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Proceedings of SPIE Volume 5538

Optical Constants of Materials for UV to X-Ray Wavelengths
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Volume Details

Volume Number: 5538
Date Published: 14 October 2004
Softcover: 18 papers (182) pages
ISBN: 9780819454768

Table of Contents
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Measuring optical constants from the UV to x-ray wavelengths: how it was (and is) done
Author(s): William R. Hunter
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An assessment of yttrium optical constants EUV using Mo/Y multilayers designed as in the linear polarizers
Author(s): Benjawan Kjornrattanawanich; Regina Soufli; Sasa Bajt; David L. Windt; John F. Seely
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Calculation of x-ray refraction from near-edge absorption data only
Author(s): Chris J. Jacobsen; Steve Yuxin Wang; Wenbing Yun; Sean Frigo
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Measurements of the optical constants of scandium in the 50-1300eV range
Author(s): Andrew L. Aquila; Farhad Salmassi; Eric M. Gullikson; Fredrik Eriksson; Jens Birch
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Determining ruthenium's optical constants in the spectral range 11-14 nm
Author(s): Luke J. Bissell; David D. Allred; R. Steven Turley; William R. Evans; Jed E. Johnson
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Improved techniques for measuring x-ray mass attenuation coefficients
Author(s): Martin D. de Jonge; Chanh Q. Tran; Christopher T. Chantler; Zwi Barnea
Zirconium and niobium transmission data at wavelengths from 11-16 nm and 200-1200 nm
Author(s): Terry A. Johnson; Regina Soufli; Eric M. Gullikson; Miles Clift
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First-principles ultraviolet and x-ray spectra over broad ranges
Author(s): Eric L. Shirley; J. A. Soininen; J. J. Rehr
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Angle-dependent total electron yield spectra in multilayer films for standing wave measurements
Author(s): Takeo Ejima; Yasuji Muramatsu; Hisataka Takenaka
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Spectral signatures and optic coefficients of surface and reservoir shales and limestones at COIL, CO2, and Nd:YAG laser wavelengths
Author(s): El Tahir Bailo; Ramona M. Graves
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Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry
Author(s): Hyun Jong Kim; Yong Jai Cho; Hyun Mo Cho; Won Chegal; Yun Woo Lee; Sang Youl Kim
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