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Testing, Reliability, and Application of Micro- and Nano-Material Systems
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Volume Details

Volume Number: 5045
Date Published: 22 July 2003
Softcover: 27 papers (286) pages
ISBN: 9780819448507

Table of Contents
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Micro- and nano-NDE systems for aircraft: great things in small packages
Author(s): James C. Malas; Claudia V. Kropas-Hughes; James L. Blackshire; Thomas Moran; Deborah Peeler; W. Garth Frazier; Danny Parker
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Recent results and trends in health monitoring with surface acoustic waves (SAWs)
Author(s): Bernhard R. Tittmann
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Nanoacoustics: probing acoustic waves on the nanoscale
Author(s): Thorsten Hesjedal
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International Center for Nano-Materials reliability
Author(s): Norbert Meyendorf; Bernd Michel
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Nondestructive nanomechanical imaging: cross-sectional ultrasonic force microscopy of integrated circuit test structures
Author(s): L. Muthuswami; Y. Zheng; Robert E. Geer
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AFM/MFM hybrid nanocharacterization of martensitic transformation and degradation for Fe-Pd shape memory alloy
Author(s): Takayuki Suzuki; Kohei Nagatani; Kazumi Hirano; Tokuo Teramoto; Minoru Taya
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Microstructural study of nanoprecipitates in RRA treated Al-7075 T6 using AFM/UFM/STEM
Author(s): Samuel J. M. Kuhr; M. F. Pinnell; Daniel Eylon
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Microscopic NDE of hidden corrosion
Author(s): James L. Blackshire; Jochen Hoffmann; Claudia V. Kropas-Hughes; Ibrahim Tansel
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Nanoscale nondestructive evaluation of materials and devices by ultrasonic atomic force microscopy
Author(s): Kazushi Yamanaka; Toshihiro Tsuji; Hiroshi Irihama; Tsuyoshi Mihara
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Acoustic microscopy: a powerful tool to inspect microstructures of electronic devices
Author(s): Silvia U. Fassbender; Klaus Kraemer
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Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM)
Author(s): Carl J. Druffner; Edward J. Schumaker; Paul T. Murray; Shamachary Sathish
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X-ray microscopy
Author(s): Stanislave I. Rokhlin; Jin-Yeon Kim; B. Zoofan
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In situ real-time x-ray quality assessment of BGA and uBGA connections during soldering
Author(s): Oliver Scholz; Michael Eisenbarth; Randolf Hanke; Thomas Bigl; Peter Schmitt
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Determination of polarization profiles inside ferroelectric thin films using the laser intensity modulation method
Author(s): Gerald Gerlach; Thilo Sandner; Gunnar Suchaneck
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Optical interferometric measurements of the static/dynamic response characteristics of MEMS ultrasonic transducers
Author(s): James L. Blackshire; Shamachary Sathish
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Evaluating microdefect structures by AFM-based deformation measurement
Author(s): Dietmar Vogel; Juergen Keller; Astrid Gollhardt; Bernd Michel
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Processing and electrical characterization in intrinsic conducting polymers for electronic and MEMS applications
Author(s): Wilhelm Seifert; Henrik Albrecht; Stephan Mietke; Thomas Koehler; Matthias Werner
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Monte Carlo simulations of environmental degradation on polymer coatings
Author(s): Brian Hinderliter; Stuart Croll
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In situ measurements of stress-corrosion crack growth using laser ultrasonics
Author(s): Chris Kacmar; James L. Blackshire
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Modern frequency estimation algorithms for FMCW radar systems
Author(s): Markus Pichler; Andreas Stelzer; Alexander Fischer; Peter Gulden; Robert Weigel
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Use of ground-penetrating radar for asphalt thickness determination
Author(s): Bouzid Choubane; Emmanuel Fernando; Stephen C. Ross; Bruce T. Dietrich
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Zinc coating layer thickness on steel wires
Author(s): Ajay Siddoju; Norbert Meyendorf; Marco Haupert; Patrick David
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GMR-based eddy current probes for RRA treated Al-7075 T6 and other high-temperature applications
Author(s): Ajay Siddoju; Samuel J. Kuhr; Norbert Meyendorf
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Investigation of the foaming process of metals by synchrotron radiation imaging
Author(s): Lukas Helfen; Heiko Stanzick; Joachim Ohser; Katja Schladitz; Petra Rejmankova-Pernot; John Banhart; Tilo Baumbach
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Measurement of complex permittivity of moist sawdust by perturbation method with a dielectric ring resonator
Author(s): Zhangyou Chen; Yangjun Zhang; Seichi Okamura
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Cylindrical polarization symmetry for nondestructive nanocharacterization
Author(s): Qiwen Zhan
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Characteristics of solder joints under fatigue loads using piezomechanical actuation
Author(s): Dong-Jin Shim; S. Mark Spearing
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