Share Email Print
cover

Proceedings of SPIE Volume 5606

Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
Editor(s): Kevin G. Harding
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 5606
Date Published: 16 December 2004
Softcover: 21 papers (196) pages
ISBN: 9780819455598

Table of Contents
show all abstracts | hide all abstracts
Slant correction for handwritten English documents
Author(s): Malayappan Shridhar; Fumitaka Kimura; Yimei Ding; John W. V. Miller
Background removal for check processing using morphology
Author(s): Yimei Ding; Fumitaka Kimura; Minoru Okada; Malayappan Shridhar; John W. V. Miller
Shape analysis for an automatic oyster grading system
Author(s): Dah-Jye Lee; Xiaoqian Xu; Robert M. Lane; Pengcheng Zhan
Show Abstract
Contour matching for a fish recognition and migration-monitoring system
Author(s): Dah-Jye Lee; Robert B. Schoenberger; Dennis Shiozawa; Xiaoqian Xu; Pengcheng Zhan
Camera sensitivity study
Author(s): Jonathan Schlueter; Yi Lu Murphey; John W. V. Miller; Malayappan Shridhar; Yun Luo; Farid Khairallah
Automated optical device for strain testing in automotive industry
Author(s): Fernando Canal; Jorge Garcia Mateo; Eusebio Carasusan
Show Abstract
Neural-network-based depth computation for blind navigation
Author(s): Farrah Wong; Ramachandran R. Nagarajan; Sazali Yaacob
Show Abstract

© SPIE. Terms of Use
Back to Top