### Proceedings of SPIE Volume 5470

Noise in Devices and Circuits IIFormat | Member Price | Non-Member Price |
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Volume Details

Volume Number: 5470

Date Published: 25 May 2004

Softcover: 56 papers (620) pages

ISBN: 9780819453969

Date Published: 25 May 2004

Softcover: 56 papers (620) pages

ISBN: 9780819453969

Table of Contents

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Nonlocal effects and transfer fields for electronic noise in small devices

Author(s): Luca Varani; Jean Claude Vaissiere; Pavel Shiktorov; Evjeni Starikov; Viktor Gruzhinskis; Tomas Gonzalez; Javier Mateos; Daniel Pardo; Lino Reggiani

Author(s): Luca Varani; Jean Claude Vaissiere; Pavel Shiktorov; Evjeni Starikov; Viktor Gruzhinskis; Tomas Gonzalez; Javier Mateos; Daniel Pardo; Lino Reggiani

Extension of the characteristic potential method for noise calculation and its application to shot noise in semiconductor devices

Author(s): Hong Shick Min; Sung-Min Hong; Chan Hyeong Park; Young June Park

Author(s): Hong Shick Min; Sung-Min Hong; Chan Hyeong Park; Young June Park

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Current noise in semiconductor nanoscale devices

Author(s): Tanroku Miyoshi; Hideaki Tsuchiya; Matsuto Ogawa; Akihiko Asanuma; Toshitaka Okauchi

Author(s): Tanroku Miyoshi; Hideaki Tsuchiya; Matsuto Ogawa; Akihiko Asanuma; Toshitaka Okauchi

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Characterization, modeling, and implementation of high-frequency noise in MOSFETs for RF IC design

Author(s): Chih-Hung James Chen; Feng Li; M. Jamal Deen

Author(s): Chih-Hung James Chen; Feng Li; M. Jamal Deen

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MOSFET noise modeling and parameter extraction

Author(s): Manfred Berroth; Umut Basaran

Author(s): Manfred Berroth; Umut Basaran

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Nonlocal transport and thermal noise of the nanoscale MOSFET

Author(s): Young June Park; Seonghoon Jin; Sung-min Hong; Hong Shick Min

Author(s): Young June Park; Seonghoon Jin; Sung-min Hong; Hong Shick Min

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Influence of 2D electrostatic effects on the high-frequency noise behavior of sub-100-nm scaled MOSFETs

Author(s): Raúl Rengel; Daniel Pardo; María Jesús Martín

Author(s): Raúl Rengel; Daniel Pardo; María Jesús Martín

Noise in Si/SiGe and Ge/SiGe MODFET

Author(s): Frederic P Aniel; Mauro Enciso Aguilar; Nicolas Zerounian; Paul Crozat; Thomas Hackbarth; Hans-Joest Herzog; Ulf König

Author(s): Frederic P Aniel; Mauro Enciso Aguilar; Nicolas Zerounian; Paul Crozat; Thomas Hackbarth; Hans-Joest Herzog; Ulf König

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Noise modeling and performance in 0.15-um fully depleted SOI MOSFET

Author(s): Guillaume Pailloncy; Benjamin Iniguez; Gilles Dambrine; Morin Dehan; Jean-Pierre Raskin; Hideaki Matsuhashi; Pierre Delatte; Francois Danneville

Author(s): Guillaume Pailloncy; Benjamin Iniguez; Gilles Dambrine; Morin Dehan; Jean-Pierre Raskin; Hideaki Matsuhashi; Pierre Delatte; Francois Danneville

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Noise of analog SOI CMOS integrated circuits at millimeter wave frequencies

Author(s): Frank Ellinger

Author(s): Frank Ellinger

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Modeling of the noise behavior of graded bandgap channel MOSFET at GHz frequencies

Author(s): Ali Abou-Elnour

Author(s): Ali Abou-Elnour

Microwave noise in III-V and SiGe based HBTs, comparison, trends, numbers

Author(s): Paulius Sakalas; Michael Schroter

Author(s): Paulius Sakalas; Michael Schroter

Investigation of the rf-noise behavior of InP-based DHBT with InGaAs base and GaAsSb base

Author(s): Silja Ehrich; Stefan Neumann; Wolfgang Brockerhoff; Franz-Josef Tegude

Author(s): Silja Ehrich; Stefan Neumann; Wolfgang Brockerhoff; Franz-Josef Tegude

Accuracy assessment of compact RF noise models for SiGe HBTs by hydrodynamic device simulation

Author(s): Christoph Jungemann; Burkhard Neinhues; Bernd Meinerzhagen; Robert W. Dutton

Author(s): Christoph Jungemann; Burkhard Neinhues; Bernd Meinerzhagen; Robert W. Dutton

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High-frequency low-noise amplifiers and low-jitter oscillators in SiGe:C BiCMOS technology

Author(s): Wolfgang Winkler; Johannes Borngraeber; Bernd Heinemann; Frank Herzel; Rene Scholz

Author(s): Wolfgang Winkler; Johannes Borngraeber; Bernd Heinemann; Frank Herzel; Rene Scholz

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1/f noise in deep submicron CMOS technology for RF and analogue applications

Author(s): Mercha Abdelkarim; Eddy Simoen; Stefaan Decoutere; Cor Claeys

Author(s): Mercha Abdelkarim; Eddy Simoen; Stefaan Decoutere; Cor Claeys

Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs

Author(s): Nataliya R Lukyanchikova; N. Garbar; A. Smolanka; Eddy R. Simoen; A. Mercha; Cor Claeys

Author(s): Nataliya R Lukyanchikova; N. Garbar; A. Smolanka; Eddy R. Simoen; A. Mercha; Cor Claeys

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Low-frequency noise in SiGeC-based pMOSFETs

Author(s): M. Jamal Deen; Ognian Marinov; David Onsongo; Sanjay Banerjee

Author(s): M. Jamal Deen; Ognian Marinov; David Onsongo; Sanjay Banerjee

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Influence of the emitter-base junction depth on the low frequency noise of Si/SiGeC heterojunction bipolar transistors

Author(s): Cyril Chay; Patrice Benoit; Colette Delseny; Fabien Pascal; Pierre Llinares; Helene Baudry; Jean-Charles Vildeuil

Author(s): Cyril Chay; Patrice Benoit; Colette Delseny; Fabien Pascal; Pierre Llinares; Helene Baudry; Jean-Charles Vildeuil

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Low frequency noise in 4H-SiC BJTs

Author(s): Sergey L. Rumyantsev; Michael E Levinshtein; Anant K. Agarwal; John W. Palmour

Author(s): Sergey L. Rumyantsev; Michael E Levinshtein; Anant K. Agarwal; John W. Palmour

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Base low-frequency noise analysis of InP/InGaAs/InP DHBT submitted to bias and thermal stresses

Author(s): Cristell Maneux; Jean-Christophe Martin; Nathalie Labat; André Touboul

Author(s): Cristell Maneux; Jean-Christophe Martin; Nathalie Labat; André Touboul

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Analysis of low frequency noise in GaN based HEMT technologies

Author(s): Nathalie Malbert; Nathalie Labat; Arnaud Curutchet; André Touboul

Author(s): Nathalie Malbert; Nathalie Labat; Arnaud Curutchet; André Touboul

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1/f noise in GaN/AlGaN heterostructure field effect transistors under condition of strong geometric magnetoresistance

Author(s): Sergey L. Rumyantsev; Michael Shur; Wojciech Knap; Nina Dyakonova; Fabien Pascal; Alain Hoffman; Y. Ghuel; C. Gaquiere; D. Theron

Author(s): Sergey L. Rumyantsev; Michael Shur; Wojciech Knap; Nina Dyakonova; Fabien Pascal; Alain Hoffman; Y. Ghuel; C. Gaquiere; D. Theron

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Low frequency noise behavior in GaN HEMT’s on silicon substrate

Author(s): Laurent Bary; Elena Angeli; Abdelali Rennane; Jean-Guy Tartarin; Jacques Graffeuil; Robert Plana; Sylvain Delage; Jean-Claude de Jaegger; Yvon Cordier

Author(s): Laurent Bary; Elena Angeli; Abdelali Rennane; Jean-Guy Tartarin; Jacques Graffeuil; Robert Plana; Sylvain Delage; Jean-Claude de Jaegger; Yvon Cordier

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Simulation of cyclostationary noise in semiconductor devices

Author(s): Simona Donati Guerrieri; Fabrizio Bonani; Giovanni Ghione

Author(s): Simona Donati Guerrieri; Fabrizio Bonani; Giovanni Ghione

Noise in Schottky-barrier diodes: from static- to large-signal operation

Author(s): Susana Perez; Pavel Shiktorov; Tomás González; Evjeni Starikov; Viktor Gruzinskis; Lino Reggiani; Luca Varani; J. C. Vaissiere

Author(s): Susana Perez; Pavel Shiktorov; Tomás González; Evjeni Starikov; Viktor Gruzinskis; Lino Reggiani; Luca Varani; J. C. Vaissiere

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Identification procedures for the charge-controlled non-linear noise model of microwave electron devices

Author(s): Fabio Filicori; Pier Andrea Traverso; Corrado Florian

Author(s): Fabio Filicori; Pier Andrea Traverso; Corrado Florian

Low frequency noise cancellation in resistive FET mixers

Author(s): Georg Boeck; Michael Margraf

Author(s): Georg Boeck; Michael Margraf

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Phase noise in oscillators as differential-algebraic systems with colored noise sources

Author(s): Alper Demir

Author(s): Alper Demir

Semiconductor device and noise sources modeling: design methods and tools oriented to nonlinear H.F. oscillator CAD

Author(s): Jean-Christophe Nallatamby; Raphael Sommet; Michel Prigent; Juan Obregon

Author(s): Jean-Christophe Nallatamby; Raphael Sommet; Michel Prigent; Juan Obregon

High-frequency noise contribution to phase noise in microwave oscillators and amplifiers

Author(s): Gilles Cibiel; Laurent Escotte; Olivier Llopis

Author(s): Gilles Cibiel; Laurent Escotte; Olivier Llopis

Experimental results of gain fluctuations and noise in microwave low-noise cryogenic amplifiers

Author(s): Juan D Gallego; Isaac López-Fernández; Carmen Diez; Alberto Barcia

Author(s): Juan D Gallego; Isaac López-Fernández; Carmen Diez; Alberto Barcia

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Thermal de-embedding procedure for cryogenic on wafer high frequency noise measurement

Author(s): Sébastien Delcourt; Gilles Dambrine; Nourr Eddine Bourzgui; Francois Danneville; Christophe Laporte; Jean-Philippe Fraysse; Michel Maignan

Author(s): Sébastien Delcourt; Gilles Dambrine; Nourr Eddine Bourzgui; Francois Danneville; Christophe Laporte; Jean-Philippe Fraysse; Michel Maignan

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An extension to wider frequency band of a frequency and time analysis method to extract noise parameters

Author(s): Frederique Giannini; Emmanuelle Bourdel; Daniel Pasquet

Author(s): Frederique Giannini; Emmanuelle Bourdel; Daniel Pasquet

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Simultaneous extraction of the small-signal equivalent circuit elements and noise parameters of HBTs

Author(s): Carmen Maya; Antonio Lázaro; Lluis Pradell

Author(s): Carmen Maya; Antonio Lázaro; Lluis Pradell

Noise figure reduction techniques in LNA's for wide band multistandard RF receivers

Author(s): Giuseppe Martini; Antonio Liscidini; Rinaldo Castello

Author(s): Giuseppe Martini; Antonio Liscidini; Rinaldo Castello

On-wafer noise sources characterization

Author(s): Carmen Maya; Antonio Lázaro; Lluis Pradell

Author(s): Carmen Maya; Antonio Lázaro; Lluis Pradell

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A new statistical model of non linear noisy oscillator

Author(s): Moreno Coli; Alessandro Ercolani; Gabriele Falco; Francesco Centurelli

Author(s): Moreno Coli; Alessandro Ercolani; Gabriele Falco; Francesco Centurelli

Long term stability estimation of DC electrical sources from low frequency noise measurements

Author(s): Carmine Ciofi; Gino Giusi; Calogero Pace

Author(s): Carmine Ciofi; Gino Giusi; Calogero Pace

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The noise behavior of JFET transistors from room temperature down to 80 k

Author(s): C. Arnaboldi; Giuliano Boella; E. Panzeri; Gianluigi Pessina

Author(s): C. Arnaboldi; Giuliano Boella; E. Panzeri; Gianluigi Pessina

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Characterization and modeling of low frequency noise in sub-0.1-µm SiGe pMOSFET's

Author(s): Krunoslav Romanjek; Jan Andrzej Chroboczeck; Gérard Ghibaudo; Thomas Ernst

Author(s): Krunoslav Romanjek; Jan Andrzej Chroboczeck; Gérard Ghibaudo; Thomas Ernst

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Small and large signal trap-assisted GR noise modeling in semiconductor devices

Author(s): Simona Donati Guerrieri; Gabriele Conte; Fabrizio Bonani; Giovanni Ghione

Author(s): Simona Donati Guerrieri; Gabriele Conte; Fabrizio Bonani; Giovanni Ghione

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Coherent tools for physical-based simulation and characterization of noise in semiconductor devices oriented to nonlinear microwave circuit CAD

Author(s): Zoheir Riah; Raphael Sommet; Jean Christophe Nallatamby; Michel Prigent; Juan Obregon

Author(s): Zoheir Riah; Raphael Sommet; Jean Christophe Nallatamby; Michel Prigent; Juan Obregon

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Monte Carlo particle-based simulation of DG MOSFETs: influence of space-quantization effects on the high-frequency noise

Author(s): Raúl Rengel; Tomás González; María Jesús Martín

Author(s): Raúl Rengel; Tomás González; María Jesús Martín

Cross-correlation measurements in searching for a trace of the gate voltage noise in a JFET

Author(s): Sumihisa Hashiguchi; Shinsuke Hosono; Makoto Ohki; Munecazu Tacano; Josef Sikula

Author(s): Sumihisa Hashiguchi; Shinsuke Hosono; Makoto Ohki; Munecazu Tacano; Josef Sikula

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LF-band noise in MOSFET in low power operation

Author(s): Sumihisa Hashiguchi; Shunsuke Kawai; Makoto Ohki; Kaoru Someya

Author(s): Sumihisa Hashiguchi; Shunsuke Kawai; Makoto Ohki; Kaoru Someya

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Experimental and theoretical analysis of 1/f noise in polysilicon thin film transistors

Author(s): Abdelmalek Boukhenoufa; Laurent Pichon; Christophe Cordier; Hicham El Din Kotb; Tayeb Mohamed-Brahim

Author(s): Abdelmalek Boukhenoufa; Laurent Pichon; Christophe Cordier; Hicham El Din Kotb; Tayeb Mohamed-Brahim

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Barrier height dependence of low frequency noise in poly-Si thin-film transistors

Author(s): Jung Il Lee

Author(s): Jung Il Lee

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Direct extraction of the McWhorter's constant from LFN spectra of MOSFETs with planar layers of Si nanocrystals embedded in gate SiO2

Author(s): Stéphane Ferraton; Jacques Zimmermann; Jan Chroboczek; Jean Brini; Laurent Montès; Jacek Gurgul

Author(s): Stéphane Ferraton; Jacques Zimmermann; Jan Chroboczek; Jean Brini; Laurent Montès; Jacek Gurgul

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Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

Author(s): Jean-Guy Tartarin; Abdelali Rennane; Elena Angeli; Laurent Bary; Jean-Claude De Jaeger; Sylvain Delage; Robert Plana; Jacques Graffeuil

Author(s): Jean-Guy Tartarin; Abdelali Rennane; Elena Angeli; Laurent Bary; Jean-Claude De Jaeger; Sylvain Delage; Robert Plana; Jacques Graffeuil

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Noise of optoelectronic coupled devices

Author(s): Alicja Krystyna Konczakowska; Jacek Andrzej Cichosz; Stanislaw Galla; Barbara Małgorzata Stawarz

Author(s): Alicja Krystyna Konczakowska; Jacek Andrzej Cichosz; Stanislaw Galla; Barbara Małgorzata Stawarz

Impact of the scaling on the noise performance of deep-submicron Si/SiGe n-channel FETs

Author(s): Jesus E Velazquez; Kristel Fobelets; Valerio Gaspari

Author(s): Jesus E Velazquez; Kristel Fobelets; Valerio Gaspari

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