert; Benoit Debaque; John Laurent
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Using multispectral information for 3D reconstruction
Author(s): Al Amin Mansouri; Alexandra Lathuiliere; Yvon Voisin; Franck S. Marzani
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Real-time system for flatness inspection of steel strips
Author(s): Carlos Lopez; Daniel Fernando Garcia; Ruben Usamentiaga; Diego Gonzalez; Juan A. Gonzalez
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Range image registration for industrial inspection
Author(s): Carles Matabosch; Joaquim Salvi; David Fofi; Fabrice Meriaudeau
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Fault diagnosis of vision module on intelligent agent
Author(s): Xiaojun Tan; Wei Shen; Zhihao Guo; Wei Liu
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Inspection and measurement of a DWDM core with two stacked glass objects
Author(s): Steven Chanteh Kuo
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LOG-filter-based inspection of cluster Mura and vertical-band Mura on liquid crystal displays
Author(s): Hsin-Chia Chen; Li-Te Fang; Louis Lee; Chao-Hua Wen; Shang-Yuan Cheng; Sheng-Jyh Wang
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Attributed vector quantization: a new paradigm for image segmentation and pattern acquisition
Author(s): Aaron D. Ward; Xue Dong Yang
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Cotton trash assessment in radiographic x-ray images with scale-space filtering and stereo analysis
Author(s): Mehmet Serdar Dogan; Hamed Sari-Sarraf; Eric Francois Hequet
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Low-cost system for ancient stamps range image acquisition
Author(s): Edouard Thomas; David Fofi; Frederic Nicolier; Gilles Millon; Ralph Seulin
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