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PROCEEDINGS VOLUME 4932

Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
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Volume Details

Volume Number: 4932
Date Published: 30 May 2003
Softcover: 80 papers (726) pages
ISBN: 9780819447272

Table of Contents
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Calculation of electric field intensity at dielectric interfaces (Abstract Only)
Author(s): Jonathan W. Arenberg
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Accuracy and repeatability of laser damage threshold measurements made via order statistics
Author(s): Jonathan W. Arenberg
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Trapping of electrical charges and laser damage
Author(s): Janick Bigarre; Patrick Hourquebie; Ludovic Doucet
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Identification and elimination of fluorescent surface-damage precursors on DKDP optics
Author(s): Mike C. Nostrand; Samuel L. Thompson; Wigbert J. Siekhaus; Michael J. Fluss; Douglas E. Hahn; Pamela K. Whitman; Alan K. Burnham
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Methods for mitigating growth of laser-initiated surface damage on DKDP optics at 351 nm
Author(s): Lawrence W. Hrubesh; Raymond M. Brusasco; Walter Grundler; Mary A. Norton; Eugene E. Donohue; William A. Molander; Samuel L. Thompson; Steven R. Strodtbeck; Pamela K. Whitman; Michael Douglas Shirk; Paul J. Wegner; Mike C. Nostrand; Alan K. Burnham
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Analysis of raster scanning damage and conditioning experiments
Author(s): Michael D. Feit; Alexander M. Rubenchik
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Mechanisms of CO2 laser mitigation of laser damage growth in fused silica
Author(s): Michael D. Feit; Alexander M. Rubenchik
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Overview of raster scanning for ICF-class laser optics
Author(s): Michael J. Runkel; Mike C. Nostrand
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Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDP
Author(s): Michael J. Runkel; Justin Bruere; Walter D. Sell; Timothy L. Weiland; David Milam; Douglas E. Hahn; Mike C. Nostrand
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Influence of BK7 substrate solarization on the performance on hafnia and silica multilayer mirrors
Author(s): Christopher J. Stolz; Joseph A. Menapace; Francois Y. Genin; Paul R. Ehrmann; Philip E. Miller; Gregory T. Rogowski
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Large-spot COIL irradiation of Ge samples
Author(s): Wolfgang Riede; Karin M. Gruenewald
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Environmental effects on optical component aging
Author(s): Laurent Bruel
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Influence of 527-nm laser light on debris- and shrapnel-contaminated optical surfaces
Author(s): James E. Andrew; Karen R. Mann; Michael T. Tobin; Joe C. Watson
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Investigation of high-power laser beam-, plasma-, debris-, and shrapnel-induced damage of optical coatings on the HELEN laser facility
Author(s): Joe C. Watson; James E. Andrew; Nicholas J. Bazin
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Self-focusing and rear surface damage in a fused silica window at 1064 nm and 355 nm
Author(s): Herve Bercegol; Laurent Lamaignere; Bruno Le Garrec; Marc Loiseau; Patricia Volto
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Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser (Abstract Only)
Author(s): Laurent Lamaignere; Marc Loiseau; Herve Piombini; Daniel Plessis; Herve Bercegol
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Growth of damage sites due to platinum inclusions in Nd-doped laser glass irradiated by the beam of a large-scale Nd:glass laser
Author(s): Gerard Raze; Marc Loiseau; Daniel Taroux; Michel A. Josse; Herve Bercegol
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Parametric study of the growth of damage sites on the rear surface of fused silica windows
Author(s): Gerard Raze; Jean-Marie Morchain; Marc Loiseau; Laurent Lamaignere; Michel A. Josse; Herve Bercegol
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Modified Z-scan method for determination of nonlinear refraction of optical materials through the measurement of power-weighted time-averaged beam propagation factor
Author(s): Alexander S. Dement'ev; Andrius Jovaisa; Robertas Navakas
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Ultrashort pulse damage of Si and Ge semiconductors
Author(s): Paul Allenspacher; Bernd Huettner; Wolfgang Riede
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Synchrotron-radiation-induced damages in optical materials
Author(s): Alexandre Gatto; Norbert Kaiser; Stefan Guenster; Detlev Ristau; Francesca Sarto; Mauro Trovo; M. B. Danailov
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Dependence of surface damage resistance on bulk quality in CsLiB6O10 (CLBO) crystal (Abstract Only)
Author(s): Tomosumi Kamimura; Satoru Fukumoto; Munenori Nishioka; Masashi Yoshimura; Yusuke Mori; Takatomo Sasaki; Kunio Yoshida
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Wet etching for the mitigation of laser damage growth in fused silica
Author(s): Philippe Bouchut; Pierre Garrec; Catherine Pelle
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Luminescence of UV thin films
Author(s): Joerg Heber; Christian Muehlig; Wolfgang Triebel; Norbert Danz; Roland Thielsch; Norbert Kaiser
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Calculated and thermally measured laser damage in metallic thin films as a function of pulse duration
Author(s): Laurent Gallais; Claude Amra; Jean-Yves Natoli
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Long-term performances of very high-laser-damage resistance mirrors
Author(s): Guillaume Ravel; Philippe Bouchut; Pierre Garrec; Bernard Andre; Carol Le Diraison; Marc Veillerot
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Optical characteristics of THV fluorothermoplastic (Abstract Only)
Author(s): Kunio Yoshida; Takuo Nobori; K. Hatooka; Kanyoshi Ochi; M. Sunagawa; Tomosumi Kamimura; Yoshiaki Okamoto
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Nodular defects in sputtered coatings
Author(s): Keith L. Lewis; Gilbert W. Smith; Alan J. Pidduck
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Comparison of numerical simulations with experiment on generation of craters in silica by a laser
Author(s): Herve Bercegol; Florian Bonneau; Philippe Bouchut; Patrick Combis; Laurent Gallais; Laurent Lamaignere; Jean-Yves Natoli; Jean-Luc Rullier; Jacques Vierne
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Using a TOF mass spectrometer for studies of laser interaction with 3-nm diameter gold nanoparticles embedded in silica
Author(s): Herve Bercegol; Florian Bonneau; Patrick Combis; Laurent Gallais; Laurent Lamaignere; Marc Loiseau; Jean-Yves Natoli; Michael J. Pellin; Michela Perra; Jean-Luc Rullier; M. Savina
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Numerical simulations of laser/defect-induced absorption in SiO2
Author(s): Florian Bonneau; Patrick Combis; A. Pujols; Jean-Luc Rullier; M. Seques; Jacques Vierne
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Experimental results of laser interaction with included gold particles in silica at 1w and 3w (Abstract Only)
Author(s): Jean-Yves Natoli; Laurent Gallais; Michela Perra; Florian Bonneau; Patrick Combis; Jean Luc Rullier; Philippe Bouchut; Laurent Lamaignere
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Toward an absolute measurement of LIDT
Author(s): Jean-Yves Natoli; Laurent Gallais; Bertrand Bertussi; Mireille Commandre; Claude Amra
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Electromagnetic phenomena generated in laser-produced plasmas (Abstract Only)
Author(s): Andrew M. Scott; David C. Jones; David Benton; Susan Clark
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Self-guiding supercontinuum generation and damage in bulk materials induced by femtosecond pulses
Author(s): Valdas Sirutkaitis; Eugenijus Gaizauskas; Viacheslav Kudriashov; Martynas Barkauskas; Virgilijus Vaicaitis; Rimantas Grigonis; Algis S. Piskarskas
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Identification of point defects responsible for laser-induced ultraviolet absorption in LiB3O5 (LBO) crystals
Author(s): W. Hong; Nelson Y. Garces; M. M. Chirila; Larry E. Halliburton
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Experimental study of wavelength-dependent damage threshold in DKDP
Author(s): Christopher W. Carr; Harry B. Radousky; Stavros G. Demos
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Evolution of bulk damage initiation in DKDP
Author(s): Christopher W. Carr; T. H. McMillian; Mike C Staggs; Harry B. Radousky; Stavros G. Demos
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Femtosecond damage threshold of multilayer metal films
Author(s): Wael M. G. Ibrahim; Hani E. Elsayed-Ali; Michelle D. Shinn; Carl E. Bonner
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Operation of the Jefferson Lab FEL: optics lessons learned
Author(s): Michelle D. Shinn
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Ion-assisted versus nonion-assisted high-laser-damage resistant coatings on BBO (Abstract Only)
Author(s): Jonathan H. Herringer; Thomas A. Caughey
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Photothermal microscopy for in-situ study of laser damage induced by gold inclusions
Author(s): Annelise During; Mireille Commandre; Caroline Fossati; Jean-Yves Natoli; Jean-Luc Rullier; Herve Bercegol; Philippe Bouchut
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Photochemical laminating of low-refractive-index transparent antireflective SiO2 film
Author(s): Masataka M. Murahara; Yasuhiro Ogawa; Kunio Yoshida; Yoshiaki Okamoto
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Radiation resistance of optical materials against synchrotron radiation
Author(s): Stefan Guenster; Holger Blaschke; Detlev Ristau; Alexandre Gatto; Joerg Heber; Norbert Kaiser; B. Diviacco; Marino Marsi; Mauro Trovo; Francesca Sarto; Salvatore Scaglione; Enrico Masetti
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Optical limiting based on liquid-liquid immiscibility
Author(s): Gregory J. Exarhos; Kim F. Ferris; William D. Samuels; Robert R. Owings
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Calibration of laser power meters for high-power applications
Author(s): Volker Brandl; Klaus Haensel; Mike Klos; Reinhard Kramer; Harald Schwede
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Interferometric assessment of laser-induced damage to semiconductors
Author(s): James L. Blackshire; Andrew Zakel; Shekhar Guha
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Degradation of a multilayer dielectric filter as a result of simulated space environmental exposure
Author(s): Peter D. Fuqua; Nathan Presser; James D. Barrie; Michael J. Meshishnek; Dianne J. Coleman
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Application of spectroscopic ellipsometry to characterization of optical thin films
Author(s): John A. Woollam; Corey L. Bungay; Li Yan; Daniel W. Thompson; James N. Hilfiker
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Damage behavior of SiO2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface
Author(s): Semyon Papernov; Ansgar W. Schmid
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Comparison of antireflective coated and uncoated surfaces figured by pitch-polishing and magnetorheological processes
Author(s): Robert Chow; Michael D. Thomas; Robert C. Bickel; John R. Taylor
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Laser beam characterization in uniaxial crystals
Author(s): Gabriella Cincotti; Alessandro Ciattoni; Damiano Provenziani; Claudio Palma; Horst Weber
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Characterization of particulate contamination of optics
Author(s): Jonathan W. Arenberg
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Laser radiometry for UV lasers at 193 nm
Author(s): Stefan Kueck; Klaus Liegmann; Klaus Moestl; Friedhelm Brandt; Juergen Metzdorf
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Results of a round-robin experiment on reflectivity measurements at a wavelength of 1.06 μm
Author(s): Detlef Nickel; Christoph Fleig; Andrea Erhard; Andreas Letsch; Adolf Giesen; Marco Jupe; Kai Starke; Detlev Ristau; Oswald Wilhelm; Rudolf A. Huber; Rainer Haspel; Uwe Schuhmann; Chris Scharfenorth; Hans Joachim Eichler; Stefan Gliech; Angela Duparre; Michael Schulz-Grosser; Anna Krasilnikova; Alexandra Haise; Wolfgang Riede; Ona Balachninaite; Rimantas Grigonis; Valdas Sirutkaitis; Vladimir Kazakevich
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Laser beam and optics characterization with Z-scan method
Author(s): Nelson V. Tabiryan; Vinay Jonnalagadda; Manuel J. Mora; Sarik R. Nersisyan
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Characterization of capabilities of Z-scan technique for measuring divergence and astigmatism of laser beams (Abstract Only)
Author(s): Sarik R. Nersisyan; Manuel J. Mora; Nelson V. Tabiryan
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Estimation of beam parameters and coherence properties of laser radiation by use of an extended Hartmann-Shack wavefront sensor
Author(s): Bernd Schaefer; Klaus R. Mann
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General classification of partially polarized partially coherent beams
Author(s): Rosario Martinez-Herrero; Gemma Piquero; Pedro M. Mejias
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Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technology
Author(s): Bert J. Neubert; Wolf-Dieter Scharfe; Guenter Huber
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Repetition rate dependence of two-photon absorption and self-trapped exciton luminescence in CaF2 at 193 nm
Author(s): Christian Goerling; Uwe Leinhos; Klaus R. Mann
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Numerical phase retrieval from beam intensity measurements in three planes
Author(s): Laurent Bruel
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A coherent spectrophotometer for optical coating chacterization
Author(s): Ona Balachninaite; Robert C. Eckardt; Rimantas Grigonis; M. Peckus; Valdas Sirutkaitis
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S-on-1 induced damage thresholds of high-reflection metallic coatings at 1064 nm
Author(s): Virginija Bingelyte; Valdas Sirutkaitis; Robert C. Eckardt
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Intrinsic and geometrical beam classification, and the beam identification after measurement
Author(s): George Nemes
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Phase space analyzer with Gaussian slits
Author(s): Julio Serna; George Nemes
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High-precision reflectivity measurements: improvements in the calibration procedure
Author(s): Marco Jupe; Florian Grossmann; Kai Starke; Detlev Ristau
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Standard measurement procedures for the characterization of fs-laser optical components
Author(s): Kai Starke; Detlev Ristau; Herbert Welling
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Absorptance measurements for the DUV spectral range by laser calorimetry
Author(s): Holger Blaschke; Marco Jupe; Detlev Ristau
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DUV/VUV spectrophotometry for high-precision spectral characterization
Author(s): Holger Blaschke; Jürgen Kohlhaas; Puja Kadkhoda; Detlev Ristau
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Characterization device for diode-laser-stack beam propagation
Author(s): Markus Roehner; Holger Muentz; Olaf Schroeder; Konstantin Boucke; Reinhart Poprawe
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Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter
Author(s): Annette Hultaker; Nils Benkert; Stefan Gliech; Angela Duparre
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Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurements
Author(s): Jeffrey L. Guttman; John M. Fleischer
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System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm
Author(s): Stefan Gliech; Henning Gessner; Angela Duparre
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Single-shot laser beam profiling using multilevel imaging (Abstract Only)
Author(s): Andrew M. Scott; Simon C. Woods; Paul Harrison
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Practical absolute wavelength meter using iodine-stabilized diode laser
Author(s): Yoshiaki Akimoto; Lee Yong-Chol; Satoshi Hatano; Shoji Niki; Akiyoshi Irisawa
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Spectrophotometry in the vacuum UV
Author(s): Joerg Heber; Alexandre Gatto; Norbert Kaiser
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Calcium fluoride for ArF laser lithography: characterization by in-situ transmission and LIF measurements
Author(s): Christian Muehlig; Wolfgang Triebel; Gabriela Toepfer; A. Jordanov
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Femtosecond pulse damage and predamage behavior of dielectric thin films
Author(s): Mark Mero; Jianhua Liu; Ali Sabbah; Jayesh C. Jasapara; Kai Starke; Detlev Ristau; John K. McIver; Wolfgang G. Rudolph
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On-line control of laser beam quality by means of diffractive optical components
Author(s): Michael Rudolf Duparre; Carsten Rockstuhl; Andreas Letsch; Siegmund Schroeter; Vladimir S. Pavelyev
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