Share Email Print
cover

Proceedings of SPIE Volume 4777

Interferometry XI: Techniques and Analysis
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 4777
Date Published: 20 June 2002
Softcover: 46 papers (438) pages
ISBN: 9780819445445

Table of Contents
show all abstracts | hide all abstracts
Quantitative Zernike phase-contrast microscopy by use of structured birefringent pupil-filters and phase-shift evaluation
Author(s): Michael Totzeck; Norbert Kerwien; Alexander V. Tavrov; Eva Rosenthal; Hans J. Tiziani
Show Abstract
Task-based assessment of phase-shifting interferometer/ellipsometer
Author(s): Eric W. Rogala
Show Abstract
Histogram equalization of Young's fringes in speckle photography
Author(s): Tushar Singh; Chandra S. Vikram
Show Abstract
Interferometer design for writing Bragg gratings in optical fibers
Author(s): Peter J. de Groot; Xavier Colonna de Lega; Jay Walter Dawson; Trevor W. MacDougall; Minfu Lu; John R. Troll
Show Abstract
Technique for surface reconstruction using colored fringe patterns
Author(s): Oleksandr A. Skydan; Michael J. Lalor; David R. Burton
Show Abstract
Coaxial type of self-mixing interferometer equipped with a wavelength stabilizing system
Author(s): Takamasa Suzuki; Tsutomu Irisawa; Kazuhiro Yokoyama; Osami Sasaki
Show Abstract
Digital complex holography using a shearing interferometer: principles and early results
Author(s): Armando Albertazzi; Analucia Vieira Fantin
Show Abstract
Aperture synthesis in digital holography
Author(s): Thomas M. Kreis; Mike Adams; Werner P. O. Jueptner
Show Abstract
Sensitivity, accuracy, and precision issues in opto-electronic holography based on fiber optics and high-spatial- and high-digitial-resolution cameras
Author(s): Cosme Furlong; Jeffrey S. Yokum; Ryszard J. Pryputniewicz
Show Abstract
Quasi-real-time digital holographic interferometry
Author(s): Slawomir Pasko; Marek Sutkowski; Malgorzata Kujawinska
Show Abstract
White-light interferometry via an endoscope
Author(s): Michael W. Lindner
Show Abstract
White-light interferometry with reference signal
Author(s): Joanna Schmit; Artur G. Olszak; Shawn D. McDermed
Show Abstract
Synthetic spatial coherence function for optical tomography and profilometry: simultaneous realization of longitudinal coherence scan and phase shift
Author(s): Zhihui Duan; Mark Gokhler; Joseph Rosen; Hirokazu Kozaki; Nobuo Ishii; Mitsuo Takeda
Show Abstract
Challenges in white-light phase-shifting interferometry
Author(s): Joanna Schmit; Artur G. Olszak
Show Abstract
Compensation for phase change on reflection in white-light scanning interferometry
Author(s): Min-Cheol Park; MinGu Kang; Seung-Woo Kim
Show Abstract
Digital demodulation algorithm for white-light fiber optic interferometric sensors
Author(s): Serguei V. Miridonov; Mikhail G. Shlyagin; Anatolii V. Khomenko; Vasilii V. Spirin
Show Abstract
High-precision optical metrology system for the SMART-2 mission as precursor for the DARWIN satellite constellation
Author(s): Christoph Haupt; Klaus H. Kudielka; Edgar Fischer; Ulrich Johann
Show Abstract
Advances in digital speckle radiography
Author(s): Stephen G. Grantham; John E. Field
Show Abstract
Numerical phase front propagation for the laser interferometer space antenna
Author(s): Miltiadis V. Papalexandris; Eugene Waluschka
Show Abstract
Optical thickness measurement of substrates using a transmitted wavefront test at two wavelengths to average out multiple reflection errors
Author(s): Peter J. de Groot
Show Abstract
Three-dimensional step-height measurement using Mirau-type spectral interference microscope with acousto-optic tunable filter as frequency scanning device
Author(s): Dalip Singh Mehta; Shohei Saito; Hideki Hinosugi; Mitsuo Takeda; Takashi Kurokawa
Show Abstract
Three-lambda metrology
Author(s): Andreas Pfoertner; Johannes Schwider
Show Abstract
Twin-rainbow metrology
Author(s): Charles L. Adler; James A. Lock; Brian R. Keating
Show Abstract
Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate
Author(s): Kenichi Hibino; Bozenko F. Oreb; Philip S. Fairman
Show Abstract
Some metrological issues in optical full-field techniques
Author(s): Yves Surrel
Show Abstract
CMOS-ESPI system with in-line digital phase stabilization using unresolved speckles
Author(s): Heinz Helmers; Daniel D. Carl; Thorsten Sievers
Show Abstract
Scaled multisensor inspection of extended surfaces for industrial quality control
Author(s): Daniel Kayser; Thorsten Bothe; Wolfgang Osten
Show Abstract
New adaptive phase-shifting algorithm for temporal phase evaluation
Author(s): Pablo D. Ruiz; Guillermo H. Kaufmann; Jonathan Mark Huntley
Show Abstract
Noncontinuous fringe pattern demodulation using a digital phase-locked loop algorithm
Author(s): Munther A. Gdeisat; David R. Burton; Michael J. Lalor
Show Abstract
Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformation
Author(s): Cosme Furlong; Ryszard J. Pryputniewicz
Show Abstract
Evaluation of the continuous wavelet transform method for phase measurement in digital speckle pattern interferometry
Author(s): Alejandro Federico; Guillermo H. Kaufmann
Show Abstract
Phase unwrapping of subsampled phase-shifted interferograms
Author(s): Jesus Munoz; Gonzalo Paez; Marija Strojnik
Show Abstract
Improved hybrid phase unwrapping algorithm in speckle interferometry
Author(s): Oliver Schwarz
Show Abstract
In-line optical surface roughness determination by laser scanning
Author(s): Gregory Toker; Andrei Brunfeld; Joseph Shamir; Boris Spektor; Evan F. Cromwell; Johann F. Adam
Show Abstract
Inspection of sub-wavelength structures and zero-order gratings using polarization interferometry
Author(s): Michael Totzeck; Alexander V. Tavrov; Norbert Kerwien; Hans J. Tiziani
Show Abstract
High-resolution surface feature evaluation using multiwavelength optical transforms
Author(s): Boris Spektor; Gregory Toker; Joseph Shamir; Michael Friedman; Andrei Brunfeld
Show Abstract
Alternating grazing incidence dark-field scanning optical microscopy for dimensional measurements
Author(s): Bernd Bodermann; Wilfried Michaelis; Alexander Diener; Werner Mirande
Show Abstract
Polarization-dependent effects on phase singularities in the vicinity of sub-lambda structures
Author(s): Manfred Eberler; Susanne Quabis; Ralf Dorn; Gerd Leuchs
Show Abstract
Optical processing for the detection of faults in interferometric patterns
Author(s): Frank Kallmeyer; Sven Krueger; Guenther K.G. Wernicke; Hartmut Gruber; Nazif Demoli; Wolfgang Osten; Daniel Kayser
Show Abstract
Correlative stitching interferometer and its key techniques
Author(s): Yingjie Yu; Mingyi Chen
Show Abstract
Fiber optic diffraction interferometer for testing spherical mirrors
Author(s): Hagyong Kihm; Seung-Woo Kim
Show Abstract
Super-heterodyning phase measurement for heterodyne interferometry
Author(s): Min Seok Kim; Jun Young Lee; Seung-Woo Kim
Show Abstract
Novel C/T technique in LDA System
Author(s): Chongxiang Li; Yan Feng Zhang; Chang Wen Liu; Shikang Wang; Jie Liu
Show Abstract
Novel heterometer for measuring surface roughness
Author(s): Zhaoxia Wu; Rui Ren; Zhiquan Li
Show Abstract
Interferometric method to characterize thermal elongation of near-field optics probes
Author(s): Andres H. La Rosa; Bjorn Biehler; Arijit Sinharay; Hans D. Hallen
Show Abstract
Interferometer for testing in vibration environments
Author(s): Klaus R. Freischlad; Ron Eng; James B. Hadaway
Show Abstract

© SPIE. Terms of Use
Back to Top