### Proceedings of SPIE Volume 5190

Recent Developments in Traceable Dimensional Measurements IIFormat | Member Price | Non-Member Price |
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Volume Details

Volume Number: 5190

Date Published: 20 November 2003

Softcover: 50 papers (490) pages

ISBN: 9780819450630

Date Published: 20 November 2003

Softcover: 50 papers (490) pages

ISBN: 9780819450630

Table of Contents

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Principal length specifying parameters of material artifacts, their physical meaning, methods for their measurements, and typical uncertainties

Author(s): Alexander Titov; Igor Malinovsky; Carlos Alberto Massone

Author(s): Alexander Titov; Igor Malinovsky; Carlos Alberto Massone

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Next-generation Kösters interferometer

Author(s): Jennifer E Decker; Rene Schodel; Gerhard Bonsch

Author(s): Jennifer E Decker; Rene Schodel; Gerhard Bonsch

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Primary level gauge block interferometers for realization of the SI length unit

Author(s): Alexaundre Titov; Igor Malinovsky; H. Belaidi; R. S. Franca; M. Erin

Author(s): Alexaundre Titov; Igor Malinovsky; H. Belaidi; R. S. Franca; M. Erin

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Minimizing interferometer misalignment errors for measurement of subnanometer length changes

Author(s): Rene Schoedel; Arnold Nicolaus; Gerhard Boensch

Author(s): Rene Schoedel; Arnold Nicolaus; Gerhard Boensch

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Wringing deformation effects in basic length measurements by optical interferometry

Author(s): Alexander Titov; Igor Malinovsky; Carlos Alberto Massone

Author(s): Alexander Titov; Igor Malinovsky; Carlos Alberto Massone

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Low-coherence tandem interferometer for remote calibration of gauge blocks

Author(s): Akiko Hirai; Hirokazu Matsumoto

Author(s): Akiko Hirai; Hirokazu Matsumoto

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Issues and advantages of gauge block calibration by mechanical comparison

Author(s): Ruedi Thalmann; Hugo Baechler

Author(s): Ruedi Thalmann; Hugo Baechler

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Static calibrations of LVDT sensors for traceable gauge blocks

Author(s): Chung-chi Tang; Kai-Yu Cheng; Huang-Chi Huang

Author(s): Chung-chi Tang; Kai-Yu Cheng; Huang-Chi Huang

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New capabilities of the CEM-TEK 1200 interferometric comparator for calibrating long gauges, step gauges, and now line scales

Author(s): Emilio Prieto; Joaquin Rodriguez

Author(s): Emilio Prieto; Joaquin Rodriguez

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Image processing automatic interferometric calibration system for line scales

Author(s): Hector Gonzalez; Carlos Galvan; J. Antonio Muñoz

Author(s): Hector Gonzalez; Carlos Galvan; J. Antonio Muñoz

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Laser interferometer for calibration of a line scale module with analog output

Author(s): Ichiro Fujima; Yasuaki Fujimoto; Kaoru Sasaki; Hideaki Yoshimori; Shigeo Iwasaki; Souichi Telada; Hirokazu Matsumoto

Author(s): Ichiro Fujima; Yasuaki Fujimoto; Kaoru Sasaki; Hideaki Yoshimori; Shigeo Iwasaki; Souichi Telada; Hirokazu Matsumoto

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Line scale comparison Nano3

Author(s): Harald Bosse; Wolfgang Haessler-Grohne; Jens Fluegge; Rainer Koening

Author(s): Harald Bosse; Wolfgang Haessler-Grohne; Jens Fluegge; Rainer Koening

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Defining the measurand in radius of curvature measurements

Author(s): Angela Davies; Tony L. Schmitz

Author(s): Angela Davies; Tony L. Schmitz

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Angle metrology using AAMACS and two small-angle measurement systems

Author(s): Jack A Stone; Mohamed Amer; Bryon Faust; Jay Zimmerman

Author(s): Jack A Stone; Mohamed Amer; Bryon Faust; Jay Zimmerman

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Pitch calibration by reflective laser diffraction

Author(s): Chao-Jung Chen; Shen-Peng Pan; Liang-Chih Chang; Gwo-Sheng Peng

Author(s): Chao-Jung Chen; Shen-Peng Pan; Liang-Chih Chang; Gwo-Sheng Peng

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Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications

Author(s): Klaus Hasche; Peter Thomsen-Schmidt; Michael Krumrey; George Ade; Gerhard Ulm; Juergen Stuempel; Stefan Schaedlich; Wilfried Frank; Mathias Procop; Uwe Beck

Author(s): Klaus Hasche; Peter Thomsen-Schmidt; Michael Krumrey; George Ade; Gerhard Ulm; Juergen Stuempel; Stefan Schaedlich; Wilfried Frank; Mathias Procop; Uwe Beck

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Developments on the NMi-VSL traceable scanning probe microscope

Author(s): Kai Dirscherl; K. Richard Koops

Author(s): Kai Dirscherl; K. Richard Koops

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Calibration of nanotransducer by a monolithic x-ray interferometer

Author(s): Jin Won Park; Cheon Il Eom; Sang Ho Byun

Author(s): Jin Won Park; Cheon Il Eom; Sang Ho Byun

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Miniature interferometers for applications in microtechnology and nanotechnology

Author(s): Gerd Jager; Eberhard Manske; Tino Hausotte; Roland Fußl; Rainer Grunwald; Hans Buchner; Walter Schott; Denys Dontsov

Author(s): Gerd Jager; Eberhard Manske; Tino Hausotte; Roland Fußl; Rainer Grunwald; Hans Buchner; Walter Schott; Denys Dontsov

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Method for approximate noise elimination in form and roughness measurements

Author(s): Han Haitjema; Michel A. A. Morel

Author(s): Han Haitjema; Michel A. A. Morel

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High-accuracy form measurement of large optical surfaces

Author(s): Michael Schulz; Ralf D. Geckeler; Jens Illemann

Author(s): Michael Schulz; Ralf D. Geckeler; Jens Illemann

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Investigation into applying self-calibration techniques to measuring large optical components on a CMM

Author(s): Eleanor F. Howick

Author(s): Eleanor F. Howick

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Canister-free videogrammetry system for thermal vacuum and space applications

Author(s): Stephane Roose; Yvan Stockman; Jean-Christophe Bolsee; Dominic Doyle; Gerd Ulbrich

Author(s): Stephane Roose; Yvan Stockman; Jean-Christophe Bolsee; Dominic Doyle; Gerd Ulbrich

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Precision metrology system for the Hubble Space Telescope Wide Field Camera 3 instrument

Author(s): Ronald W. Toland

Author(s): Ronald W. Toland

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Fully traceable miniature CMM with submicrometer uncertainty

Author(s): Andrew J. Lewis

Author(s): Andrew J. Lewis

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Measurements of large silicon spheres using the NIST M48 coordinate measuring machine

Author(s): John Stoup; Theodore Doiron

Author(s): John Stoup; Theodore Doiron

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Extension of traceable calibration for electronic distance measuring instruments beyond the length of the laboratory

Author(s): Lucy C. Forde; Eleanor F. Howick

Author(s): Lucy C. Forde; Eleanor F. Howick

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Automated calibration system for laser interferometers

Author(s): Chung-Chi Tang; Kai-Yu Cheng

Author(s): Chung-Chi Tang; Kai-Yu Cheng

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High-precision long-distance measurement using a frequency comb of a femtosecond mode-locked laser

Author(s): Hirokazu Matsumoto; Kaoru Minoshima; Souichi Telada

Author(s): Hirokazu Matsumoto; Kaoru Minoshima; Souichi Telada

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Acoustic method for the determination of the effective temperature and refractive index of air

Author(s): Antti Lassila; Virpi Korpelainen

Author(s): Antti Lassila; Virpi Korpelainen

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Wavelength-tracking capabilities of a Fabry-Perot cavity

Author(s): Jack A Stone; Alois Stejskal

Author(s): Jack A Stone; Alois Stejskal

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Improved second-harmonic two-wavelength interferometer with refractive index correction without effect modulation

Author(s): Bernd Bodermann; Jens Flugge; Karl Meiners-Hagen

Author(s): Bernd Bodermann; Jens Flugge; Karl Meiners-Hagen

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Improving a commercially available heterodyne laser interferometer to sub-nm uncertainty

Author(s): Han Haitjema; Suzanne J. A. G. Cosijns; N. J. J. Roset; Maarten J. Jansen

Author(s): Han Haitjema; Suzanne J. A. G. Cosijns; N. J. J. Roset; Maarten J. Jansen

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Interferometric calibration of microdisplacement actuators

Author(s): Gian Bartolo Picotto

Author(s): Gian Bartolo Picotto

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Absolute distance measurement with the MSTAR sensor

Author(s): Oliver P. Lay; Serge Dubovitsky; Robert D. Peters; Johan Burger; Seh-Won Ahn; William H. Steier; Harold R. Fetterman; Yian Chang

Author(s): Oliver P. Lay; Serge Dubovitsky; Robert D. Peters; Johan Burger; Seh-Won Ahn; William H. Steier; Harold R. Fetterman; Yian Chang

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Analytical solution of excess fractions method in absolute distance interferometry

Author(s): Ilya P. Agurok

Author(s): Ilya P. Agurok

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Recent work at NML to establish traceability for survey electronic distance measurement (EDM)

Author(s): Nicholas Brown; Rob Veugen; Gert-Jan van der Beek; Ronald F. H. Hugers

Author(s): Nicholas Brown; Rob Veugen; Gert-Jan van der Beek; Ronald F. H. Hugers

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Recent activities at PTB nanometer comparator

Author(s): Jens Flugge; Rainer Koning; Harald Bosse

Author(s): Jens Flugge; Rainer Koning; Harald Bosse

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Automatic high-precision calibration system for angle encoder (II)

Author(s): Tsukasa Watanabe; Hiroyuki Fujimoto; Kan Nakayama; Tadashi Masuda; Makoto Kajitani

Author(s): Tsukasa Watanabe; Hiroyuki Fujimoto; Kan Nakayama; Tadashi Masuda; Makoto Kajitani

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Traceability in metrology and uncertainty evaluation of a calibration system for GPS receivers

Author(s): Chiung-Wu Lee; Ta-Kang Yeh; Gwo-Sheng Peng

Author(s): Chiung-Wu Lee; Ta-Kang Yeh; Gwo-Sheng Peng

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5-m measurement system for traceable measurements of tapes and rules

Author(s): Tanfer Yandayan; Bulent Ozgur

Author(s): Tanfer Yandayan; Bulent Ozgur

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Stability of the reference flat used in Fizeau interferometer and its contribution to measurement uncertainty

Author(s): Toshiyuki Takatsuji; Sonko Osawa; Yutaka Kuriyama; Tomizo Kurosawa

Author(s): Toshiyuki Takatsuji; Sonko Osawa; Yutaka Kuriyama; Tomizo Kurosawa

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Device for calibration of the height micrometers and the squareness standards

Author(s): Tae Bong Eom

Author(s): Tae Bong Eom

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Simple rubidium stabilized diode laser for gauge block interferometer

Author(s): Youichi Bitou; Hajime Inaba; Atsushi Onae

Author(s): Youichi Bitou; Hajime Inaba; Atsushi Onae

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Alternative measuring modes for scanning probe instrumentation

Author(s): K. Richard Koops; Kai Dirscherl

Author(s): K. Richard Koops; Kai Dirscherl

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Development of a digital controller for iodine stabilized lasers

Author(s): K. Richard Koops; Robbert Bergmans; Steven van den Berg

Author(s): K. Richard Koops; Robbert Bergmans; Steven van den Berg

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Ultrahigh-resolution Cartesian absolute optical encoder

Author(s): Douglas B. Leviton; Jeff Kirk; Luke Lobsinger

Author(s): Douglas B. Leviton; Jeff Kirk; Luke Lobsinger

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Ultrahigh resolution absolute Cartesian electronic autocollimator

Author(s): Douglas B. Leviton

Author(s): Douglas B. Leviton

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