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Proceedings of SPIE Volume 5265

Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
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Volume Details

Volume Number: 5265
Date Published: 26 February 2004
Softcover: 23 papers (220) pages
ISBN: 9780819451538

Table of Contents
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The promise and payoff of 2D and 3D machine vision: Where are we today?
Author(s): Kevin G. Harding
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The use of holographic and diffractive optics for optimized machine vision illumination for critical dimension inspection
Author(s): Todd E. Lizotte; Orest Ohar
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3D precision surface measurement by dynamic structured light
Author(s): Ernest A. Franke; Michael J. Magee; Joseph N. Mitchell; Michael P. Rigney
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TARGET: a flexible installation for inspection of industrial objects
Author(s): Frank Boochs; Martin Freisberg; Marek Twardochlib
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Performance improvement of a 3D inspection process
Author(s): Deepak Giri; Musa Jouaneh
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Multifunction sensor that measures the width and surface profile of a steel plate
Author(s): Hirokazu Tatsubo; Toshiro Nakashima; Masayuki Sugiyama
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Volume holographic imaging for surface metrology with long working distances
Author(s): Arnab Sinha; Wenyang Sun; Tina Shih; George Barbastathis
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Specular-reflection-based flatness tester
Author(s): Shu-Guo Tang; Kevin G. Harding; Gregory O'Neil; Jin Cai
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Sonoluminescence bubble measurements using vision-based algorithms
Author(s): Nancy R. Hall; Jeffrey R. Mackey; Thomas J. Matula
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Three-dimensional dynamic range reduction techniques
Author(s): Kevin G. Harding; Xiaoping Qian
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Modulation-amplitude-locked laser diode interferometry for distance measurement
Author(s): Takamasa Suzuki; Tatsuo Iwana; Osami Sasaki
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Stroboscopic step height measurement with two-wavelength interferometer using a single diode laser source
Author(s): Xuefeng Zhao; Takamasa Suzuki; Osami Sasaki
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Applied multifocus 3D microscopy
Author(s): Thierry Zamofing; Heinz Hugli
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Full-field dynamic displacement and strain measurement using pulsed and high-speed 3D image correlation photogrammetry
Author(s): Timothy Schmidt; John Tyson; Konstantin Galanulis
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Total area strain mapping improves total quality of stampings
Author(s): Timothy Schmidt; John Tyson; Konstantin Galanulis
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Fast image processing using finite-state machines: software implementations
Author(s): Frederick M. Waltz; John W. V. Miller
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High-speed 3D scanner with real-time 3D processing
Author(s): Joseph P. Lavelle; Stefan R. Schuet; Daniel J. Schuet
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2D packing using the Myriad framework
Author(s): Luke T. Chatburn; Bruce G. Batchelor
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Calibration of an LCD projector with pinhole model in active stereovision applications
Author(s): Alexandra Lathuiliere; Franck S. Marzani; Yvon Voisin
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Color-encoded digital fringe projection technique for high-speed 3-D shape measurement: color coupling and imbalance compensation
Author(s): Jiahui Pan; Peisen S. Huang; Fu-Pen Chiang
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