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Proceedings of SPIE Volume 5190

Recent Developments in Traceable Dimensional Measurements II
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Volume Details

Volume Number: 5190
Date Published: 20 November 2003
Softcover: 50 papers (490) pages
ISBN: 9780819450630

Table of Contents
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Principal length specifying parameters of material artifacts, their physical meaning, methods for their measurements, and typical uncertainties
Author(s): Alexander Titov; Igor Malinovsky; Carlos Alberto Massone
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Next-generation Kösters interferometer
Author(s): Jennifer E Decker; Rene Schodel; Gerhard Bonsch
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Primary level gauge block interferometers for realization of the SI length unit
Author(s): Alexaundre Titov; Igor Malinovsky; H. Belaidi; R. S. Franca; M. Erin
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Minimizing interferometer misalignment errors for measurement of subnanometer length changes
Author(s): Rene Schoedel; Arnold Nicolaus; Gerhard Boensch
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Wringing deformation effects in basic length measurements by optical interferometry
Author(s): Alexander Titov; Igor Malinovsky; Carlos Alberto Massone
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Low-coherence tandem interferometer for remote calibration of gauge blocks
Author(s): Akiko Hirai; Hirokazu Matsumoto
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Issues and advantages of gauge block calibration by mechanical comparison
Author(s): Ruedi Thalmann; Hugo Baechler
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Static calibrations of LVDT sensors for traceable gauge blocks
Author(s): Chung-chi Tang; Kai-Yu Cheng; Huang-Chi Huang
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New capabilities of the CEM-TEK 1200 interferometric comparator for calibrating long gauges, step gauges, and now line scales
Author(s): Emilio Prieto; Joaquin Rodriguez
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Image processing automatic interferometric calibration system for line scales
Author(s): Hector Gonzalez; Carlos Galvan; J. Antonio Muñoz
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Laser interferometer for calibration of a line scale module with analog output
Author(s): Ichiro Fujima; Yasuaki Fujimoto; Kaoru Sasaki; Hideaki Yoshimori; Shigeo Iwasaki; Souichi Telada; Hirokazu Matsumoto
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Line scale comparison Nano3
Author(s): Harald Bosse; Wolfgang Haessler-Grohne; Jens Fluegge; Rainer Koening
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Defining the measurand in radius of curvature measurements
Author(s): Angela Davies; Tony L. Schmitz
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Angle metrology using AAMACS and two small-angle measurement systems
Author(s): Jack A Stone; Mohamed Amer; Bryon Faust; Jay Zimmerman
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Pitch calibration by reflective laser diffraction
Author(s): Chao-Jung Chen; Shen-Peng Pan; Liang-Chih Chang; Gwo-Sheng Peng
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Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications
Author(s): Klaus Hasche; Peter Thomsen-Schmidt; Michael Krumrey; George Ade; Gerhard Ulm; Juergen Stuempel; Stefan Schaedlich; Wilfried Frank; Mathias Procop; Uwe Beck
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Developments on the NMi-VSL traceable scanning probe microscope
Author(s): Kai Dirscherl; K. Richard Koops
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Calibration of nanotransducer by a monolithic x-ray interferometer
Author(s): Jin Won Park; Cheon Il Eom; Sang Ho Byun
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Miniature interferometers for applications in microtechnology and nanotechnology
Author(s): Gerd Jager; Eberhard Manske; Tino Hausotte; Roland Fußl; Rainer Grunwald; Hans Buchner; Walter Schott; Denys Dontsov
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Improved shape measurement in optical profiler
Author(s): Joanna Schmit; Erik Novak
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Method for approximate noise elimination in form and roughness measurements
Author(s): Han Haitjema; Michel A. A. Morel
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High-accuracy form measurement of large optical surfaces
Author(s): Michael Schulz; Ralf D. Geckeler; Jens Illemann
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Contact model of the probe in form measurement
Author(s): Maria A. Saenz-Nuno
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Investigation into applying self-calibration techniques to measuring large optical components on a CMM
Author(s): Eleanor F. Howick
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Canister-free videogrammetry system for thermal vacuum and space applications
Author(s): Stephane Roose; Yvan Stockman; Jean-Christophe Bolsee; Dominic Doyle; Gerd Ulbrich
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Precision metrology system for the Hubble Space Telescope Wide Field Camera 3 instrument
Author(s): Ronald W. Toland
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Fully traceable miniature CMM with submicrometer uncertainty
Author(s): Andrew J. Lewis
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Measurements of large silicon spheres using the NIST M48 coordinate measuring machine
Author(s): John Stoup; Theodore Doiron
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Extension of traceable calibration for electronic distance measuring instruments beyond the length of the laboratory
Author(s): Lucy C. Forde; Eleanor F. Howick
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Automated calibration system for laser interferometers
Author(s): Chung-Chi Tang; Kai-Yu Cheng
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High-precision long-distance measurement using a frequency comb of a femtosecond mode-locked laser
Author(s): Hirokazu Matsumoto; Kaoru Minoshima; Souichi Telada
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Acoustic method for the determination of the effective temperature and refractive index of air
Author(s): Antti Lassila; Virpi Korpelainen
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Wavelength-tracking capabilities of a Fabry-Perot cavity
Author(s): Jack A Stone; Alois Stejskal
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Improved second-harmonic two-wavelength interferometer with refractive index correction without effect modulation
Author(s): Bernd Bodermann; Jens Flugge; Karl Meiners-Hagen
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Improving a commercially available heterodyne laser interferometer to sub-nm uncertainty
Author(s): Han Haitjema; Suzanne J. A. G. Cosijns; N. J. J. Roset; Maarten J. Jansen
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Interferometric calibration of microdisplacement actuators
Author(s): Gian Bartolo Picotto
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Absolute distance measurement with the MSTAR sensor
Author(s): Oliver P. Lay; Serge Dubovitsky; Robert D. Peters; Johan Burger; Seh-Won Ahn; William H. Steier; Harold R. Fetterman; Yian Chang
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Analytical solution of excess fractions method in absolute distance interferometry
Author(s): Ilya P. Agurok
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Recent work at NML to establish traceability for survey electronic distance measurement (EDM)
Author(s): Nicholas Brown; Rob Veugen; Gert-Jan van der Beek; Ronald F. H. Hugers
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Recent activities at PTB nanometer comparator
Author(s): Jens Flugge; Rainer Koning; Harald Bosse
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Automatic high-precision calibration system for angle encoder (II)
Author(s): Tsukasa Watanabe; Hiroyuki Fujimoto; Kan Nakayama; Tadashi Masuda; Makoto Kajitani
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Traceability in metrology and uncertainty evaluation of a calibration system for GPS receivers
Author(s): Chiung-Wu Lee; Ta-Kang Yeh; Gwo-Sheng Peng
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5-m measurement system for traceable measurements of tapes and rules
Author(s): Tanfer Yandayan; Bulent Ozgur
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Stability of the reference flat used in Fizeau interferometer and its contribution to measurement uncertainty
Author(s): Toshiyuki Takatsuji; Sonko Osawa; Yutaka Kuriyama; Tomizo Kurosawa
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Device for calibration of the height micrometers and the squareness standards
Author(s): Tae Bong Eom
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Simple rubidium stabilized diode laser for gauge block interferometer
Author(s): Youichi Bitou; Hajime Inaba; Atsushi Onae
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Alternative measuring modes for scanning probe instrumentation
Author(s): K. Richard Koops; Kai Dirscherl
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Development of a digital controller for iodine stabilized lasers
Author(s): K. Richard Koops; Robbert Bergmans; Steven van den Berg
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Ultrahigh-resolution Cartesian absolute optical encoder
Author(s): Douglas B. Leviton; Jeff Kirk; Luke Lobsinger
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Ultrahigh resolution absolute Cartesian electronic autocollimator
Author(s): Douglas B. Leviton
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