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PROCEEDINGS VOLUME 5407

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV
Editor(s): Gerald C. Holst
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Volume Details

Volume Number: 5407
Date Published: 5 August 2004
Softcover: 27 papers (272) pages
ISBN: 9780819453303

Table of Contents
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Uncertainties in the minimum resolvable temperature difference measurement
Author(s): Stephen F. Sousk; Patrick D. O'Shea; Van A. Hodgkin
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Determining stabilization accuracies of vibrationally excited FPA cameras by frame-to-frame measurements of MTF values
Author(s): Jochen Barth; Michael Assel; Thomas Kuligk; Yvonne Polin; Rudolf Proels
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Measurement and laboratory-to-field data correlation techniques for airborne forward-looking infrared systems
Author(s): Mark A. London; Richard Wilder
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Test methods and technology for uncooled imaging systems
Author(s): Scott J. Miller; Brian S. Backer; Margaret Kohin; Pascual Alonso; Jason T. Whitwam
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Advanced test systems for characterization of UUTs with laser range finder/designator capabilities
Author(s): Jim McKechnie; Paul Bryant; Pat Harris; Jack Grigor; Brian Rich; Alan Irwin; Steve McHugh
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A chopper-free measurement-based parametric-fitting nonuniformity correction system
Author(s): Hai-Wen Chen; Felix Fontan; Teresa Olson
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Reducing size, weight, and cost in a LWIR imaging system with wavefront coding
Author(s): Edward R. Dowski; Kenneth S. Kubala
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Development of a high-performance spectral radiometer for EO calibration applications
Author(s): Gregory Matis; Paul Bryant; Jay B. James; Steve McHugh
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RPro: radiometric data processor
Author(s): Brian K. Cromwell; Timothy A. Wright; John E. McClure
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Identifiability: a fast way to measure identification performance
Author(s): Maarten A. Hogervorst; Alexander Toet; Piet Bijl; Brian Miller
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Identification of military targets and simple laboratory test patterns in band-limited noise
Author(s): Piet Bijl; Maarten A. Hogervorst; Alexander Toet
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Identification of handheld objects for electro-optic/FLIR applications
Author(s): Steve K. Moyer; Eric Flug; Timothy C. Edwards; Keith A. Krapels; John Scarbrough
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Benefits of microscan for staring infrared imagers
Author(s): John Lester Miller; John M. Wiltse
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Superresolution performance for undersampled imagers
Author(s): Keith A. Krapels; Ronald G. Driggers; Steven Murrill; Jonathan M. Schuler; Matthew Thielke; S. Susan Young
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Characterization of phase artifacts for focal plane arrays
Author(s): Jose Manuel Lopez-Alonso; Javier Alda
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Predicting imaging performance in turbulence
Author(s): Sara Johnson; Eddie L. Jacobs; Richard H. Vollmerhausen
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Two-color HgCdTe focal plane detector simulation
Author(s): Thomas J. Sanders; Glenn T. Hess; Scott Eisert
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Infrared focal plane array modeling for aerospace and automotive applications
Author(s): Alain Durand; Eric de Borniol; Nicolas Guerineau; Thierry Cathala; Jean-Jacques Yon; Jean-Louis Ouvrier-Buffet; Pierre Castelein; Robert Tronel; Sylvette Bisotto; Gerard L. Destefanis; Jean-Paul Chamonal
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Modeling active imager performance
Author(s): Eddie L. Jacobs; Richard H. Vollmerhausen; Carl E. Halford
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Predicting range performance of LRG imagers in the presence of natural illumination
Author(s): Tana Maurer; Richard H. Vollmerhausen
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Search comparison in the infrared spectra for military operations in the urban terrain
Author(s): Nicole M. Devitt; Eric Flug; Steve K. Moyer; Brian Miller; David L. Wilson
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Spatial characterization of light detectors with nanometric resolution
Author(s): Javier Alda; Jose Manuel Lopez-Alonso; Jose Maria Rico-Garcia; Jesus Zoido; Glenn Boreman
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Testing of electro-optical imaging systems
Author(s): Krzysztof Chrzanowski; Jaroslaw Barela; Krzysztof Firmanty
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Real-time control of uncooled microbolometer camera transfer function
Author(s): Ernest Grimberg
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Evaluation of thermal imaging cameras used in fire fighting applications
Author(s): Francine Amon; Nelson Bryner; Anthony Hamins
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Development of a performance evaluation facility for fire fighting thermal imagers
Author(s): Francine Amon; Vytenis Benetis; Jungho Kim; Anthony Hamins
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Using a rotating test pattern for MTF measurement of staring array sensors
Author(s): Jonathan D. Fanning; Srikant K. Chari; Carl E. Halford
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