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PROCEEDINGS VOLUME 5024

Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
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Volume Details

Volume Number: 5024
Date Published: 1 April 2003
Softcover: 31 papers (238) pages
ISBN: 9780819448255

Table of Contents
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Laser spectroscopy of silicon quantum materials
Author(s): Yoshihiko Kanemitsu
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Ionization of impurities in semiconductors by intense FIR radiation
Author(s): Sergey D. Ganichev
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Correlation of optical properties with the microstructure of Si nanocrystals in SiO2 fabricated by ion implantation
Author(s): Tsutomu Shimizu-Iwayama
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Modeling optical properties geterophases ceramic materials SiC+AlN type by the Bruggman theory
Author(s): Vadym M. Prokopets; Igor A. Shaykevich; Lubomir Y. Robur
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Structural transformations caused in sulphate luminophors during thermal treatment
Author(s): S. G. Nedilko; O. V. Chukova; Yuri A. Hizhnii; V. I. Sheludko
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Influence of the surface polariton absorption on the color of metallic surfaces with small irregularities
Author(s): Aleksey V. Makarenko; Igor A. Shaykevich
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Photostructural transformations in amorphous Ge-S thin films: a photoluminescence study
Author(s): N. V. Bondar; N. A. Davydova; V. V. Tishchenko; Miroslav Vlcek
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Photosensitive properties of As-S layers
Author(s): Alexander V. Stronski; Miroslav Vlcek; A. Sklenar; Sergey A. Kostyukevich
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Optical and magnetotransport study of quaternary semimagnetic Hg1-x-yCdxMnySe and Hg1-x-yCdxMnyTe single crystals
Author(s): Yu. I. Mazur; Georgiy G. Tarasov; E. V. Kuz'menko; S. R. Lavorik; Alexander E. Belyaev; W. Hoerstel; W. Kraak; W. Ted Masselink
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Study of charge flow mechanisms in metal-porous silicon structures by photoluminescent and electrophysical techniques
Author(s): G. A. Sukach; Pavel F. Oleksenko; Petr S. Smertenko; A. M. Evstigneev; A. B. Bogoslovskaya
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Optical properties and photoinduced effects in Ge-As-Se films and two-layer systems on their basis
Author(s): Violetta I. Belozertseva; V. A. Bazakutsa; S. D. Gapochenko; Ye. T. Lemeshevskaya; V. V. Mussil
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IR ellipsometric studies of Ti and Mo surfaces modified by high-dose ion irradiation
Author(s): Leonid V. Poperenko; M. V. Vinnichenko; V. D. Karpusha; Arnulf Roeseler
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Electromagnetic wave reflection by rough fractal surface of semiconductor materials
Author(s): Leonid G. Grechko; Olexander Yu. Semchuk; Victor V. Gozhenko; Anatolii A. Pinchuk
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Effect of irradiation on quantum-size layer properties grown on semi-insulating GaAs
Author(s): Evgenie F. Venger; Galina N. Semenova; Yevgen Yu. Braylovsky; Stanislawa Strzelecka; Nadyezhda Ye. Korsunskaya; Wlodzimierz Strupinski; Yury G. Sadofyev; Mikhail P. Semtsiv; Murat Sharibaev
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Dispersion of optical characteristics of anisotropic CdP2 single crystals
Author(s): Volodymyr Vasyliovych Borshch; Volodymyr A. Gnatyuk; S. A. Kovalenko; M. G. Kuzmenko; R. V. Yaremko
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Raman scattering and microstructural analysis of polycrystalline CuInS2 films for solar cell devices
Author(s): Alejandro Perez-Rodriguez; J. Alvarez-Garcia; J. Marcos-Ruzafa; A. Romano-Rodriguez; Juan Ramon Morante; R. Scheer; J. Klaer; R. Klenk
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Diagnostics of optical nonlinearities: spatial beam distortion technique and its application to semiconductors and novel materials
Author(s): Anatoly A. Borshch; Mikhail S. Brodyn; Vladimir Ya. Gayvoronsky
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Optical diagnostics of InGaAs quantum well in pseudomorphic modulation-doped Al1-xGaxAs/InyGa1-yAs/GaAs heterostructures of less-than-critical layer thickness
Author(s): Georgiy G. Tarasov; S. R. Lavorik; Yu. I. Mazur; Mikhail Ya. Valakh; Z. Ya. Zhuchenko; H. Kissel; W. Ted Masselink; U. Mueller; C. Walther
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Nondestructive diagnostics of bulk GaAs and CdZnTe crystals by nanosecond and picosecond wave-mixing techniques
Author(s): M. Sudzius; V. Gudelis; A. Aleksiejunas; Jurgis Storasta; Kestutis Jarasiunas; Adriano Cola
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Study of microsoiling in technological mediums by method of quasi-elastic light scattering
Author(s): Olexander I. Bilyi
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Determination of optical constants of thin films on substrates by reflectance and transmittance measurements
Author(s): Milan Ozvold; Peter Mrafko; V. Gasparik
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Testing optical materials by birefringence dispersion mapping
Author(s): Andrzej L. Bajor
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Photoluminescence and radioluminescence spectra of x-ray phosphors
Author(s): M. Ignatovych; A. Kelemen; A. Peto; O. Chuiko
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On-line monitoring of the manufacturing process of optical microelements by means of controlled heating with laser
Author(s): J. E. Julia; Rafael Estrela
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Real-time interferometric investigation of defects and stresses in solids
Author(s): Mikhail Yu. Bazhenov; Vitaly V. Grabovskyy; George A. Zahaykevich
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Attachment-level parameterization in copper-doped lithium tetraborate
Author(s): B. M. Hunda; A. M. Solomon; T. V. Hunda; V. M. Holovey; P. P. Puga; G. D. Puga
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Thermostimulated luminescence and x-ray luminescence of chromium- and titanium-doped leucosapphire single crystals
Author(s): B. M. Hunda; A. M. Solomon; T. V. Hunda; P. P. Puga; D. I. Bletskan; Y. Y. Bundash
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Extraction of the Mueller-Jones part constructed on basis of four anisotropy mechanisms out of experimental deterministic Mueller matrix
Author(s): Sergey N. Savenkov; Konstantin E. Yushtin
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Holographic associative processor using photorefractive crystals
Author(s): A. V. Gnatovskiy; S. A. Bugaychuk; L. D. Pryadko; O. V. Zolochevskaja
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Spectral-analytical characteristics of laser plasma under multipulse excitation regime
Author(s): E. Zabello; V. Syaber; Anatolij B. Khizhnyak
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Characterization of thin film semiconductor heterostructures using interference modes in wide spectral region
Author(s): Nikolas L. Dmitruk; Oleg S. Gorea; T. A. Mikhailik; E. V. Pidlisnyi; Volodymyr R. Romaniuk; Thomas Wagner
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