### Proceedings of SPIE Volume 5113

Noise in Devices and CircuitsFormat | Member Price | Non-Member Price |
---|---|---|

Softcover | $105.00 * | $105.00 * |

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 5113

Date Published: 12 May 2003

Softcover: 44 papers (538) pages

ISBN: 9780819449733

Date Published: 12 May 2003

Softcover: 44 papers (538) pages

ISBN: 9780819449733

Table of Contents

show all abstracts |
hide all abstracts

Low-frequency noise and fluctuations in advanced CMOS devices

Author(s): Gerard Ghibaudo

Author(s): Gerard Ghibaudo

Show Abstract

Impact of scaling down on 1/f noise in MOSFETs

Author(s): Matteo Valenza; Alain Hoffmann; Arnaud Laigle; Dominique Rigaud; Mathieu Marin

Author(s): Matteo Valenza; Alain Hoffmann; Arnaud Laigle; Dominique Rigaud; Mathieu Marin

Show Abstract

Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

Author(s): Hao D. Xiong; Daniel M. Fleetwood; James R. Schwank

Author(s): Hao D. Xiong; Daniel M. Fleetwood; James R. Schwank

Show Abstract

Effects of body biasing on the low-frequency noise of NMOSFETs from a 130-nm CMOS technology

Author(s): Mathieu Marin; M. Jamal Deen; Mario de Murcia; Pierre Llinares; Jean Charles Vildeuil

Author(s): Mathieu Marin; M. Jamal Deen; Mario de Murcia; Pierre Llinares; Jean Charles Vildeuil

Show Abstract

Flicker noise characterization and modeling of MOSFETs for RF IC design

Author(s): Yuhua Cheng

Author(s): Yuhua Cheng

Show Abstract

Non-quasi-static (NQS) thermal noise modeling of the MOS transistor

Author(s): Alain-Serge Porret; Christian C Enz

Author(s): Alain-Serge Porret; Christian C Enz

Show Abstract

Compact modeling of noise for RF CMOS circuit

Author(s): Andries J. Scholten; Luuk F. Tiemeijer; Ronald van Langevelde; Ramon J. Havens; Adrie T. A. Zegers-van Duijnhoven; Randy de Kort; Vincent C. Venezia; Dirk B. M. Klaassen

Author(s): Andries J. Scholten; Luuk F. Tiemeijer; Ronald van Langevelde; Ramon J. Havens; Adrie T. A. Zegers-van Duijnhoven; Randy de Kort; Vincent C. Venezia; Dirk B. M. Klaassen

Show Abstract

Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs

Author(s): Gilles Dambrine; C. Raynaud; M. Vanmackelberg; Francois Danneville; Guillaume Pailloncy; Sylvie Lepilliet; Jean Pierre Raskin

Author(s): Gilles Dambrine; C. Raynaud; M. Vanmackelberg; Francois Danneville; Guillaume Pailloncy; Sylvie Lepilliet; Jean Pierre Raskin

Show Abstract

Low-frequency noise behavior of polysilicon emitter bipolar junction transistors: a review

Author(s): M. Jamal Deen; Fabien Pascal

Author(s): M. Jamal Deen; Fabien Pascal

Show Abstract

1/f noise in advanced bipolar technologies

Author(s): Zeynep Celik-Butler; Md Mazhar Ul Hoque; Enhai Zhao; Darby Lan; Doug Weiser; Joe Trogolo; Keith Green

Author(s): Zeynep Celik-Butler; Md Mazhar Ul Hoque; Enhai Zhao; Darby Lan; Doug Weiser; Joe Trogolo; Keith Green

Show Abstract

Comparison of low-frequency noise in III-V and Si/SiGe HBTs

Author(s): Fabien Pascal; Sylvie Guenard-Jarrix; Colette Delseny; Annick Penarier; Cyril Chay; M. Jamal Deen

Author(s): Fabien Pascal; Sylvie Guenard-Jarrix; Colette Delseny; Annick Penarier; Cyril Chay; M. Jamal Deen

Show Abstract

Effect of the interface recombination current fluctuations on 1/f noise of gated lateral bipolar transistors

Author(s): Gregory G. Romas; Md Mazhar Ul Hoque; Zeynep Celik-Butler

Author(s): Gregory G. Romas; Md Mazhar Ul Hoque; Zeynep Celik-Butler

Show Abstract

An overview of low-frequency noise in advanced CMOS/SOI transistors

Author(s): Jalal Jomaah; Francis Balestra

Author(s): Jalal Jomaah; Francis Balestra

Show Abstract

1/f noise and clock jitter in digital electronic systems

Author(s): Leonard Forbes; C.W. Zhang

Author(s): Leonard Forbes; C.W. Zhang

Show Abstract

Phase noise metrology and modeling of microwave transistor applications to the design of state-of-the-art dielectric resonator oscillators

Author(s): Olivier Llopis; Gilles Cibiel

Author(s): Olivier Llopis; Gilles Cibiel

Show Abstract

Nonlinear modeling of low-to-high-frequency noise up-conversion in microwave electron devices

Author(s): Fabio Filicori; Pier Andrea Traverso; Corrado Florian

Author(s): Fabio Filicori; Pier Andrea Traverso; Corrado Florian

Show Abstract

Brief history of recombination noise in semiconductor junction devices

Author(s): Paul J Edwards

Author(s): Paul J Edwards

Show Abstract

Generation-recombination noise in GaN and GaN-based devices

Author(s): Nezih Pala; Sergey L Rumyantsev; Michael S. Shur; Michael E. Levinshtein; M. Asif Khan; Grigory S. Simin; Remis Gaska

Author(s): Nezih Pala; Sergey L Rumyantsev; Michael S. Shur; Michael E. Levinshtein; M. Asif Khan; Grigory S. Simin; Remis Gaska

Show Abstract

Computer simulation and reverse engineering of trap-assisted generation-recombination noise in advanced silicon MOSFETs

Author(s): Gijs Bosman; Fan-Chi Hou; Derek O. Martin; Juan E Sanchez

Author(s): Gijs Bosman; Fan-Chi Hou; Derek O. Martin; Juan E Sanchez

Show Abstract

Fast and ultrafast dissipation and fluctuations in two-dimensional channels for nitride and arsenide FETs

Author(s): Arvydas Matulionis

Author(s): Arvydas Matulionis

Show Abstract

Microscopic investigation of large-signal noise in semiconductor materials and devices

Author(s): Tomas Gonzalez; Susana Perez; Eugenij Starikov; Pavel Shiktorov; Viktoras Gruzinskis; Lino Reggiani; Luca Varani; Jean Claude Vaissiere

Author(s): Tomas Gonzalez; Susana Perez; Eugenij Starikov; Pavel Shiktorov; Viktoras Gruzinskis; Lino Reggiani; Luca Varani; Jean Claude Vaissiere

Show Abstract

Characteristic potential method of noise calculation in semiconductor devices: calculation of 1/f noise in MOS transistors in the ohmic region

Author(s): Sung-min Hong; Yong-Seok Kim; Hong Shick Min; Young June Park

Author(s): Sung-min Hong; Yong-Seok Kim; Hong Shick Min; Young June Park

Show Abstract

Noise analysis of an 0.8-V ultralow-power CMOS operational amplifier

Author(s): Chuang Zhang; Ashok Srivastava; Pratul Ajmera

Author(s): Chuang Zhang; Ashok Srivastava; Pratul Ajmera

Show Abstract

III-V HEMTs: low-noise devices for high-frequency applications

Author(s): Javier Mateos

Author(s): Javier Mateos

Show Abstract

Study of low-frequency noise in GaN-on-Si films obtained by laser-assisted debonding

Author(s): C. P. Chan; P. K. Lai; Benny Hung-Pun Leung; T. M. Yue; Charles C Surya

Author(s): C. P. Chan; P. K. Lai; Benny Hung-Pun Leung; T. M. Yue; Charles C Surya

Show Abstract

Low-frequency drain noise in AlGaN/GaN HEMTs on Si substrate

Author(s): Nathalie Malbert; Nathalie Labat; Arnaud Curutchet; Andre Touboul; Christophe Gaquiere; Auxens Minko

Author(s): Nathalie Malbert; Nathalie Labat; Arnaud Curutchet; Andre Touboul; Christophe Gaquiere; Auxens Minko

Show Abstract

Low-frequency noise measurements: applications, methodologies and instrumentation

Author(s): Carmine Ciofi; Bruno Neri

Author(s): Carmine Ciofi; Bruno Neri

Show Abstract

Noise and charge transport in polymer thin film structures

Author(s): Ognian Marinov; M. Jamal Deen; J. Yu; G. Vamvounis; Steven Holdcroft; W. Woods

Author(s): Ognian Marinov; M. Jamal Deen; J. Yu; G. Vamvounis; Steven Holdcroft; W. Woods

Show Abstract

Difference in dependence of 1/f and RTS noise on current in quantum-dot light-emitting diodes

Author(s): Lode J.K. Vandamme; Alexander V. Belyakov; Mikhail Yu. Perov; Arkady V. Yakimov

Author(s): Lode J.K. Vandamme; Alexander V. Belyakov; Mikhail Yu. Perov; Arkady V. Yakimov

Show Abstract

High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation

Author(s): Raul Rengel; Javier Mateos; Daniel Pardo; Tomas Gonzalez; Maria Jesus Martin; Gilles Dambrine; Francois Danneville; Jean-Pierre Raskin

Author(s): Raul Rengel; Javier Mateos; Daniel Pardo; Tomas Gonzalez; Maria Jesus Martin; Gilles Dambrine; Francois Danneville; Jean-Pierre Raskin

Show Abstract

Shot noise reduction in the AlGaAs/GaAs- and InGaP/GaAs-based HBTs

Author(s): Paulius Sakalas; Michael Schroeter; Peter Zampardi; Herbert Zirath

Author(s): Paulius Sakalas; Michael Schroeter; Peter Zampardi; Herbert Zirath

Show Abstract

Low-frequency noise in porous Si LED

Author(s): Bela Szentpali; Peter Gottwald; Tibor Mohacsy; Kund Molnar; Istvan Barsony

Author(s): Bela Szentpali; Peter Gottwald; Tibor Mohacsy; Kund Molnar; Istvan Barsony

Show Abstract

Kink-effect-related noise in InAlAs/InGaAs short-channel HEMTs

Author(s): Beatriz G. Vasallo; Javier Mateos; Daniel Pardo; Tomas Gonzalez

Author(s): Beatriz G. Vasallo; Javier Mateos; Daniel Pardo; Tomas Gonzalez

Show Abstract

Model of flicker noise effects on phase noise in oscillators

Author(s): Francesco Centurelli; Alessandro Ercolani; Pasquale Tommasino; Alessandro Trifiletti

Author(s): Francesco Centurelli; Alessandro Ercolani; Pasquale Tommasino; Alessandro Trifiletti

Show Abstract

A theory for Hooge's equation based on temperature fluctuations

Author(s): Leonard Forbes

Author(s): Leonard Forbes

Show Abstract

Accurate modeling of noise parameters in subquarter-micrometer gate FETs using physical simulators

Author(s): Ali Abou-Elnour

Author(s): Ali Abou-Elnour

Show Abstract

Determination of the influence of device structure and alloy composition on the noise behavior of hetero-FETs

Author(s): Ali Abou-Elnour; Ossama Abo-Elnor

Author(s): Ali Abou-Elnour; Ossama Abo-Elnor

Show Abstract

LF noise in cross Hall effect devices: geometrical study

Author(s): Jacek Przybytek; Vincent Mosser; Youcef Haddab

Author(s): Jacek Przybytek; Vincent Mosser; Youcef Haddab

Show Abstract

Physical model for low-frequency noise in avalanche breakdown of PN junctions

Author(s): Ognian Marinov; M. Jamal Deen

Author(s): Ognian Marinov; M. Jamal Deen

Show Abstract

Discussion on standard 1/f noise models in software packages: SPICE, HSPICE and BSIM3v3--comparison to MOSFET noise data on commercial c025

Author(s): Matteo Valenza; Alain Hoffmann; Frederic Martinez; A. Laigle; Joseph Rhayem; R. Gillon; Marnix Tack

Author(s): Matteo Valenza; Alain Hoffmann; Frederic Martinez; A. Laigle; Joseph Rhayem; R. Gillon; Marnix Tack

Show Abstract

Principles and applications of coherent random noise radar technology

Author(s): Ram Mohan Narayanan; Xiaojian Xu

Author(s): Ram Mohan Narayanan; Xiaojian Xu

Show Abstract

**© SPIE.**Terms of Use