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Interferometry XII: Applications
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Volume Details

Volume Number: 5532
Date Published: 2 August 2004
Softcover: 41 papers (398) pages
ISBN: 9780819454706

Table of Contents
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Quantitative optical metrology with CMOS cameras
Author(s): Cosme Furlong; Ervin Kolenovic; Curtis F. Ferguson
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Setup calibration and optimization for comparative digital holography
Author(s): Torsten Baumbach; Wolfgang Osten; Volker Kebbel; Christoph von Kopylow; Werner Jueptner
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LVDT calibration using a phase modulation optical interferometer calibrated by an x-ray interferometer
Author(s): Jin Won Park; Jae Gun Jo; Sang Ho Byun; Jeong Eun Kim; Cheon Il Eom
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Active microinterferometer with liquid crystal on silicon (LCOS) for extended range static and dynamic micromembrane measurement
Author(s): Jacek Kacperski; Malgorzata Kujawinska; Xinghua Wang; Philip J. Bos
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Thermally induced deformations measured by shearography
Author(s): Khaled Habib
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Planar Doppler velocimetry using optical fibers
Author(s): Ralph P. Tatam
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Foci determination of an off-axis ellipsoid: from theory to practice
Author(s): Yvette Houbrechts; Steve Roose; Yvan Stockman
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Micro optical probe sensor (MOPS) for dynamic in-plane displacement sensing
Author(s): Anand Krishna Asundi; Xiaoming Luo
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Tomographic microinterferometry as a measurement tool for 3D micro-optical phase elements
Author(s): Pawel Kniazewski; Malgorzata Kujawinska; Witold Gorski
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Surface profiling using a reference-scanning Mirau interference microscope
Author(s): Xavier Colonna de Lega; David Grigg; Peter de Groot
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Wavefront aberration measurement technology for microlens using the Mach-Zehnder interferometer provided with a projected aperture
Author(s): Takaaki Miyashita; Kenjiro Hamanaka; Masahiko Kato; Satoshi Ishihara; Hiroyasu Sato; Eiichi Sato; Tadashi Morokuma
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Three-dimensional range sensing and surface profilometry using lateral shearing interferometry
Author(s): Dalip Singh Mehta; Priti Singh; Mohd Shoeb Faridi; Saba Mirza; Chandra Shakher
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Equivalence between the software-determined and the hardware-determined effective numerical aperture in the interferometrical measuring of microlens
Author(s): Masahiko Kato; Takaaki Miyashita; Kenjiro Hamanaka; Satoshi Ishihara; Eiichi Sato; Tadashi Morokuma
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Active wavefront sensing and wavefront control with SLMs
Author(s): Jan Liesener; Lars Seifert; Hans J. Tiziani; Wolfgang Osten
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Environmentally friendly interferometry
Author(s): Leslie L. Deck
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OLED microdisplays: a new key element for fringe projection setups
Author(s): Gunther Notni; Stefan Riehemann; Peter Kuehmstedt; Lars Heidler; Nancy Wolf
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Surface roughness measurement by digital speckle correlation
Author(s): Ichirou Yamaguchi; Koichi Kobayashi; Leonid Yaroslavsky
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Precision measurement on comprehensive topography of the deep hole surface
Author(s): Zhongyu Wang; Ming Fang
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Active alignment for interferometric techniques onboard the International Space Station
Author(s): Volker Kebbel; Joachim Becker; Werner Jueptner
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Compact high-resolution homodyne interferometer for nanometer-scale multidimensional AFM metrology
Author(s): Satoshi Gonda; Kazuto Kinoshita; Hironori Noguchi; Hajime Koyanagi; Tsuneo Terasawa
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Methods to recognize the sample position for most precise interferometric length measurements
Author(s): Rene Schoedel; Jennifer E. Decker
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Study of high temperature loading on optical fiber-adhesive bonding
Author(s): Anish Priyadarshi; L. Hsueh Fen; Anand Krishna Asundi; S. G. Mhaisalkar; V. Kripesh
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Low-coherence speckle interferometry (LCSI) for detection of interfacial instabilities in adhesive-bonded joints
Author(s): Kay Gastinger; Gerd Guelker; Klaus D. Hinsch; Hans Magne Pedersen; Trude Storen; Svein Winther
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Development of standard measurement chain for full-field optical strain measurement methods
Author(s): Leszek Salbut; Malgorzata Kujawinska; Eann Patterson; Erwin Hack; Richard Burguete; Maurice Patrick Whelan; David A. Mendels
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Optical diffraction strain sensor
Author(s): Anand Krishna Asundi
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Detection of inhomogeneities in semi solid materials using pulsed digital holography
Author(s): Maria del Socorro Hernandez-Montes; Fernando Mendoza Santoyo; Carlos Perez-Lopez
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Nondestructive evaluations of thermal deformations for laser microwelding process
Author(s): Wei Han; Ryszard J. Pryputniewicz
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Flaw detection using temporal speckle pattern interferometry and thermal waves
Author(s): Guillermo H. Kaufmann; Matias R. Viotti; Gustavo E. Galizzi
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Optomechanical characterization of proton-exchange membrane fuel cells
Author(s): Nikhil H. Jalani; Shivananda P. Mizar; Pyoungho Choi; Cosme Furlong; Ravindra Datta
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Device for spectral emissivity measurements of ceramics using a FT-IR spectrometer
Author(s): Wolfgang Bauer; Alexander Moldenhauer
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Evaluation of a portable FTIR for in-situ field measurements of surface reflectance
Author(s): Rob K. Newsom; Robert D. Kaiser; August O. Schutte
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Strain solitary waves in lengthy waveguides
Author(s): Irina V. Semenova; Galina V. Dreiden; Alexander M. Samsonov
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Method for continuous end standard measurement utilizing laser interferometer
Author(s): Kai-Yu Cheng; Chung-Chi Tang; Wei-Cheng Chang; Chao-Jung Chen; Tsai-Fu Wu; Jung-Tsung Chou
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Surface profiling of turbine blade using phase-shifting Talbot interferometric technique
Author(s): Saba Mirza; Chandra Shakher
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All-optical magnetometer based on electromagnetically induced transparency
Author(s): R. Lammegger; A. Huss; Laurentius Windholz; Ji Hua Xu
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Compact vibration sensor for testing subresonance of slim optical pickup actuators
Author(s): Jong Sup Song; Sergiy Shylo
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Study of shock wave curl structures using shearing interferometry
Author(s): Igor V. Ershov; Alex P. Fedotov
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Application of digital speckle pattern interferometry in measurement of large deformation
Author(s): Rajesh Kumar; Vikas Rathi; Saba Mirza; Chandra Shakher
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Study of mode shapes and measurement of vibrations in square plates using DSPI and wavelet transform
Author(s): Chandra Shakher; Saba Mirza; Rajesh Kumar
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Automatic phase-shifting Ronchi tester with a square Ronchi ruling
Author(s): Jorge Castro-Ramos; Jose Sasian
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Phase scaling using characteristic polynomials
Author(s): Robert Sitnik
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Evaluation of the mechanical properties of square membranes prestressed by PECVD silicon oxynitride thin films
Author(s): Michal Jozwik; Christophe Gorecki; Patrick Delobelle; Andrei Sabac; Malgorzata Kujawinska
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