Share Email Print
cover

Proceedings of SPIE Volume 4778

Interferometry XI: Applications
Editor(s): Wolfgang Osten
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 4778
Date Published: 19 June 2002
Softcover: 44 papers (396) pages
ISBN: 9780819445452

Table of Contents
show all abstracts | hide all abstracts
Development and validation of digital microholo interferometric system for micromechanical testing
Author(s): Lei Xu; Xiaoyuan Peng; Jianmin Miao; Anand Krishna Asundi
Show Abstract
Characterization of shape and deformation of MEMS by quantitative optoelectronic metrology techniques
Author(s): Cosme Furlong; Ryszard J. Pryputniewicz
Show Abstract
Quantitative investigation of chemical shrinkage stress in flip chip using a 3D moire interferometry system
Author(s): Fei Su; Lie Liu; Sung Yi; Kerm Sin Chian
Show Abstract
Application of digital holographic microinterferometer for microelements testing
Author(s): Leszek A. Salbut; Agata Jozwicka; Pawel Dymerski; Michal Jozwik
Show Abstract
Three-dimensional data acquisition and processing for virtual reality applications
Author(s): Malgorzata Kujawinska; Robert Sitnik; Michal Emanuel Pawlowski; Piotr Garbat; Marek Grzegorz Wegiel
Show Abstract
Compact 3D camera
Author(s): Thorsten Bothe; Wolfgang Osten; Achim Gesierich; Werner P. O. Jueptner
Show Abstract
3D shape measurement of shoeprint impression with structured illumination and fringe pattern analysis
Author(s): Xianyu Su; Yiping Cao; Liqun Xiang; Wenjing Chen
Show Abstract
Phaseshift rapid in-vivo measuring of human skin (PRIMOS) by digital fringe projection with micromirror display devices DMD
Author(s): Gottfried Frankowski; Mai Chen; Torsten Huth
Show Abstract
Simultaneous measurement of 3D shape and color of objects
Author(s): Georg H. Notni; Peter Kuehmstedt; Matthias Heinze; Gunther Notni
Show Abstract
High-accuracy interferometric measurement of aspheres
Author(s): Ingolf Weingaertner; Michael Schulz
Show Abstract
Measurement of highly parabolic mirror using computer-generated hologram
Author(s): Tae-hee Kim; James H. Burge; Yun Woo Lee
Show Abstract
Step height measurements using a combination of a laser displacement gage and a broadband interferometric surface profiler
Author(s): Peter J. de Groot; Xavier Colonna de Lega; David A. Grigg
Show Abstract
Characterization of the frequency-modulated continuous wave subsystem of an angstrom-accuracy absolute interferometer
Author(s): Lukas Max Krieg; Bas L. Swinkels; Joseph J. M. Braat
Show Abstract
Interferometer control of optical tweezers
Author(s): Arthur J. Decker
Show Abstract
Interferometric testing of refractive microcylinder lenses
Author(s): Johannes Schwider; Juergen Lamprecht
Show Abstract
Characterization of aspherical micro-optics using digital holography: improvement of accuracy
Author(s): Volker Kebbel; Jan Mueller; Werner P. O. Jueptner
Show Abstract
Specification and characterization of CGHs for interferometrical optical testing
Author(s): Stephan Reichelt; Christof Pruss; Hans J. Tiziani
Show Abstract
Measurement of surface shape and deformation by phase-shifting image digital holography
Author(s): Ichirou Yamaguchi; Jun-ichi Kato; Hirokazu Matsuzaki
Show Abstract
Application of grating shearography to the experimental analysis of a single fabric lamina under tensile loading
Author(s): Jong-Ryul Lee; Jerume Molimard; Alain Vautrin; Yves Surrel
Show Abstract
Absolute distance measurements using FTPSI with a widely tunable IR laser
Author(s): Leslie L. Deck
Show Abstract
High-precision 2D-angle measurement interferometer
Author(s): Zongtao Ge; Mitsuo Takeda
Show Abstract
Powertrain engineering using holographic/electronic speckle pattern interferometry
Author(s): Fang Chen; Mitchell M. Marchi; Thomas E. Allen
Show Abstract
Reverse engineering by fringe projection
Author(s): Jan Burke; Thorsten Bothe; Wolfgang Osten; Cecil F. Hess
Show Abstract
Optical tomography for smooth-changing refraction index distribution
Author(s): Enrique de la Rosa Miranda; Luis R. Berriel-Valdos; Marcelo Funes-Gallanzi; S. A. Fernandez Orozco
Show Abstract
Ultrasonic displacement measurement using self-mixing interferometry
Author(s): Ming Wang; Shouping Nie; Dacheng Li
Show Abstract
Investigation of spatial light modulators for their application in the reconstruction of coherent masks
Author(s): Guenther K.G. Wernicke; Sven Krueger; Frank Kallmeyer; Hartmut Gruber; Nazif Demoli; Matthias Duerr; Alexander Steinhoff
Show Abstract
Digital phase-shift holographic interferometry for quantitative measurements of weak shock waves and its related phenomena
Author(s): Toshiharu Mizukaki; Harald Kleine; Kazuyoshi Takayama
Show Abstract
Remote interferometry by digital holography for shape control
Author(s): Torsten Baumbach; Wolfgang Osten; Claas Falldorf; Werner P. O. Jueptner
Show Abstract
Simultaneous distance, slope, curvature, and shape measurement with a multipurpose interferometer
Author(s): Ingolf Weingaertner; Michael Schulz; Clemens Elster; Joachim Gerhardt; Axel Lucas
Show Abstract
In-plane displacement measurement using ESPI based on spatial fringe analysis method
Author(s): Yasuhiko Arai; Shunsuke Yokozeki
Show Abstract
Dual-frequency laser interferometry of rotating angle measurement with a grating wedge-plate
Author(s): Wei Tao; Zhaobang Pu; Zhuo Zhang
Show Abstract
Intensity transfer function of DMD and its application in PMP
Author(s): Yiping Cao; Xianyu Su; Liqun Xiang; Wenjing Chen
Show Abstract
Realization of aliasing reduction in FTP using microscanning
Author(s): Wenjing Chen; Xianyu Su; Yiping Cao; Liqun Xiang
Show Abstract
Three-dimensional measurement by stereophotogrammetry
Author(s): Fritz Zoellner; Vladislav Matusevich; Richard M. Kowarschik
Show Abstract
Dual testing of a large-aperture optical system
Author(s): Jong Sup Song; Yun Woo Lee; Jae Bong Song; In Won Lee; Ho-Soon Yang; Young-Wan Choi; Jae Heung Jo
Show Abstract
New design techniques and calibration methods for CGH-null testing of aspheric surfaces
Author(s): Stephan Reichelt; Christof Pruss; Hans J. Tiziani
Show Abstract
Simple laser interferometers for concave ellipsoidal mirror testing
Author(s): Gennadi M. Popov; Yevgen G. Popov
Show Abstract
Three-dimensional shape measurement system with digital light projector
Author(s): Jingang Zhong; Jing Zhao
Show Abstract
Measurement of fine dynamic changes of corneal topography by use of interferometry
Author(s): Henryk T. Kasprzak; Jaroslaw W. Jaronski
Show Abstract
In-process measurements of material removal in fluid jet polishing
Author(s): Hedser H. van Brug; Mietta Groeneveld; Silvia M. Booij; Joseph J. M. Braat
Show Abstract
Measuring system for straightness and parallelism error of the overlong target vehicle guides
Author(s): Lijuan Li; Zhiyong An; Lixia Shi; Haibo Zhu
Show Abstract
Digital interferometry application to the study of hypersonic wind tunnel flows
Author(s): Igor Victorovic Ershov; Yuriy D. Babichev
Show Abstract
Holographic interferometry of strain solitary waves in Plexiglas
Author(s): Irina V. Semenova; Galina V. Dreiden; Alexander M. Samsonov
Show Abstract
ESPI for mosaics diagnostics
Author(s): Giuseppe Schirripa Spagnolo; Dario Ambrosini; Domenica Paoletti
Show Abstract

© SPIE. Terms of Use
Back to Top