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Proceedings of SPIE Volume 4826

Fourth Oxford Conference on Spectroscopy
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Volume Details

Volume Number: 4826
Date Published: 8 August 2003
Softcover: 21 papers (200) pages
ISBN: 9780819446008

Table of Contents
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Uncertainty analysis of reflectance colorimetry
Author(s): Edward A. Early; Maria E. Nadal
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NPL-NRC comparison of mid-infrared regular transmittance
Author(s): Christopher J. Chunnilall; Frank J. J. Clarke; Nelson L. Rowell
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Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales
Author(s): Leonard M. Hanssen; Simon G. Kaplan
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Intercomparison of high-resolution color measurements with similar and dissimilar geometric conditions
Author(s): Danny C. Rich; Arthur W. Springsteen; Ronald O. Daubach; Michael R. Goodwin; Richard L. Austin
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Overview of primary reference materials for molecular absorption spectrophotometry in the United States
Author(s): Jerry D. Messman
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Measurement issues in the color specification of fluorescent-retroreflective materials for high-visibility traffic signing and personal safety applications
Author(s): David M. Burns; Timothy J. Donahue
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Measuring fluorescent whitened materials: problems, status, and recommendations
Author(s): Roland L. Connelly
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Assessing fluorescent color: a review of common practices and their limitations
Author(s): Steve Streitel
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Spectral and colorimetric intercomparison of fluorescent materials: polychromatic versus monochromatic irradiation
Author(s): Klaus Witt
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Investigation of photoluminescent effect in opal glasses used as diffuse reflectance standards
Author(s): Joanne C. Zwinkels; Francois Gauthier
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Gonio-spectrophotometry of metal-flake and pearl-mica pigmented paint surfaces
Author(s): Gorow Baba; Hirotoshi Arai
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Systematic approach for describing the geometry of spectrophotometry
Author(s): Edward A. Early
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Analysis of spectrophotometer specular performance using goniometric information
Author(s): David R. Wyble
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Wavelength-tunable quasi-cw laser source for high-accuracy spectrometric measurement in the 200-nm to 500-nm region
Author(s): William S. Hartree; Evangelos Theocharous; Nigel P. Fox
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Holmium oxide solution as a prototype intrinsic standard in molecular absorption spectrophotometry
Author(s): John C. Travis; David L. Duewer
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NPL correction kit for enhanced and traceable reflectance measurement
Author(s): Peter J. Clarke
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Diffuse reflectance scales at NPL
Author(s): Christopher J. Chunnilall; Frank J. J. Clarke; Michael J. Shaw
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NIST display colorimeter calibration facility
Author(s): Steven W. Brown; Yoshihiro Ohno
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Color gamut assessment standard: construction, characterization, and interlaboratory measurement comparison
Author(s): John M. Libert; Edward F. Kelley; Paul A. Boynton; Steven W. Brown; Christine F. Wall; Colin Campbell
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Current projects in display metrology at the NIST flat panel display laboratory
Author(s): Paul A. Boynton; Edward F. Kelley; John M. Libert
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Sunlight readability of displays: a numerical scale
Author(s): Robert Sharpe; Colin M. Cartwright; W. Allan Gillespie; Ken Vassie; W. Colin Christopher
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